Abstract:
A semiconductor integrated circuit includes: a delay locked loop (DLL) configured to generate a DLL clock signal by delaying a source clock signal by a first delay time for obtaining a lock, wherein an update period of the DLL is controlled in response to an update period control signal after locking is completed; and an update period controller configured to generate the update period control signal based on a second delay time occurring in a loop path of the DLL in response to the source clock signal and a plurality of control signals provided from the DLL.
Abstract:
A semiconductor memory device can optimize the layout area and current consumption based on multi-phase clock signals which are generated by dividing a source clock signal using a reset signal without a delay locked loop and a phase locked loop in order to have various phase information of low frequencies and different activation timings with a constant phase difference.
Abstract:
A data clock frequency divider circuit includes a training decoder and a frequency divider. The training decoder outputs a clock alignment training signal, which is indicative of the start of a clock alignment training, in response to a command and an address of a mode register set. The frequency divider, which is reset in response to an output of the training decoder, receives an internal data clock to divide a frequency of the internal data clock in half. The data clock frequency divider circuit secures a sufficient operating margin so that a data clock and a system clock are aligned within a pre-set clock training operation time by resetting the data clock to correspond to a timing in which the clock training operation starts, thereby providing a clock training for a high-speed system.
Abstract:
A rail-to-rail amplifier includes an NMOS type amplification unit configured to perform an amplification operation on differential input signals in a domain in which DC levels of the differential input signals are higher than a first threshold value, a PMOS type folded-cascode amplification unit configured to perform an amplification operation on the differential input signals in a domain in which the DC levels of the differential input signals are lower than a second threshold value which is higher than the first threshold value, the PMOS type folded-cascode amplification unit being cascade-coupled to the NMOS type amplification unit, and an adaptive biasing unit configured to interrupt a current path of the PMOS type folded-cascode amplification unit in a domain in which the DC levels of the differential input signals are higher than the second threshold value in response to the differential input signals.
Abstract:
An internal voltage generator includes: a detection unit configured to detect a level of an internal voltage in comparison to a reference voltage; a first driving unit configured to discharge an internal voltage terminal, through which the internal voltage is outputted, in response to an output signal of the detection unit; a current detection unit configured to detect a discharge current flowing through the first driving unit; and a second driving unit configured to charge the internal voltage terminal in response to an output signal of the current detection unit.
Abstract:
An injection locking clock generator can vary the free running frequency of an injection locking oscillator to broaden an operating frequency range of an oscillation signal injected to itself, thereby performing an injection locking with respect to all frequencies of an operating frequency range. The clock generator includes a main oscillator configured to generate oscillation signals of a frequency corresponding to a control voltage, and an injection locking oscillator configured to generate division signals synchronized with the oscillation signals by dividing the oscillation signals, wherein a free running frequency of the injection locking oscillator is set according to the frequency of the oscillation signals.
Abstract:
A semiconductor memory device including a clock input for receiving a source clock and supplying a generated clock to a plurality of clock transmission lines; a plurality of clock amplifiers, each amplifying a respective generated clock loaded on one of the plurality of clock transmission lines in response to a column enable signal; and a data input/output for inputting/outputting a plurality of data in response to the amplified clocks output by the plurality of clock amplifiers.
Abstract:
A high voltage regulator may include a first regulating unit, a second regulating unit, and an output node. The first regulating unit regulates the program voltage in a voltage-level-up interval of a program voltage of a memory cell. The second regulating unit regulates the program voltage in a voltage-level-down interval of the program voltage. The output node outputs the regulated program voltage.
Abstract:
A semiconductor device includes a pulse signal generating unit for generating a plurality of pulse signals each of which has a different pulse width from each other, a signal multiplexing unit for outputting one of the plurality of the pulse signals as an enable signal in response to frequencies of external clock signals, and a duty ratio detecting unit for detecting a duty ratio of the external clock signals in response to the enable signal.
Abstract:
A current mode logic (CML)-complementary metal oxide semiconductor (CMOS) converter prevents change of a duty ratio to stably operate during an operation for converting a CML level signal into a CMOS level signal. The CML-CMOS converter includes a reference level shifting unit configured to receive a CML signal swinging about a first reference level to shift a swing reference level to a second reference level; and an amplifying unit configured to amplify an output signal of the reference level shifting unit to output the amplified signal as a CMOS signal.