Abstract:
This disclosure describes techniques and methodologies of using passive continuous time (CT) delay line for high-speed CT analog-to-digital converter (ADC) applications. In a continuous-time residual producing stage common to these CT ADCs, a proper delay between the analog input and DAC output is crucial. Specifically, using an inductor-capacitor (LC) lattice based delay element to enable high-performance CT pipeline ADC and CT delta-sigma (ΔΣ) ADC. The use of an LC lattice based delay element provides wide-band group delay for continuous-time signals with well-controlled impedance. This will be an essential circuit component to build a high-performance CT ADCs especially in architectures where the generation of a low-noise and low-distortion residual between the CT signal and its digitized version is needed. LC lattice based delay element enables noise-free, distortion-free wideband delay that is required for high speed continuous-time pipeline ADC and delta-sigma ADC.
Abstract:
This disclosure describes techniques and methodologies of using passive continuous time (CT) delay line for high-speed CT analog-to-digital converter (ADC) applications. In a continuous-time residual producing stage common to these CT ADCs, a proper delay between the analog input and DAC output is crucial. Specifically, using an inductor-capacitor (LC) lattice based delay element to enable high-performance CT pipeline ADC and CT delta-sigma (ΔΣ) ADC. The use of an LC lattice based delay element provides wide-band group delay for continuous-time signals with well-controlled impedance. This will be an essential circuit component to build a high-performance CT ADCs especially in architectures where the generation of a low-noise and low-distortion residual between the CT signal and its digitized version is needed. LC lattice based delay element enables noise-free, distortion-free wideband delay that is required for high speed continuous-time pipeline ADC and delta-sigma ADC.
Abstract:
The present disclosure describes an improved multi-stage noise shaping (MASH) analog-to-digital converter (ADC) for converting an analog input signal to a digital output signal. In particular, a full delta-sigma (ΔΣ) modulator is provided at the front-end of the MASH ADC, and another full ΔΣ modulator is provided at the back-end of the MASH ADC. The front-end ΔΣ modulator digitizes an analog input signal, and the back-end ΔΣ modulator digitizes an error between the output of the front-end ΔΣ modulator and the (original) analog input signal. In this configuration where the back-end modulator digitizes the error of the (full) front-end modulator, some design constraints of the front-end are relaxed. These design constraints include thermal noise, digital noise cancellation filter complexity (the quantization noise of the front-end is already shaped by the noise transfer function of the front-end), and/or non-linearity.
Abstract:
An integrated circuit includes a component calculator configured to compute at least one component value of a highly programmable analog-to-digital converter (ADC) from at least one application parameter, and a mapping module configured to map the component value to a corresponding register setting of the ADC based on at least one process parameter, wherein the integrated circuit produces digital control signals capable of programming the ADC. In a specific embodiment, the component calculator uses an algebraic function of a normalized representation of the application parameter to approximately evaluate at least one normalized ADC coefficient. The component value is further calculated by denormalizing the normalized ADC coefficient. In another specific embodiment, the component calculator uses an algebraic function of the application parameter to calculate the component value. In some embodiments, the integrated circuit further includes a scaling module configured to scale the component value based on scaling parameters.