Battery-specific adjustments to maximum battery voltage

    公开(公告)号:US11451068B1

    公开(公告)日:2022-09-20

    申请号:US16551170

    申请日:2019-08-26

    Abstract: Systems, methods, and computer-readable media are disclosed for battery-specific adjustments to maximum battery voltage. In one embodiment, an example device may include a battery, at least one memory that stores computer-executable instructions, and at least one processor. The device may be configured to determine a first value indicative of a first length of time the battery was at a first voltage and a first temperature, determine a second value indicative of a second length of time the battery was at a second voltage and a second temperature, determine that a sum of the first value and the second value satisfies a first threshold, and cause a maximum output voltage value to be reduced from a first maximum output voltage value to a second maximum output voltage value.

    Battery thermal shield
    12.
    发明授权

    公开(公告)号:US10236134B1

    公开(公告)日:2019-03-19

    申请号:US14632892

    申请日:2015-02-26

    Abstract: A battery thermal shield is used with a battery to reduce peak temperature exposure caused by a short of a battery from physical damage to the battery (e.g., the battery being pierced by a metal object). The thermal shield may be a highly thermal-conductive substance, such as a film, adhesive, gel, and/or other substance, that acts as an efficient heat spreader. Unlike a typical heat sink or heat fins, the thermal shield may have a low profile and be configured to spread a rapid onset of heat at a localized point or area (e.g., a location of an internal short) to a wider area to reduce a peak (maximum) temperature caused by a short of a battery. The thermal shield may be at least partially formed of graphite which may be adhered to the battery.

    Determining a thickness of individual layers of a plurality of metal layers

    公开(公告)号:US09791257B1

    公开(公告)日:2017-10-17

    申请号:US14813227

    申请日:2015-07-30

    CPC classification number: G01B7/06

    Abstract: Techniques are described to determine a thickness of individual layers of a plurality of metal layers that include a first metal layer disposed on a polymer material and a second metal layer disposed on the first layer, such that the first layer is between the polymer material and the second layer. A measurement device may determine a resistance of the plurality of metal layers and calculate (e.g., estimate) a thickness of the individual layers based on the resistance of the individual layers and based on a resistivity of individual metals used in the plurality of metal layers. The measurement device may determine whether the individual thicknesses are within predetermined thickness ranges to determine whether to pass a quality control test.

    Measurement of dynamic material properties

    公开(公告)号:US09645064B1

    公开(公告)日:2017-05-09

    申请号:US14642713

    申请日:2015-03-09

    CPC classification number: G01N3/30 G01N3/303

    Abstract: An example method includes positioning a mass at a height opposite a modulator characterized by a particular strain rate and support by a carrier moveably disposed opposite the mass. The method also includes releasing the mass such that the mass impacts the modulator, and an additional component connected to the carrier causes failure of a sample of material. The method further includes determining a displacement of the carrier corresponding to failure of the sample, determining a force applied to the modulator by the mass and resulting in failure of the sample, and determining at least one of a dynamic strength of the sample and a dynamic modulus of the sample. In such a method, the dynamic strength is based on the force applied to the modulator and the strain rate. Additionally, the dynamic modulus is based on the displacement of the carrier and the strain rate.

    Flexible battery device
    16.
    发明授权

    公开(公告)号:US10361406B1

    公开(公告)日:2019-07-23

    申请号:US15277867

    申请日:2016-09-27

    Abstract: A power source, designed to be bent or flexed during use, may include a layer of anode material having a length greater than a layer of cathode material to accommodate for movement of the cathode or anode layers during flexing of the power source. An enclosure containing the cathode and anode materials may include an inner protective layer proximate to the cathode and anode layers and a water-impermeable layer external to the inner protective layer. The water-impermeable layer may have a pleated or corrugated configuration that may be extended when the power source is bent under application of a flexure stress, preventing damage or deformation to the water-impermeable layer.

    Electronic device inspecting system and method

    公开(公告)号:US10067065B1

    公开(公告)日:2018-09-04

    申请号:US14311585

    申请日:2014-06-23

    Abstract: A cover glass of an electronic device may be inspected for defects and damage such as cracks, fractures, scratches, and chips. The electronic device may be placed in an enclosure with a lighting assembly that emits light to the electronic device, and scattered light from defects and damage of the cover glass is captured by an imaging device. A shutter assembly facilitates the capture of scattered light and reduces the capture of reflected light, which enhances the exposure of defects and damage of the captured image of the cover glass. A mirror facilitates the capture of a side surface of the electronic device.

    Thermal conductivity measurement of anisotropic substrates

    公开(公告)号:US10041894B1

    公开(公告)日:2018-08-07

    申请号:US14849471

    申请日:2015-09-09

    Abstract: Determining an in-plane thermal conductivity of anisotropic materials, such as display stacks, printed circuit boards (PCBs), and composite housings, includes heating a first region of an anisotropic sample, cooling a second region of the sample, and measuring temperature at a first location between the first region and the second region and a second location between the first region and the second region. The in-plane thermal conductivity of the sample is computed based at least in part on the temperature at the first location, the temperature at the second location, the distance from the first region to the second region, a thickness of the substantially planar anisotropic substrate, and an amount of heat applied to the first region.

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