Method for programming phase-change memory array to set state and circuit of a phase-change memory device
    11.
    发明授权
    Method for programming phase-change memory array to set state and circuit of a phase-change memory device 有权
    用于编程相变存储器阵列以设置相变存储器件的状态和电路的方法

    公开(公告)号:US07274586B2

    公开(公告)日:2007-09-25

    申请号:US11070196

    申请日:2005-03-03

    IPC分类号: G11C11/00

    摘要: A method for programming a phase-change memory array and circuit of a phase-change memory device, each having a plurality of phase-change memory cells, may enable all the phase-change memory cells therein to be changed or set at a set resistance state, and may reduce the time needed to change the phase-change memory array to the set resistance state. In the method, a set current pulse having first through nth stages may be applied to the cells of the array to change the cells to the set resistance state. A minimum current level of the set current pulse applied to the phase-change memory cells in any stage may be higher than a reference current level for the cells of the array. A given current level of the set current pulse may be sequentially reduced from stage to stage.

    摘要翻译: 一种用于编程相变存储器阵列和相变存储器件的电路的方法,每个相变存储器件具有多个相变存储器单元,可以使其中的所有相变存储器单元能够被改变或设置为设定电阻 状态,并且可以减少将相变存储器阵列改变为设定电阻状态所需的时间。 在该方法中,可以将具有第一至第n个阶段的设定电流脉冲施加到阵列的单元以将单元改变为设定电阻状态。 施加到任何阶段中的相变存储器单元的设定电流脉冲的最小电流电平可以高于阵列的单元的参考电流电平。 设定电流脉冲的给定电流电平可以从一个阶段顺序地减少。

    Memory cell array biasing method and a semiconductor memory device
    12.
    发明申请
    Memory cell array biasing method and a semiconductor memory device 有权
    存储单元阵列偏置方法和半导体存储器件

    公开(公告)号:US20060164896A1

    公开(公告)日:2006-07-27

    申请号:US11327967

    申请日:2006-01-09

    IPC分类号: G11C7/00

    摘要: A method of biasing a memory cell array during a data writing operation and a semiconductor memory device are provided. The semiconductor memory device includes: a memory cell array including a plurality of memory cells in which a first terminal of a memory cell is connected to a corresponding first line among a plurality of first lines and a second terminal of a memory cell is connected to a corresponding second line among a plurality of second lines; and a bias circuit for biasing a selected second line to a first voltage and non-selected second lines to a second voltage.

    摘要翻译: 提供了一种在数据写入操作期间偏置存储单元阵列的方法和半导体存储器件。 半导体存储器件包括:存储单元阵列,其包括多个存储单元,其中存储单元的第一端子连接到多条第一线路中的相应第一线路,而存储器单元的第二端子连接到 多个第二行中的对应的第二行; 以及用于将所选择的第二线偏压到第一电压和未选择的第二线到第二电压的偏置电路。

    Phase-change memory device and method of writing a phase-change memory device
    13.
    发明申请
    Phase-change memory device and method of writing a phase-change memory device 有权
    相变存储器件以及相变存储器件的写入方法

    公开(公告)号:US20050169093A1

    公开(公告)日:2005-08-04

    申请号:US10919371

    申请日:2004-08-17

    IPC分类号: G11C13/02 G11C8/00 G11C16/02

    摘要: A phase-change cell memory device includes a plurality of phase-change memory cells, an address circuit, a write driver, and a write driver control circuit. The phase-change memory cells each include a volume of material that is programmable between amorphous and crystalline states. The address circuit selects at least one of the memory cells, and the write driver generates a reset pulse current to program a memory cell selected by the address circuit into the amorphous state, and a set pulse current to program the memory cell selected by the address circuit into the crystalline state. The write driver control circuit varies at least one of a pulse width and a pulse count of at least one of the reset and set pulse currents according to a load between the write driver and the memory cell selected by the address circuit.

