Solar Cell And Method For Manufacturing The Same
    12.
    发明申请
    Solar Cell And Method For Manufacturing The Same 审中-公开
    太阳能电池及其制造方法

    公开(公告)号:US20120167975A1

    公开(公告)日:2012-07-05

    申请号:US13166350

    申请日:2011-06-22

    IPC分类号: H01L31/0232 H01L31/18

    摘要: A solar cell includes a semiconductor substrate having a texturized surface, the semiconductor substrate including a plurality of recess portions and a plurality of flat portions, an insulation layer on the texturized surface of the semiconductor substrate and an electrode on the plurality of flat portions of the semiconductor substrate. The insulation layer on the plurality of recess portions of the semiconductor substrate is thinner than the insulation layer on the plurality of flat portions of the semiconductor substrate.

    摘要翻译: 太阳能电池包括具有纹理化表面的半导体衬底,所述半导体衬底包括多个凹部和多个平坦部分,所述半导体衬底的纹理化表面上的绝缘层和所述半导体衬底的多个平坦部分上的电极 半导体衬底。 半导体衬底的多个凹部上的绝缘层比半导体衬底的多个平坦部分上的绝缘层薄。

    LIGHT EMITTING DEVICE AND LIGHT EMITTING DEVICE PACKAGE
    15.
    发明申请
    LIGHT EMITTING DEVICE AND LIGHT EMITTING DEVICE PACKAGE 有权
    发光装置和发光装置包装

    公开(公告)号:US20110068355A1

    公开(公告)日:2011-03-24

    申请号:US12793781

    申请日:2010-06-04

    IPC分类号: H01L33/02 H01L33/30 H01L33/42

    摘要: A light emitting device and a light emitting device package including the same are provided. The light emitting device may include a light emitting structure including a first conductive type semiconductor layer, an active layer, and a second conductive type semiconductor layer, a first electrode on the light emitting structure, the first electrode including a pattern, and a pad electrode on the first electrode.

    摘要翻译: 提供一种发光器件和包括该发光器件的发光器件封装。 发光器件可以包括发光结构,其包括第一导电类型半导体层,有源层和第二导电类型半导体层,发光结构上的第一电极,包括图案的第一电极和焊盘电极 在第一个电极上。

    Flash memory device with split string selection line structure
    17.
    发明授权
    Flash memory device with split string selection line structure 有权
    闪存设备具有分割字符串选择线结构

    公开(公告)号:US07817473B2

    公开(公告)日:2010-10-19

    申请号:US12014902

    申请日:2008-01-16

    IPC分类号: G11C16/04

    摘要: A flash memory device is disclosed and includes a memory cell array including a plurality of sectors. Each one of the plurality of sectors includes a plurality of strings, and each of the plurality of strings includes a plurality of memory cells series connected between a string select transistor and a ground select transistor. The flash memory device also includes a plurality of string selection lines, wherein each one of the plurality of string selection lines is respectively connected to string select transistors associated the plurality of strings in one of the plurality of sectors.

    摘要翻译: 闪存器件被公开并且包括包括多个扇区的存储单元阵列。 多个扇区中的每一个包括多个串,并且多个串中的每一个包括连接在串选择晶体管和接地选择晶体管之间的多个存储单元串联。 闪存装置还包括多个串选择线,其中多个串选择线中的每一个分别连接到与多个扇区中的一个扇区中的多个扇区中的多个字符串相关联的串选择晶体管。

    METHOD OF READING DATA IN NON-VOLATILE MEMORY DEVICE
    18.
    发明申请
    METHOD OF READING DATA IN NON-VOLATILE MEMORY DEVICE 有权
    在非易失性存储器件中读取数据的方法

    公开(公告)号:US20100211852A1

    公开(公告)日:2010-08-19

    申请号:US12702481

    申请日:2010-02-09

    摘要: In a method of reading data from a non-volatile memory device, read data is generated based on a word line voltage. The read data includes data read from a plurality of sectors included in the non-volatile memory device. Bad sector data is transferred data based on read data and bad sector information. The bad sector data corresponds to data read from at least one bad sector included in the plurality of sectors. The bad sector information is updated by checking error bits of the bad sector data. The word line voltage is generated based on the updated bad sector information.

    摘要翻译: 在从非易失性存储器件读取数据的方法中,基于字线电压生成读取数据。 读取数据包括从包括在非易失性存储器件中的多个扇区读取的数据。 基于读取数据和坏扇区信息传输数据不良扇区数据。 坏扇区数据对应于从包括在多个扇区中的至少一个坏扇区读取的数据。 通过检查坏扇区数据的错误位来更新坏扇区信息。 基于更新的坏扇区信息生成字线电压。

    Flash memory device and method of programming flash memory device
    19.
    发明授权
    Flash memory device and method of programming flash memory device 有权
    闪存设备和闪存设备编程方法

    公开(公告)号:US07746703B2

    公开(公告)日:2010-06-29

    申请号:US12126080

    申请日:2008-05-23

    IPC分类号: G11C11/34 G11C16/06

    CPC分类号: G11C16/349

    摘要: A flash memory device and a method of programming the same include a memory cell array, a pass/fail check circuit and a control logic circuit. The memory cell array includes multiple memory cells arranged in rows and columns. The pass/fail check circuit verifies whether data bits selected by a column address during a column scan operation have program data values. The control logic circuit detects fail data bits from the selected data bits and stores the column address in response to the verification result of the pass/fail check circuit. The control logic circuit also compares a number of the fail data bits with a reference value and controls generation of the column address according to the comparison result.

    摘要翻译: 闪速存储器件及其编程方法包括存储单元阵列,通过/失败校验电路和控制逻辑电路。 存储单元阵列包括以行和列排列的多个存储单元。 通过/失败检查电路验证在列扫描操作期间由列地址选择的数据位是否具有程序数据值。 控制逻辑电路根据所选数据位检测故障数据位,并响应于通过/不通过检查电路的验证结果存储列地址。 控制逻辑电路还将多个故障数据位与参考值进行比较,并根据比较结果控制列地址的生成。