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121.
公开(公告)号:US20220345095A1
公开(公告)日:2022-10-27
申请号:US17619669
申请日:2020-06-16
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Hitoshi KUNITAKE , Takayuki IKEDA , Kiyoshi KATO , Yuichi YANAGISAWA , Shota MIZUKAMI , Kazuki TSUDA
IPC: H03F3/195 , H03F1/02 , H01L29/786
Abstract: A semiconductor device is provided in which power consumption is reduced and an increase in circuit area is inhibited. The semiconductor device includes a high frequency amplifier circuit, an envelope detection circuit, and a power supply circuit. The power supply circuit has a function of supplying a power supply potential to the high frequency amplifier circuit, an output of the high frequency amplifier circuit is connected to the envelope detection circuit, and an output of the envelope detection circuit is connected to the power supply circuit. The power supply circuit can reduce the power consumption by changing the power supply potential in accordance with the output of the high frequency amplifier circuit. The use of an OS transistor in the envelope detection circuit can inhibit an increase in circuit area.
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公开(公告)号:US20220149044A1
公开(公告)日:2022-05-12
申请号:US17579640
申请日:2022-01-20
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Kiyoshi KATO
IPC: H01L27/105 , H01L27/06 , H01L27/11521 , H01L27/11551 , H01L27/1156 , H01L27/12 , H01L27/108
Abstract: An object is to provide a semiconductor device with a novel structure in which stored data can be held even when power is not supplied and there is no limit on the number of write operations. The semiconductor device includes a first memory cell including a first transistor and a second transistor, a second memory cell including a third transistor and a fourth transistor, and a driver circuit. The first transistor and the second transistor overlap at least partly with each other. The third transistor and the fourth transistor overlap at least partly with each other. The second memory cell is provided over the first memory cell. The first transistor includes a first semiconductor material. The second transistor, the third transistor, and the fourth transistor include a second semiconductor material.
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公开(公告)号:US20210183860A1
公开(公告)日:2021-06-17
申请号:US17047143
申请日:2019-04-11
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Shunpei YAMAZAKI , Kiyoshi KATO , Tatsuya ONUKI , Takanori MATSUZAKI
IPC: H01L27/105 , H01L27/12 , H01L29/24 , H01L29/786
Abstract: A novel semiconductor device is provided. A semiconductor device includes a plurality of cell arrays and a plurality of peripheral circuits. The cell array includes a plurality of memory cells. The peripheral circuit includes a first driver circuit, a second driver circuit, a first amplifier circuit, a second amplifier circuit, a third amplifier circuit, and a fourth amplifier circuit. The first driver circuit and the second driver circuit each have a function of supplying a selection signal to the cell array. The first amplifier circuit and the second amplifier circuit each have a function of amplifying a potential input from the cell array. The third amplifier circuit and the fourth amplifier circuit each have a function of amplifying a potential input from the first amplifier circuit or the second amplifier circuit. The first driver circuit, the second driver circuit, the first amplifier circuit, the second amplifier circuit, the third amplifier circuit, and the fourth amplifier circuit have a region overlapping with the cell array. A transistor included in the memory cell includes a metal oxide in a channel formation region.
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公开(公告)号:US20210167067A1
公开(公告)日:2021-06-03
申请号:US17061920
申请日:2020-10-02
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Yutaka SHIONOIRI , Hiroyuki MIYAKE , Kiyoshi KATO
IPC: H01L27/105 , H01L27/1156 , H01L27/12 , H01L27/13 , H01L27/115 , H01L29/786
Abstract: It is an object to provide a memory device whose power consumption can be suppressed and a semiconductor device including the memory device. As a switching element for holding electric charge accumulated in a transistor which functions as a memory element, a transistor including an oxide semiconductor film as an active layer is provided for each memory cell in the memory device. The transistor which is used as a memory element has a first gate electrode, a second gate electrode, a semiconductor film located between the first gate electrode and the second gate electrode, a first insulating film located between the first gate electrode and the semiconductor film, a second insulating film located between the second gate electrode and the semiconductor film, and a source electrode and a drain electrode in contact with the semiconductor film.
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公开(公告)号:US20210091083A1
公开(公告)日:2021-03-25
申请号:US16613478
申请日:2018-05-07
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Kiyoshi KATO
IPC: H01L27/105 , H01L27/12 , H01L29/24 , H01L29/786 , H01L29/66
Abstract: A semiconductor device capable of retaining data for a long period is provided. The semiconductor device includes a first memory cell and a second memory cell. The first memory cell includes a first transistor. The second memory cell includes a second transistor. The threshold voltage of the second transistor is higher than the threshold voltage of the first transistor. The first transistor includes a first metal oxide. The second transistor includes a second metal oxide. Each of the first metal oxide and the second metal oxide includes a channel formation region. Each of the first metal oxide and the second metal oxide includes In, an element M (M is Al, Ga, Y, or Sn), and Zn. The atomic ratio of the element M to In in the second metal oxide is greater than that in the first metal oxide.