    摘要翻译: 相变单元存储器件包括多个相变存储器单元,地址电路,写入驱动器和写入驱动器控制电路。 相变存储单元各自包括可在非晶态和晶态之间编程的材料体积。 地址电路选择存储单元中的至少一个,并且写入驱动器产生复位脉冲电流以将由地址电路选择的存储单元编程为非晶状态,以及设置脉冲电流以对由地址选择的存储单元进行编程 电路进入结晶状态。 写入驱动器控制电路根据写入驱动器和由地址电路选择的存储器单元之间的负载来改变复位和设置脉冲电流中的至少一个的脉冲宽度和脉冲计数中的至少一个。

    Layout method of latch-up prevention circuit of a semiconductor device

    公开(公告)号:US06657264B2

    公开(公告)日:2003-12-02

    申请号:US09940733

    申请日:2001-08-28

    IPC分类号: H01L2994

    CPC分类号: H01L27/0921 H01L27/0266

    摘要: A layout method is provided for a latch-up prevention circuit of a semiconductor memory device which includes the steps of: arranging a cell array at substantially the middle of the device; placing peripheral circuits next to both sides of the cell array; placing a plurality of pads on both sides of the cell array between the peripheral circuits and both edges of the device; and arranging guard rings beneath the plurality of pads. The layout method further includes a plurality of ESD protection transistors disposed axially along the direction as the plurality of pads between the plurality of pads and an edge of the device. And each of guard ring is a NWELL guard ring, and connected to a supply voltage and ground.

    WRITE DRIVER CIRCUIT IN PHASE CHANGE MEMORY DEVICE AND METHOD FOR APPLYING WRITE CURRENT
    15.
    发明申请
    WRITE DRIVER CIRCUIT IN PHASE CHANGE MEMORY DEVICE AND METHOD FOR APPLYING WRITE CURRENT 有权
    相变存储器件中的写驱动电路和应用写入电流的方法

    公开(公告)号:US20050117388A1

    公开(公告)日:2005-06-02

    申请号:US10969697

    申请日:2004-10-20

    摘要: A write driver circuit including a plurality of programmable fuses for a phase change memory device in which a write operation is correctly performed even in the case where a current output shift in a write current generation circuit; or in the case where a phase change memory cell has a phase change property shift due to an external factor or due a process change. The write driver circuit includes; a write current control unit for outputting a first or second level of voltage selected, by selecting one of a first or second programmable current path, based on whether a first or second selection pulse signal is applied; and a current driving unit for generating a write current controlled by the output voltage of the write current control unit. Each of the first and second programmable current paths includes fuses that can be programmed to adjusted their resistance to adjust the respective selected output voltage to compensate for a current output shift in a write current generation circuit or for a phase change memory cell has a phase change property shift.

    摘要翻译: 一种写入驱动器电路,包括用于相变存储器件的多个可编程保险丝,其中即使在写入电流产生电路中的电流输出移位的情况下也正确地执行写入操作; 或者在相变存储单元由于外部因素或由于处理变化而具有相变特性偏移的情况。 写驱动电路包括: 写入电流控制单元,用于通过选择第一或第二可编程电流路径中的一个,基于是施加第一还是第二选择脉冲信号来输出所选择的第一或第二电平电平; 以及电流驱动单元,用于产生由写入电流控制单元的输出电压控制的写入电流。 第一和第二可编程电流路径中的每一个包括熔丝,其可以被编程以调整其电阻以调整相应的选择的输出电压以补偿写入电流产生电路中的电流输出偏移,或者对于相变存储器单元具有相变 财产转移

    Memory cell array biasing method and a semiconductor memory device
    16.
    发明授权
    Memory cell array biasing method and a semiconductor memory device 有权
    存储单元阵列偏置方法和半导体存储器件

    公开(公告)号:US07710767B2

    公开(公告)日:2010-05-04

    申请号:US11969326

    申请日:2008-01-04

    IPC分类号: G11C11/00

    摘要: A method of biasing a memory cell array during a data writing operation and a semiconductor memory device, in which the semiconductor memory device includes: a memory cell array including a plurality of memory cells in which a first terminal of a memory cell is connected to a corresponding first line among a plurality of first lines and a second terminal of a memory cell is connected to a corresponding second line among a plurality of second lines; and a bias circuit for biasing a selected second line to a first voltage and non-selected second lines to a second voltage.

    摘要翻译: 一种在数据写入操作期间偏置存储单元阵列的方法和半导体存储器件,其中半导体存储器件包括:存储单元阵列,其包括多个存储单元,其中存储单元的第一端子连接到 多个第一行中的对应的第一行和存储单元的第二端连接到多条第二行中的对应的第二行; 以及用于将所选择的第二线偏压到第一电压和未选择的第二线到第二电压的偏置电路。

    Memory cell array biasing method and a semiconductor memory device
    17.
    发明授权
    Memory cell array biasing method and a semiconductor memory device 有权
    存储单元阵列偏置方法和半导体存储器件

    公开(公告)号:US08248842B2

    公开(公告)日:2012-08-21

    申请号:US12732990

    申请日:2010-03-26

    IPC分类号: G11C11/00

    摘要: A method of biasing a memory cell array during a data writing operation and a semiconductor memory device, in which the semiconductor memory device includes: a memory cell array including a plurality of memory cells in which a first terminal of a memory cell is connected to a corresponding first line of a plurality of first lines and a second terminal of the memory cell is connected to a corresponding second line of a plurality of second lines; a bias circuit for biasing a selected second line of the second lines to a reference voltage and a non-selected second line to a first voltage; and a local word line address decoder applying the reference voltage or a pumping voltage corresponding to the first voltage to the bias circuit.

