公开(公告)号：US20180174964A1

公开(公告)日：2018-06-21

申请号：US15892467

申请日：2018-02-09

申请人： STMicroelectronics S.r.l.

发明人： Alberto Pagani

IPC分类号： H01L23/522 ,  G01R31/302 ,  H01L23/66 ,  G01R31/315

CPC分类号： H01L23/5227 ,  G01R31/3025 ,  G01R31/315 ,  H01L23/66 ,  H01L2223/6677 ,  H01L2224/16145 ,  H01L2224/16225 ,  H01L2224/4813 ,  H01L2224/48137 ,  H01L2224/48139 ,  H01L2224/48145 ,  H01L2224/48227 ,  H01L2224/48465 ,  H01L2224/48472 ,  H01L2224/8592 ,  H01L2924/1461 ,  H01L2924/15192 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/30107 ,  H01L2924/3025 ,  H01L2924/00 ,  H01L2924/00012

摘要： A pad forms a connection terminal suitable for coupling circuit elements integrated in a chip to circuits outside the chip itself. At least one inductor is provided for use in the reception/transmission of electromagnetic waves or for supplying the chip with power or both. The connection pad and inductor are combined in a structure which reduces overall occupied area. A magnetic containment structure surrounds the structure to contain a magnetic field of the inductor.

公开(公告)号：US09891266B2

公开(公告)日：2018-02-13

申请号：US14189112

申请日：2014-02-25

申请人： Taiwan Semiconductor Manufacturing CO., LTD.

发明人： Mill-Jer Wang ,  Ching-Nen Peng ,  Hung-Chih Lin ,  Sen-Kuei Hsu ,  Chuan-Ching Wang ,  Hao Chen

IPC分类号： G01R31/265 ,  G01R31/302

CPC分类号： G01R31/265 ,  G01R31/3025

摘要： A method is disclosed that includes the operations outlined below. For a plurality of dies on a test fixture, an antenna distance between each of first antennas of one of the dies and every one of first antennas of the other dies is determined. The dies are categorized into die groups, wherein the antenna distance between each of the first antennas of one of the dies in one of the die groups and every one of the first antennas of the other dies in the same one of the die groups is larger than an interference threshold. Test processes are sequentially performed on the die groups. Each of the test processes is performed according to signal transmissions between the first antennas and second antennas of the under-test device each positionally corresponds to one of the first antennas.

公开(公告)号：US20180027003A1

公开(公告)日：2018-01-25

申请号：US15217074

申请日：2016-07-22

申请人： INTERNATIONAL BUSINESS MACHINES CORPORATION

发明人： Andrea Bahgat Shehata ,  Peilin Song ,  Franco Stallari

IPC分类号： H04L29/06 ,  G01R29/08 ,  G06T7/00 ,  G01R31/302

CPC分类号： G06T7/001 ,  G01R29/0814 ,  G06F11/263 ,  G06F17/5031 ,  G06F21/56 ,  G06F21/564 ,  H04K3/00 ,  H04K3/82 ,  H04K2203/14 ,  H04L63/1416 ,  H04L63/162

摘要： A method and apparatus related to developing electromagnetic emission and power models for a target device using photonic emissions thereof are provided. Data of photonic emissions of a target device during a first period of time with the target device in one or more modes is recorded. Data of electromagnetic emissions of the target device during the first period of time with the target device in the one or more modes is also recorded. The recorded data of the photonic emissions and the recorded data of the electromagnetic emissions are correlated to establish one or more electromagnetic emission models for the target device. The one or more electromagnetic emission models enable predictive analysis of emissions by the target device.

