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公开(公告)号：US20240345116A1
公开(公告)日：2024-10-17
申请号：US18630618
申请日：2024-04-09
Applicant: MITUTOYO CORPORATION
Inventor： Seiji SASAKI , Kazuhiko HIDAKA , Daisuke SAKAI
CPC classification number: G01N35/0099 , G01B3/008 , G01B5/12 , G01N35/00584
Abstract: There is provided an automatic measuring system that can automate measurement and a control method for automatic measurement. An automatic measuring system includes a measuring sensor tool that detects a surface of an object to be measured with a probe to measure a dimension or a shape of the object to be measured, and a multi-axis moving mechanism that relatively moves the measuring sensor tool with respect to the object to be measured. The measuring sensor tool includes a cover part to protect the probe. In an approaching step in which the moving mechanism causes the measuring sensor tool to approach a point to be measured of the object to be measured, the cover part accommodates the probe inside the cover part. After the approaching step is completed, the probe is exposed from the cover part to detect the surface of the object to be measured.
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公开(公告)号：US20240337474A1
公开(公告)日：2024-10-10
申请号：US18624666
申请日：2024-04-02
Applicant: MITUTOYO CORPORATION
Inventor： Shunsuke Tanaka , Hirokazu Kobayashi
Abstract: A measuring device includes a first scale provided on a rotary scale, arranged around an rotation axis of the rotary scale, and having first patterns arranged along a circumferential direction, a second scale provided on the rotary scale, arranged around the rotation axis, and having a plurality of second patterns arranged along the circumferential direction, first pattern detection sections arranged around the rotation axis, a second detection section that faces the second scale and reads at least a part of the plurality of second patterns, and a calculator configured to identify an absolute angle of the rotary scale, on a basis of a reading result of the first pattern detection sections and a reading result of the second pattern detection section. A number of the second pattern detection section is less than a number of the plurality of first pattern detection sections.
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公开(公告)号：US20240302159A1
公开(公告)日：2024-09-12
申请号：US18590527
申请日：2024-02-28
Applicant: MITUTOYO CORPORATION
Inventor： Kazuhiko HIDAKA
IPC: G01B11/00
CPC classification number: G01B11/005
Abstract: A production line in which a workpiece is conveyed through a conveyance path and machined with a machine tool is provided with a coordinate measuring machine capable of measuring the workpiece subjected to machining with the machine tool, whereby an in-line measurement system is provided. The coordinate measuring machine includes: a measuring machine body located beside the machine tool; a support extending from the measuring machine body to the machine tool; and a probe supported by the support and configured to measure the workpiece subjected to machining with the machine tool.
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公开(公告)号：US20240282004A1
公开(公告)日：2024-08-22
申请号：US18435347
申请日：2024-02-07
Applicant: MITUTOYO CORPORATION
Inventor： Ryosuke TANAKA
IPC: G06T7/80 , H04N23/695
CPC classification number: G06T7/80 , H04N23/695
Abstract: A calibration method including: a first imaging step of imaging a calibration jig, a second imaging step of imaging the calibration jig after causing the calibration jig to be moved in a predetermined first direction, a third imaging step of imaging the calibration jig after causing the calibration jig to be moved in a predetermined second direction, a fourth imaging step of imaging the calibration jig, a fifth imaging step of imaging the calibration jig after rotating the calibration jig about an axis oriented in a predetermined third direction, a sixth imaging step of imaging the calibration jig after rotating the calibration jig about an axis oriented in a predetermined fourth direction, and identifying calibration parameters used for calibration of the measurement apparatus.
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公开(公告)号：US20240210601A1
公开(公告)日：2024-06-27
申请号：US18395812
申请日：2023-12-26
Applicant: MITUTOYO CORPORATION
Inventor： Satoru YOSHIDA , Yuki KURAHASHI , Koji KUBO
CPC classification number: G02B3/14 , G02F1/294 , G02F2203/15
Abstract: A variable focal length lens device includes: a liquid resonant liquid lens unit having a refractive index changeable in response to an inputted drive signal; a scanning range setter setting a predetermined standard frequency band as a scanning range of a frequency of the drive signal; a resonance frequency detector scanning the frequency of the drive signal over the scanning range and detecting a resonance frequency of the liquid lens unit based on an oscillation state of the liquid lens unit; and a resonance frequency estimator calculating an estimated value of a target resonance frequency based on a standard resonance frequency detected from the standard frequency band by the resonance frequency detector, the scanning range setter further setting a target frequency band including the estimated value of the target resonance frequency as the scanning range.