    摘要翻译: 一种在数据写入操作期间偏置存储单元阵列的方法和半导体存储器件,其中半导体存储器件包括:存储单元阵列,其包括多个存储单元,其中存储单元的第一端子连接到 多个第一行的对应的第一行和存储单元的第二端连接到多条第二行的对应的第二行; 偏置电路,用于将所选择的第二行的第二行偏置为参考电压和未选择的第二行至第一电压; 以及本地字线地址解码器将对应于第一电压的参考电压或泵浦电压施加到偏置电路。

    MEMORY CELL ARRAY BIASING METHOD AND A SEMICONDUCTOR MEMORY DEVICE
    18.
    发明申请
    MEMORY CELL ARRAY BIASING METHOD AND A SEMICONDUCTOR MEMORY DEVICE 有权
    存储单元阵列偏移方法和半导体存储器件

    公开(公告)号:US20100246248A1

    公开(公告)日:2010-09-30

    申请号:US12732990

    申请日:2010-03-26

    IPC分类号: G11C11/00 G11C8/08

    摘要: A method of biasing a memory cell array during a data writing operation and a semiconductor memory device, in which the semiconductor memory device includes: a memory cell array including a plurality of memory cells in which a first terminal of a memory cell is connected to a corresponding first line of a plurality of first lines and a second terminal of the memory cell is connected to a corresponding second line of a plurality of second lines; a bias circuit for biasing a selected second line of the second lines to a reference voltage and a non-selected second line to a first voltage; and a local word line address decoder applying the reference voltage or a pumping voltage corresponding to the first voltage to the bias circuit.

    摘要翻译: 一种在数据写入操作期间偏置存储单元阵列的方法和半导体存储器件,其中半导体存储器件包括:存储单元阵列,其包括多个存储单元,其中存储单元的第一端子连接到 多个第一行的对应的第一行和存储单元的第二端连接到多条第二行的对应的第二行; 偏置电路,用于将所选择的第二行的第二行偏置为参考电压和未选择的第二行至第一电压; 以及本地字线地址解码器将对应于第一电压的参考电压或泵浦电压施加到偏置电路。

    Write driver circuit in phase change memory device and method for applying write current
    20.
    发明授权
    Write driver circuit in phase change memory device and method for applying write current 有权
    在相变存储器件中写入驱动电路以及施加写入电流的方法

    公开(公告)号:US06928022B2

    公开(公告)日:2005-08-09

    申请号:US10969697

    申请日:2004-10-20

    摘要: A write driver circuit including a plurality of programmable fuses for a phase change memory device in which a write operation is correctly performed even in the case where a current output shift in a write current generation circuit; or in the case where a phase change memory cell having a phase change property shift due to an external factor or due a process change. The write driver circuit includes a write current control unit for outputting a first or second level of voltage selected, by selecting one of a first or second programmable current path, based on whether a first or second selection pulse signal is applied; and a current driving unit for generating a write current controlled by the output voltage of the write current control unit. Each of the first and second programmable current paths includes fuses that can be programmed to adjust their resistance to adjust the respective selected output voltage to compensate for the current output shift in the write current generation circuit or for the phase change memory cell having the phase change property shift.

    摘要翻译: 一种写入驱动器电路,包括用于相变存储器件的多个可编程保险丝,其中即使在写入电流产生电路中的电流输出移位的情况下也正确地执行写入操作; 或者由于外部因素或由于处理变化而具有相变特性偏移的相变存储单元的情况。 写入驱动器电路包括:写入电流控制单元,用于通过选择第一或第二可选择电流路径中的一个,基于是否应用第一或第二选择脉冲信号来输出所选择的第一或第二电平电平; 以及电流驱动单元,用于产生由写入电流控制单元的输出电压控制的写入电流。 第一和第二可编程电流路径中的每一个包括熔丝,其可以被编程以调整其电阻以调整相应的选择的输出电压以补偿写入电流产生电路中的电流输出偏移或具有相变的相变存储器单元 财产转移