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公开(公告)号:US11139229B2
公开(公告)日:2021-10-05
申请号:US16536490
申请日:2019-08-09
Applicant: Micron Technology, Inc.
Inventor: Owen R. Fay , Jack E. Murray
IPC: H01L23/498 , H01L21/48 , H01L23/13 , H01L25/10 , H01L25/00 , H01L23/00 , H01L25/065 , H01L25/18 , H01L23/31
Abstract: Package-on-package systems for packaging semiconductor devices. In one embodiment, a package-on-package system comprises a first semiconductor package device and a second semiconductor package device. The first package device includes a base substrate including a first side having a die-attach region and a peripheral region, a first semiconductor die attached to the base substrate at the die-attach region, wherein the first semiconductor die has a front side facing the first side of the base substrate and a backside spaced apart from the first side of the base substrate by a first distance, and a high density interconnect array in the perimeter region of the base substrate outside of the die-attach region. The interconnect array has a plurality of interconnects that extend from the first side of the base substrate by a second distance greater than the first distance. The second semiconductor device package is electrically coupled corresponding individual interconnects.
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公开(公告)号:US20210280538A1
公开(公告)日:2021-09-09
申请号:US17328134
申请日:2021-05-24
Applicant: Micron Technology, Inc.
Inventor: John F. Kaeding , Owen R. Fay
IPC: H01L23/66 , H01Q1/22 , H01L23/00 , H01L27/108 , H01L25/065 , H01L23/538
Abstract: A system may include a first semiconductor substrate having a first side and a second side opposite the first side. The system may further include multiple device layers positioned on the first side of the substrate. The system may also include a first portion of an antenna structure positioned within at least one of the multiple device layers. The system may include a second portion of the antenna structure positioned over the second side of the substrate. The system may further include a via passing through the substrate and electrically coupling the first portion of the antenna structure to the second portion of the antenna structure.
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公开(公告)号:US11088114B2
公开(公告)日:2021-08-10
申请号:US16671546
申请日:2019-11-01
Applicant: Micron Technology, Inc.
Inventor: Owen R. Fay , Kyle K. Kirby , Akshay N. Singh
IPC: H01L25/065 , H01L23/498 , H01L23/31 , H01L21/56 , H01L21/60
Abstract: A semiconductor device assembly can include a first semiconductor device and an interposer. The interposer can include a substrate and through vias in which individual vias include an exposed portion and an embedded portion, the exposed portions projecting from one or both of the first surface and the second surface of the substrate, and the embedded portions extending through at least a portion of the substrate. The interposer can include one or more test pads, a first electrical contact, and a second electrical contact. The semiconductor device assembly can include a controller positioned on an opposite side of the interposer from the first semiconductor device and operably coupled to the interposer via connection to the second electrical contact.
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公开(公告)号:US11018098B2
公开(公告)日:2021-05-25
申请号:US16118723
申请日:2018-08-31
Applicant: Micron Technology, Inc.
Inventor: John F. Kaeding , Owen R. Fay
IPC: H01L23/48 , H01L29/40 , H01L23/52 , H01L23/66 , H01Q1/22 , H01L23/00 , H01L27/108 , H01L25/065 , H01L23/538
Abstract: A system may include a first semiconductor substrate having a first side and a second side opposite the first side. The system may further include multiple device layers positioned on the first side of the substrate. The system may also include a first portion of an antenna structure positioned within at least one of the multiple device layers. The system may include a second portion of the antenna structure positioned over the second side of the substrate. The system may further include a via passing through the substrate and electrically coupling the first portion of the antenna structure to the second portion of the antenna structure.
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公开(公告)号:US20210118851A1
公开(公告)日:2021-04-22
申请号:US16939720
申请日:2020-07-27
Applicant: Micron Technology, Inc.
Inventor: Randon K. Richards , Owen R. Fay , Aparna U. Limaye , Dong Soon Lim
IPC: H01L25/065 , H01L25/18 , H01L23/00 , H01L23/552 , H01L23/64 , H01L21/78 , H01L21/66 , H01L25/00
Abstract: Disclosed is a microelectronic device assembly comprising a substrate having conductors exposed on a surface thereof. Two or more microelectronic devices are stacked on the substrate, each microelectronic device comprising an active surface operably coupled to conductive traces extending over a dielectric material to via locations beyond at least one side of the stack, at least one surface mount component operably coupled to conductive traces of at least one dielectric material, and vias extending through the dielectric materials at the via locations and comprising conductive material in contact with at least some of the conductive traces of each of the two or more electronic devices and extending to exposed conductors of the substrate.