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公开(公告)号:US20210081023A1
公开(公告)日:2021-03-18
申请号:US17104460
申请日:2020-11-25
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shuhei MAEDA , Shuhei NAGATSUKA , Tatsuya ONUKI , Kiyoshi KATO
IPC: G06F1/3234 , G11C16/30 , G11C14/00 , G11C5/14
Abstract: To reduce the area of a memory cell having a backup function. A storage device includes a cell array, and a row circuit and a column circuit that drive the cell array. The cell array includes a first power supply line, a second power supply line, a word line, a pair of bit lines, a memory cell, and a backup circuit. The cell array is located in a power domain where power gating can be performed. In the power gating sequence of the cell array, data in the memory cell is backed up to the backup circuit. The backup circuit is stacked over a region where the memory cell is formed. A plurality of wiring layers are provided between the backup circuit and the memory cell. The first power supply line, the second power supply line, the word line, and the pair of bit lines are located in different wiring layers.
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公开(公告)号:US20210027828A1
公开(公告)日:2021-01-28
申请号:US17041037
申请日:2019-03-20
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Shunpei YAMAZAKI , Kiyoshi KATO , Takahiko ISHIZU , Tatsuya ONUKI
IPC: G11C11/408 , H01L27/105 , H01L27/12 , H01L29/24 , H01L29/786
Abstract: A memory device having long data retention time and high reliability is provided. The memory device includes a driver circuit and a plurality of memory cells, the memory cell includes a transistor and a capacitor, and the transistor includes a metal oxide in a channel formation region. The transistor includes a first gate and a second gate, and in a period during which the memory cell retains data, negative potentials are applied to the first gate and the second gate of the transistor.
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公开(公告)号:US20200279589A1
公开(公告)日:2020-09-03
申请号:US16643755
申请日:2018-09-03
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Tatsuya ONUKI , Takanori MATSUZAKI , Kiyoshi KATO , Shunpei YAMAZAKI
Abstract: To provide a novel semiconductor device.The semiconductor device includes cell arrays and peripheral circuits; the cell arrays include memory cells; the peripheral circuits includes a first driver circuit, a second driver circuit, a first amplifier circuit, a second amplifier circuit, a third amplifier circuit, and a fourth amplifier circuit; the first driver circuit and the second driver circuit have a function of supplying a selection signal to the cell array; the first amplifier circuit and the second amplifier circuit have a function of amplifying a potential input from the cell array; the third amplifier circuit and the fourth amplifier circuit have a function of amplifying a potential input from the first amplifier circuit or the second amplifier circuit; the first driver circuit, the second driver circuit, the first amplifier circuit, the second amplifier circuit, the third amplifier circuit, and the fourth amplifier circuit include a region overlapping with the cell array; and the memory cells include a metal oxide in a channel formation region.
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公开(公告)号:US20190377401A1
公开(公告)日:2019-12-12
申请号:US16476642
申请日:2018-01-09
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shuhei MAEDA , Shuhei NAGATSUKA , Tatsuya ONUKI , Kiyoshi KATO
IPC: G06F1/3234 , G11C5/14 , G11C16/30 , G11C14/00
Abstract: To reduce the area of a memory cell having a backup function. A storage device includes a cell array, and a row circuit and a column circuit that drive the cell array. The cell array includes a first power supply line, a second power supply line, a word line, a pair of bit lines, a memory cell, and a backup circuit. The cell array is located in a power domain where power gating can be performed. In the power gating sequence of the cell array, data in the memory cell is backed up to the backup circuit. The backup circuit is stacked over a region where the memory cell is formed. A plurality of wiring layers are provided between the backup circuit and the memory cell. The first power supply line, the second power supply line, the word line, and the pair of bit lines are located in different wiring layers.
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公开(公告)号:US20190222209A1
公开(公告)日:2019-07-18
申请号:US16362777
申请日:2019-03-25
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Kiyoshi KATO , Yutaka SHIONOIRI , Tomoaki ATSUMI , Takanori MATSUZAKI
IPC: H03K5/24 , H01L49/02 , H01L27/146 , H01L27/108 , H01L23/498 , G11C5/14 , H01L21/78 , H01L27/00
CPC classification number: H03K5/2481 , G11C5/144 , G11C5/145 , H01L21/78 , H01L23/49844 , H01L27/00 , H01L27/10805 , H01L27/14687 , H01L28/00
Abstract: Provided is a semiconductor device that can directly compare two negative potentials. The semiconductor device includes a first to a third transistor and a load and is configured to compare a first negative potential and a second negative potential. The first negative potential and the second negative potential are input to a gate of the first transistor and a gate of the second transistor, respectively. Each drain of the first transistor and the second transistor is electrically connected to the load. The third transistor serves as a current source. The first transistor and the second transistor each include a backgate. A positive potential is input to the backgates.
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