Apparatus for imprinting lithography and fabrication thereof
    11.
    发明授权
    Apparatus for imprinting lithography and fabrication thereof 失效
    用于压印光刻及其制造的装置

    公开(公告)号:US07141866B1

    公开(公告)日:2006-11-28

    申请号:US10826056

    申请日:2004-04-16

    CPC classification number: H01L21/76838 H01L21/0337

    Abstract: An imprinting apparatus and method of fabrication provide a mold having a pattern for imprinting. The apparatus includes a semiconductor substrate polished in a [110] direction. The semiconductor substrate has a (110) horizontal planar surface and vertical sidewalls of a wet chemical etched trench. The sidewalls are aligned with and therefore are (111) vertical lattice planes of the semiconductor substrate. The semiconductor substrate includes a plurality of vertical structures between the sidewalls, wherein the vertical structures may be nano-scale spaced apart. The method includes wet etching a trench with spaced apart (111) vertical sidewalls in an exposed portion of the (110) horizontal surface of the semiconductor substrate along (111) vertical lattice planes. A chemical etching solution is used that etches the (111) vertical lattice planes slower than the (110) horizontal lattice plane. The method further includes forming the imprinting mold.

    Abstract translation: 压印装置和制造方法提供具有用于压印的图案的模具。 该装置包括沿[110]方向抛光的半导体衬底。 半导体衬底具有(110)水平平面和湿化学蚀刻沟槽的垂直侧壁。 侧壁与半导体衬底对准并且因此是(111)垂直的晶格面。 半导体衬底包括在侧壁之间的多个垂直结构,其中垂直结构可以是纳米级隔开的。 该方法包括在(111)垂直晶格面的半导体衬底的(110)水平表面的暴露部分中湿式蚀刻具有间隔开(111)垂直侧壁的沟槽。 使用蚀刻比(110)水平晶格面慢的(111)垂直晶格面的化学蚀刻溶液。 该方法还包括形成压印模具。

    Method for fabricating a nano-imprinting mold
    17.
    发明授权
    Method for fabricating a nano-imprinting mold 失效
    用于压印光刻及其制造的装置

    公开(公告)号:US07368395B2

    公开(公告)日:2008-05-06

    申请号:US11601084

    申请日:2006-11-16

    CPC classification number: H01L21/76838 H01L21/0337

    Abstract: An imprinting apparatus and method of fabrication provide a mold having a pattern for imprinting. The apparatus includes a semiconductor substrate polished in a [110] direction. The semiconductor substrate has a (110) horizontal planar surface and vertical sidewalls of a wet chemical etched trench. The sidewalls are aligned with and therefore are (111) vertical lattice planes of the semiconductor substrate. The semiconductor substrate includes a plurality of vertical structures between the sidewalls, wherein the vertical structures may be nano-scale spaced apart. The method includes wet etching a trench with spaced apart (111) vertical sidewalls in an exposed portion of the (110) horizontal surface of the semiconductor substrate along (111) vertical lattice planes. A chemical etching solution is used that etches the (111) vertical lattice planes slower than the (110) horizontal lattice plane. The method further includes forming the imprinting mold.

    Abstract translation: 压印装置和制造方法提供具有用于压印的图案的模具。 该装置包括沿[110]方向抛光的半导体衬底。 半导体衬底具有(110)水平平面和湿化学蚀刻沟槽的垂直侧壁。 侧壁与半导体衬底对准并且因此是(111)垂直的晶格面。 半导体衬底包括在侧壁之间的多个垂直结构,其中垂直结构可以是纳米级隔开的。 该方法包括在(111)垂直晶格面的半导体衬底的(110)水平表面的暴露部分中湿式蚀刻具有间隔开(111)垂直侧壁的沟槽。 使用蚀刻比(110)水平晶格面慢的(111)垂直晶格面的化学蚀刻溶液。 该方法还包括形成压印模具。

    Patterning nanoline arrays with spatially varying pitch
    18.
    发明授权
    Patterning nanoline arrays with spatially varying pitch 有权
    具有空间变化沥青的图案化的牛磺酸阵列

    公开(公告)号:US07329115B2

    公开(公告)日:2008-02-12

    申请号:US11061226

    申请日:2005-02-18

    CPC classification number: G03F7/0002 B82Y10/00 B82Y40/00

    Abstract: A nanoimprint mold is described, comprising a plurality of alternating layers of distinct materials differentially etched along an edge thereof, said layers having spatially varying thicknesses along said edge such that nanolines patterned with said nanoimprint mold have corresponding spatially varying pitches.

    Abstract translation: 描述了纳米压印模具,其包括沿其边缘差异蚀刻的多个不同材料的交替层,所述层沿着所述边缘具有空间变化的厚度,使得用所述纳米压印模具图案化的纳米线具有相应的空间变化的间距。

    Photonic crystal device for fluid sensing
    19.
    发明授权
    Photonic crystal device for fluid sensing 有权
    用于流体感测的光子晶体装置

    公开(公告)号:US07289690B2

    公开(公告)日:2007-10-30

    申请号:US11107098

    申请日:2005-04-15

    CPC classification number: G02B6/1225 B82Y20/00 G02B2006/1215

    Abstract: An apparatus for sensing at least one property of a fluid is described. A first photonic crystal structure and a second photonic crystal structure are defined in a dielectric slab. The first and second photonic crystal structures comprise differently patterned arrays of channels extending through the dielectric slab. The apparatus further comprises a fluid introduction device configured to introduce a common volume of the fluid into the channels of the first and second photonic crystal structures. The at least one property of the fluid can be sensed by measuring the propagation of radiation through the first and second photonic crystal structures.

    Abstract translation: 描述了用于感测流体的至少一个性质的装置。 在介质板中限定第一光子晶体结构和第二光子晶体结构。 第一和第二光子晶体结构包括延伸穿过电介质板的不同图案的通道阵列。 该装置还包括流体引入装置,其构造成将共同体积的流体引入第一和第二光子晶体结构的通道中。 可以通过测量通过第一和第二光子晶体结构的辐射的传播来感测流体的至少一个性质。

    Monolithic system and method for enhanced Raman spectroscopy
    20.
    发明授权
    Monolithic system and method for enhanced Raman spectroscopy 有权
    用于增强拉曼光谱的单片系统和方法

    公开(公告)号:US07151599B2

    公开(公告)日:2006-12-19

    申请号:US11044421

    申请日:2005-01-27

    CPC classification number: G01N21/658 G01N2201/0873

    Abstract: Devices, systems, and methods for enhancing Raman spectroscopy and hyper-Raman are disclosed. A molecular analysis device for performing Raman spectroscopy comprises a substrate and a laser source disposed on the substrate. The laser source may be configured for emanating a laser radiation, which may irradiate an analyte disposed on a Raman enhancement structure. The Raman enhancement structure may be disposed in a waveguide. The molecular analysis device also includes a wavelength demultiplexer and radiation sensors disposed on the substrate and configured for receiving a Raman scattered radiation, which may be generated by the irradiation of the analyte and Raman enhancement structure.

    Abstract translation: 公开了用于增强拉曼光谱和超拉曼的装置,系统和方法。 用于执行拉曼光谱的分子分析装置包括设置在基板上的基板和激光源。 激光源可以被配置为发射激光辐射,其可照射设置在拉曼增强结构上的分析物。 拉曼增强结构可以设置在波导中。 该分子分析装置还包括布置在基板上的波长解复用器和辐射传感器,并且被配置为用于接收可以通过分析物的照射和拉曼增强结构产生的拉曼散射辐射。

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