公开(公告)号：US09847843B2

公开(公告)日：2017-12-19

申请号：US13392500

申请日：2009-08-28

申请人： Jochen Rivoir ,  Markus Rottacker ,  Andreas Hantsch

发明人： Jochen Rivoir ,  Markus Rottacker ,  Andreas Hantsch

IPC分类号： G01R31/00 ,  G01D1/00 ,  H04B17/00 ,  G01R31/302 ,  H04B7/06 ,  H04B7/08 ,  H04B17/10 ,  H04B17/20

CPC分类号： H04B17/0085 ,  G01R31/3025 ,  H04B7/0617 ,  H04B7/0837 ,  H04B17/10 ,  H04B17/20

摘要： An apparatus for wireless testing, wherein the apparatus includes a test interface, a test generator, a test module, and an analysis module. The test interface is coupled to an electronic device and is configured to transmit data to the electronic device and to receive data from the electronic device. The test generator drives the electronic device through the test interface to vary the beam direction. The test module determines a plurality of transmit values of a transmit parameter based on the test signal wirelessly received from the electronic device using at least one static antenna for receiving the test signal. Each transmit value of the transmit parameter is associated with a different beam direction. The analysis module provides an assessment of the plurality of transmit paths of the electronic device based on the plurality of transmit values.

公开(公告)号：US09784787B2

公开(公告)日：2017-10-10

申请号：US14850432

申请日：2015-09-10

申请人： FREESCALE SEMICONDUCTOR, INC.

发明人： Lianjun Liu ,  Philippe Bernard Roland Lance ,  David Joseph Monk ,  Babak A Taheri

IPC分类号： G01R31/28 ,  G01R31/3185 ,  G01R31/302

CPC分类号： G01R31/2884 ,  G01R31/3025 ,  G01R31/318511

摘要： An electric field sensor includes sense and reference cells. The sense cell produces a resistance that varies relative to an intensity of an electric field, and the reference cell produces a resistance that is invariable relative to the intensity of the electric field. An output signal indicative of the intensity of the electric field is determined using the difference between the resistances. A system includes an electric field source that outputs a digital test program as an electric field signal. The system further includes the electric field sensor formed with IC dies on a wafer. The electric field sensor receives the electric field signal. The received electric field signal is converted to the test program, and the test program is stored in memory on the wafer. The electric field source does not physically contact the dies, but can flood an entire surface of the wafer with the electric field signal.

公开(公告)号：US20170192052A1

公开(公告)日：2017-07-06

申请号：US15283466

申请日：2016-10-03

申请人： SAMSUNG ELECTRONICS CO., LTD.

发明人： Young-hoon SOHN ,  Chung-sam JUN ,  Yu-sin YANG

IPC分类号： G01R31/302 ,  G01R31/28

CPC分类号： G01R31/307

摘要： Provided is a method of inspecting a pattern defect. The method includes: applying a voltage to an object to be inspected and measuring an inspection signal generated in a pattern of the object to be inspected due to the voltage applied to the object to be inspected over time; generating an intensity image showing a relationship between an intensity of the inspection signal measured in the pattern and a time by processing the inspection signal; and detecting a pattern defect position by comparing the intensity image with a comparative intensity image.

公开(公告)号：US09653927B2

公开(公告)日：2017-05-16

申请号：US14804319

申请日：2015-07-20

申请人： TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.

发明人： Min-Jer Wang ,  Ching-Nen Peng ,  Chewn-Pu Jou ,  Feng Wei Kuo ,  Hao Chen ,  Hung-Chih Lin ,  Huan-Neng Chen ,  Kuang-Kai Yen ,  Ming-Chieh Liu ,  Tsung-Hsiung Lee

IPC分类号： G06F11/00 ,  G01R31/28 ,  H02J5/00 ,  H01L23/538 ,  G06F17/50 ,  H01L23/544 ,  H01L25/065 ,  G01R31/302 ,  H01L23/00

CPC分类号： H02J50/40 ,  G01R31/2856 ,  G01R31/2884 ,  G01R31/2889 ,  G01R31/3025 ,  G06F17/5068 ,  H01L23/538 ,  H01L23/544 ,  H01L24/16 ,  H01L25/0652 ,  H01L25/0655 ,  H01L25/0657 ,  H01L2223/54446 ,  H01L2224/1403 ,  H01L2224/14181 ,  H01L2224/16145 ,  H01L2224/16148 ,  H01L2224/16225 ,  H01L2224/16238 ,  H01L2224/81193 ,  H01L2224/94 ,  H01L2225/06513 ,  H01L2225/06517 ,  H01L2225/06565 ,  H01L2225/06596 ,  H01L2924/15192 ,  H01L2924/15311 ,  H02J5/005 ,  H02J50/10 ,  H02J50/20 ,  H02J50/80 ,  H01L2224/81