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Patent Agency Ranking
公开(公告)号：US20240210167A1
公开(公告)日：2024-06-27
申请号：US18539835
申请日：2023-12-14
Applicant: MITUTOYO CORPORATION
Inventor： Ryoichi Imaizumi , Takumi Hayashi , Kohei Narumiya
IPC: G01B11/24
CPC classification number: G01B11/24
Abstract: An optical measurement device includes: a measurement region in which a measurement object is disposed; a light beam scanning unit that irradiates the measurement region with light beam and scans the light beam in a scanning direction intersecting with an irradiation direction of the light beam; a light receiving unit that receives the light beam that has passed through the measurement region and outputs a light receiving signal; a signal processing unit that outputs data indicative of a dimension in the scanning direction of the measurement object based on the light receiving signal; and an optical path cover that is configured to be removably attachable to a housing of the light beam scanning unit and covers an optical path of the light beam in a range from the housing to the measurement object.
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公开(公告)号：US20240210160A1
公开(公告)日：2024-06-27
申请号：US18394552
申请日：2023-12-22
Applicant: MITUTOYO CORPORATION
Inventor： Bart Geert ENTINK
CPC classification number: G01B9/04 , G01B11/0608 , G02B21/002 , G02B21/06
Abstract: The current invention relates to a method of structured lilumination microscopy for determining a height map of a test surface wherein use is made of a structured lilumination microscope. The invention is further related to a structured illumination microscope for determining a height map of a test surface. The microscope comprises a light source, a spatial light modulator, scanner, an optical detector, and a processor.
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公开(公告)号：US20240202963A1
公开(公告)日：2024-06-20
申请号：US18067240
申请日：2022-12-16
Applicant: Mitutoyo Corporation
Inventor： Michael NAHUM
CPC classification number: G06T7/73 , G06T7/60 , G06T2207/10148 , G06T2207/30164 , G06T2207/30204
Abstract: A machine vision inspection system and method perform operations including: acquire a first image at a first image position, wherein the first image includes a first feature of a workpiece and a first measurement marking set of a measurement marking device (MMD); determine a first relative position of the first feature in the first image; move a stage supporting the workpiece to acquire a second image at a second image position, wherein the second image includes a second feature of the workpiece and a second measurement marking set of the MMD; determine a second relative position of the second feature in the second image; and determine a distance between the first feature and the second feature based at least in part on the first relative position, the second relative position and a distance between a measurement marking of the first set and a measurement marking of the second set.
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公开(公告)号：US20240175729A1
公开(公告)日：2024-05-30
申请号：US18500545
申请日：2023-11-02
Applicant: MITUTOYO CORPORATION
Inventor： Akihide Kimura , Kimitoshi Ono , Keitaro Koyatsu
CPC classification number: G01D5/38 , G01D5/3473
Abstract: An optical encoder includes: a scale having a scale grating; a light source that emits light; and a light-receiving device that receives light that has passed through the scale. The optical encoder also has a shielding plate that shapes the beam shape, which is the shape of the light emitted from the light source. The shielding plate is disposed between the light source and the scale and defines the beam shape such that the shape of a long-length contour portion and the shape of a long-length side section have no correlation with each other. The long-length contour portion is a portion extending in the measurement direction at the contour of the beam shape of the light emitted to the light-receiving device via the scale, and the long-length side section is a section extending in the measurement direction at the contour of the light-receiving device.
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公开(公告)号：US20240175668A1
公开(公告)日：2024-05-30
申请号：US18059851
申请日：2022-11-29
Applicant: Mitutoyo Corporation
Inventor： Isaiah FREERKSEN
IPC: G01B5/012
CPC classification number: G01B5/012
Abstract: A measuring probe includes a stylus having one or more contact portions; a detection element configured to detect a movement of the stylus based on a contact made by the contact portions; a signal processing portion configured to process a signal from the detection element to output a measurement signal; and a stylus motion mechanism. The stylus motion mechanism includes a first motion portion configured to enable motion of the stylus from a rest position in a positive axial direction when a corresponding force in the positive axial direction is applied by a contact of a contact portion of the stylus with a workpiece; and a second motion portion configured to enable motion of the stylus from the rest position in a negative axial direction opposite to the positive axial direction when a corresponding force is applied by a contact of a contact portion of the stylus with a workpiece.
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