Abstract:
A handler apparatus adjusts a position of an actuator and enhances positional accuracy of a device under test. Provided is a handler apparatus that conveys a device under test to a test socket, including: an actuator that, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder, and adjusts a position of the device under test on the device holder; and an actuator adjusting section that adjusts an amount of driving of the actuator by causing the actuator to fit an actuator fitting unit.
Abstract:
A fixture unit assuredly fits a fixed unit including a gap portion including a first wall surface and a second wall surface opposing each other. Provided are a fixture unit and a fixture apparatus including a fitting pin fitting a gap portion of a fixed unit, the gap portion including a first wall surface and a second wall surface opposing each other, where the fitting pin includes: a fixed pin inserted to the gap portion to contact the first wall surface; a moving pin inserted to the gap portion to be pressed on the second wall surface; and a base to which the fixed pin is fixed, and the moving pin includes a bottom portion in an arc form with a center being a central axis of movement, and the bottom portion fitting slidably with respect to a concave portion provided for the base.
Abstract:
A temperature adjusting system includes a temperature adjuster that adjusts a temperature of a device under test (DUT) and a first acquirer that acquires a first digital signal and outputs a second digital signal. The first digital signal is output from a first temperature detecting circuit in the DUT and indicates an internal temperature of the DUT. The temperature adjusting system includes a controller that controls the temperature adjuster using the second digital signal.
Abstract:
A test carrier that accommodates a DUT and includes a first flow passage through which fluid supplied from an outside of the test carrier flows.
Abstract:
An electronic component handling apparatus includes: a moving device that presses a device under test (DUT) against a socket of a test head. The moving device includes: a pusher that contacts the DUT; and a heater that heats the DUT through the pusher. The pusher includes: an internal space; and a first flow path that communicates with the internal space. Fluid from the test head is supplied to the internal space through the first flow path.
Abstract:
Provided is an actuator including: first to third rotation axes provided at a fixed section and having axes in a same direction, first to third rotation sections provided at positions offset from centers of the corresponding rotation axes, and rotating in response to the corresponding rotation axes; a movable section including first and third side walls facing the first and the third rotation sections in a first direction on a movable plane, and a second side wall facing the second rotation section in a second direction, the movable section moving on a predetermined movable plane in response to rotation of the first to third rotation sections; and a biasing section biasing the movable section with respect to the fixed section in at least one of the first direction and the second direction, and making at least one of the first to third rotation sections abut against the corresponding side wall.