摘要： A composite integrated circuit (IC) includes a first circuit layer, a second circuit layer having a first chip and a second chip, and a first wireless power transfer (WPT) device in the first chip or the first circuit layer. The first WPT device generates a power supply voltage by extracting energy from an electromagnetic signal. A first tracking circuit in the second chip or the first circuit layer is powered by the power supply voltage from the first WPT device and stores or outputs tracking data in response to an instruction extracted from the electromagnetic signal.

公开(公告)号：US09535111B2

公开(公告)日：2017-01-03

申请号：US13976977

申请日：2011-12-27

申请人： Ronald K. Minemier

发明人： Ronald K. Minemier

IPC分类号： G01R31/02 ,  G01R31/28 ,  G01R31/302

CPC分类号： G01R31/2851 ,  G01R31/3025

摘要： In accordance with one aspect of the present description, integrated circuits may tested by optically transmitting test data over a light beam in addition to or instead of transmitting the test data using mechanical probes. Optically transmitted test data is detected by a photon detector on board the die to be tested. Individual circuit portions of the die may be tested using test data associated with each individual circuit portion. Other aspects are described.

摘要翻译： 根据本说明书的一个方面，集成电路可以通过光学传输测试数据进行测试，除了使用机械探针发送测试数据，也可以代替传输测试数据。 通过待测试的芯片上的光子检测器检测光学传输的测试数据。 可以使用与每个单独的电路部分相关联的测试数据来测试管芯的各个电路部分。 描述其他方面。

公开(公告)号：US20160370426A1

公开(公告)日：2016-12-22

申请号：US15251890

申请日：2016-08-30

申请人： ATC Logistics & Electronics, Inc.

发明人： Carlos Valmonte JIMENEZ ,  Jimmee Paul PARTEE ,  Fredrick Oluoch ONYANGO

IPC分类号： G01R31/302 ,  G01R1/04 ,  G01R31/28

CPC分类号： G01R29/10 ,  G01R29/0821

摘要： A system for testing radio frequency (RF) characteristics of a wireless device includes a test fixture. The test fixture includes a base plate that receives a wireless device, and a back plate that receives an RF antenna and positions the RF antenna relative to the wireless device. Additionally, the system includes test equipment that in operation performs RF testing on the wireless device using the RF antenna to determine RF characteristics of the wireless device.

摘要翻译： 用于测试无线设备的射频（RF）特性的系统包括测试夹具。 测试夹具包括接收无线设备的基板和接收RF天线并且相对于无线设备定位RF天线的背板。 此外，该系统包括在运行中使用RF天线在无线设备上执行RF测试以确定无线设备的RF特性的测试设备。

公开(公告)号：US20160356846A1

公开(公告)日：2016-12-08

申请号：US15244142

申请日：2016-08-23

申请人： TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.

发明人： HUANG-TING HSIAO ,  AN-TAI XU ,  PEI-HAW TSAO ,  CHENG-HUNG TSAI ,  TSUI-MEI CHEN ,  NAI-CHENG LU

IPC分类号： G01R31/302 ,  G06K7/10

CPC分类号： G01R31/3025 ,  G01R31/2822 ,  G06K7/10316 ,  G06K7/10336 ,  G06K7/10366 ,  G06K19/0722 ,  G06K19/07749 ,  H01L21/304 ,  H01L22/34

摘要： According to an exemplary embodiment, a method of detecting edge cracks in a die under test is provided. The method includes the following operations: receiving a command signal; providing power from the command signal; providing a response signal based on the command signal; and self-destructing based on the command signal.

摘要翻译： 根据示例性实施例，提供了一种检测被测试模具中的边缘裂纹的方法。 该方法包括以下操作：接收命令信号; 从命令信号提供电力; 基于所述命令信号提供响应信号; 并根据命令信号进行自毁。