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    Lossless cryo-grid preparation by controlled sample evaporation
    11.
    发明授权
    Lossless cryo-grid preparation by controlled sample evaporation 有权

    公开(公告)号：US11860071B2

    公开(公告)日：2024-01-02

    申请号：US16342529

    申请日：2017-10-17

    Applicant: UNIVERSITAT BASEL

    Inventor： Thomas Braun ,  Stefan Arnold ,  Henning Stahlberg

    IPC: G01N1/00 ,  G01N1/28 ,  G01N1/42 ,  G01N1/44

    CPC classification number: G01N1/2813 ,  G01N1/42 ,  G01N1/44

    Abstract: Method for preparing a sample, wherein the sample is provided as a thin film on a support structure; the temperature of the support structure is adjusted to a value above the dew point temperature of the environment to decrease the film thickness, light is directed at the support structure, an intensity value of the transmitted light is measured, and the support structure is automatically inserted into a liquid cryogen dependent on the measured intensity value. The application further relates to a system comprising a support structure, a temperature-controlled stage for keeping the support structure at a pre-defined temperature, a transfer mechanism for moving the support structure into a container containing a liquid cryogen, a light source, a photodetector for measuring an intensity value of the transmitted light, and a control device for triggering the transfer mechanism dependent on the measured intensity value.

    SAMPLE HOLDER FOR AN ATOMIC FORCE MICROSCOPE
    17.
    发明申请
    SAMPLE HOLDER FOR AN ATOMIC FORCE MICROSCOPE 有权
    原子力显微镜样品座

    公开(公告)号：US20160187375A1

    公开(公告)日：2016-06-30

    申请号：US14902608

    申请日：2014-07-05

    Applicant: UNIVERSITAT BASEL

    Inventor： Marko LOPARIC ,  Pascal Alexander OEHLER

    IPC: G01Q30/20 ,  A61B10/02 ,  G01Q60/24

    CPC classification number: G01Q30/20 ,  A61B10/0233 ,  G01Q60/24

    Abstract: The present invention relates to sample holders for holding a sample, particularly for an atomic force microscope. Such a sample holder comprising a sample dish (1) comprising a bottom (2), and an opening (3) arranged in said bottom (2) for receiving and holding the sample (15). Furthermore the present invention relates to a sample holder system and to a method for transferring an e.g. biological sample (15) from a biopsy tool (18) to a sample holder.

    Abstract translation: 本发明涉及用于保持样品的样品保持器，特别是用于原子力显微镜。 这种样品保持器包括包括底部（2）的样品皿（1）和布置在所述底部（2）中用于接收和保持样品（15）的开口（3）。 此外，本发明涉及一种样品保持器系统和一种用于转移例如， 生物样品（15）从活检工具（18）到样品架。

    METHOD AND DEVICE FOR CONTROLLING A SCANNING PROBE MICROSCOPE
    18.
    发明申请
    METHOD AND DEVICE FOR CONTROLLING A SCANNING PROBE MICROSCOPE 有权
    用于控制扫描探针显微镜的方法和装置

    公开(公告)号：US20140338073A1

    公开(公告)日：2014-11-13

    申请号：US14364309

    申请日：2012-12-12

    Applicant: UNIVERSITAT BASEL

    Inventor： Marija Plodinec ,  Marko Loparic ,  Roderick YH Lim

    IPC: G01Q10/06

    CPC classification number: G01Q10/06 ,  B82Y35/00 ,  G01Q10/065

    Abstract: The present invention relates to a method for controlling a scanning probe microscope having a probe (2) with a tip (21) for interacting with a sample (4), and a nanoscanner (1) for retaining the sample (4) or the probe (2), comprising the steps of monitoring the extension of the piezo element (1) along a first direction (R) along which the tip (21) is moved towards the sample (4), and adjusting the level of the probe (2) along the first direction (R) by means of an additional actuator (3), when the nanoscanner (1) exhibits an extension below or above a threshold value. The invention further relates to a device (100) for controlling a scanning probe microscope.

    Abstract translation: 本发明涉及一种用于控制扫描探针显微镜的方法，所述扫描探针显微镜具有带有用于与样品（4）相互作用的尖端（21）的探针（2）和用于保持样品（4）或探针 （2），包括以下步骤：沿尖端（21）朝向样品（4）移动的第一方向（R）监测压电元件（1）的延伸，并且调节探针（2）的水平 ）当所述纳米扫描仪（1）展现出低于或高于阈值的延伸时，通过附加致动器（3）沿所述第一方向（R）。 本发明还涉及一种用于控制扫描探针显微镜的装置（100）。

    MHC CLASS IA OPEN CONFORMERS
    19.
    发明申请
    MHC CLASS IA OPEN CONFORMERS 有权

    公开(公告)号：US20220185865A1

    公开(公告)日：2022-06-16

    申请号：US17687732

    申请日：2022-03-07

    Applicant: UNIVERSITAT ZURICH ,  UNIVERSITAT BASEL

    Inventor： Osiris MARROQUIN BELAUNZARAN ,  Christoph RENNER

    IPC: C07K14/74 ,  A61K39/395 ,  A61K48/00 ,  A61P31/22 ,  A61P31/18 ,  A61P31/16 ,  A61P35/00

    Abstract: The invention relates to MHC-Ia open conformers as immunomodulatory agents, particularly in the treatment or prevention of cancer. The open conformer comprises or consists of a first and a second monomer, and each monomer comprises a HLA-heavy chain from the MHC-Ia molecules. The open conformer further comprises a protein stabilizing polypeptide sequence and optionally an amino acid linker. Further aspects of the invention provide combination medicaments comprising the MHC-Ia open conformers and immune checkpoint inhibitors.
    Furthermore, the invention relates to the use of MHC-Ia open conformers as immunomodulators, particularly in diseases where the interaction to diverse immunoregulatory receptors such as KIR3DL1, KIR3DL2, KIR3DL3, LILRB1, LILRB2, and PTPRJ modulates an immune response, and in diseases were the negative modulation of Tregs is a therapeutic strategy, e.g. infectious diseases.

    Method and device for controlling a scanning probe microscope
    20.
    发明授权
    Method and device for controlling a scanning probe microscope 有权

    公开(公告)号：US09244095B2

    公开(公告)日：2016-01-26

    申请号：US14364309

    申请日：2012-12-12

    Applicant: UNIVERSITAT BASEL

    Inventor： Marija Plodinec ,  Marko Loparic ,  Roderick Y H Lim

    IPC: G01Q10/00 ,  G01Q10/06 ,  B82Y35/00

    CPC classification number: G01Q10/06 ,  B82Y35/00 ,  G01Q10/065

    Abstract: The present invention relates to a method for controlling a scanning probe microscope having a probe (2) with a tip (21) for interacting with a sample (4), and a nanoscanner (1) for retaining the sample (4) or the probe (2), comprising the steps of monitoring the extension of the piezo element (1) along a first direction (R) along which the tip (21) is moved towards the sample (4), and adjusting the level of the probe (2) along the first direction (R) by means of an additional actuator (3), when the nanoscanner (1) exhibits an extension below or above a threshold value. The invention further relates to a device (100) for controlling a scanning probe microscope.

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