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116.
公开(公告)号:US20210005575A1
公开(公告)日:2021-01-07
申请号:US16503353
申请日:2019-07-03
Applicant: Micron Technology, Inc.
Inventor: Chan H. Yoo , Owen R. Fay , Eiichi Nakano
IPC: H01L25/065 , H05K1/02 , H01L23/373 , H01L23/498 , H01L23/00
Abstract: Semiconductor assemblies including thermal layers and associated systems and methods are disclosed herein. In some embodiments, the semiconductor assemblies comprise one or more semiconductor devices over a substrate. The substrate includes a thermal layer configured to transfer thermal energy along a lateral plane and across the substrate. The thermal energy is transferred along a non-lateral direction from the semiconductor device to the graphene layer using one or more thermal connectors.
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117.
公开(公告)号:US10600750B2
公开(公告)日:2020-03-24
申请号:US16182924
申请日:2018-11-07
Applicant: Micron Technology, Inc.
Inventor: Kyle S. Mayer , Owen R. Fay
IPC: H01L23/00 , H01L21/288
Abstract: Semiconductor dies having interconnect structures formed thereon, and associated systems and methods, are disclosed herein. In one embodiment, an interconnect structure includes a conductive material electrically coupled to an electrically conductive contact of a semiconductor die. The conductive material includes a first portion vertically aligned with the conductive contact, and a second portion that extends laterally away from the conductive contact. A solder material is disposed on the second portion of the interconnect structure such that the solder material is at least partially laterally offset from the conductive contact of the semiconductor die. In some embodiments, an interconnect structure can further include a containment layer that prevents wicking or other undesirable movement of the solder material during a reflow process.
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公开(公告)号:US10566686B2
公开(公告)日:2020-02-18
申请号:US16021463
申请日:2018-06-28
Applicant: Micron Technology, Inc.
Inventor: John F. Kaeding , Owen R. Fay
IPC: H01Q21/00 , H01Q1/38 , H01L23/66 , H01L23/00 , H01L25/065 , H01L21/768 , H01L25/00 , H01Q1/22 , H01Q1/24 , H01L23/48
Abstract: A stacked semiconductor device assembly may include a first semiconductor device having a first substrate and a first set of vias through the first substrate. The first set of vias may define a first portion of an antenna structure. The stacked semiconductor device assembly may further include a second semiconductor device having a second substrate and a second set of vias through the second substrate. The second set of vias may define a second portion of the antenna structure. The stacked semiconductor device assembly may also include a stack interconnect structure electrically coupling the first portion of the antenna structure to the second portion of the antenna.
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公开(公告)号:US20200036093A1
公开(公告)日:2020-01-30
申请号:US16045562
申请日:2018-07-25
Applicant: Micron Technology, Inc.
Inventor: John F. Kaeding , Owen R. Fay
IPC: H01Q1/48
Abstract: A method for tuning an antenna may include depositing multiple portions of an antenna structure onto a substrate. The method may further include electrically coupling each of the portions of the antenna structure. The method may also include severing an electrical connection between two of the portions of the antenna structure to tune the antenna structure for use with a transmission device.
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公开(公告)号:US10529592B2
公开(公告)日:2020-01-07
申请号:US15830839
申请日:2017-12-04
Applicant: Micron Technology, Inc.
Inventor: Owen R. Fay , Akshay N. Singh , Kyle K. Kirby
IPC: H01L21/48 , H01L21/66 , H01L23/48 , H01L23/498 , H01L25/065
Abstract: A semiconductor device assembly and method of forming a semiconductor device assembly that includes a first substrate, a second substrate disposed over the first substrate, at least one interconnect between the substrates, and at least one pillar extending from the bottom surface of the first substrate. The pillar is electrically connected to the interconnect and is located adjacent to a side of the first substrate. The pillar is formed by filling a via through the substrate with a conductive material. The first substrate may include an array of pillars extending from the bottom surface adjacent to a side of the substrate that are formed from a plurality of filled vias. The substrate may include a test pad located on the bottom surface or located on the top surface. The pillars may include a removable coating enabling the pillars to be probed without damaging the inner conductive portion of the pillar.
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