摘要:
A flash memory for code and data storage includes a code memory array having fast read access and suitability for execute in place, a data memory array having the characteristics of low bit cost and high density storage, and a suitable interface to provide access to both the code and data. The code memory array may be a NOR array or a performance-enhanced NAND array. The memory may be implemented in a single chip package or multi-chip package solution.
摘要:
The present invention provides a semiconductor device that includes: a memory cell array that includes non-volatile memory cells; a first selecting circuit that connects or disconnects a source and a drain of a transistor that forms one of the memory cells, to or from a data line DATAB connected to a first power supply; and a second selecting circuit that connects or disconnects the source and drain to or from a ground line ARVSS connected to a second power supply. In this semiconductor device, the first selecting circuit and the second selecting circuit are arranged on the opposite sides of the memory cell array. The present invention also provides a method of controlling the semiconductor device.
摘要:
The present invention provides a semiconductor memory and a control method therefor, the semiconductor device including a first current-voltage conversion circuit (16) connected to a core cell (12) provided in a nonvolatile memory cell array (10), a second current-voltage conversion circuit (26) connected to a reference cell (22) through a reference cell data line (24), a sense amplifier (18) sensing an output from the first current-voltage conversion circuit and an output from the second current-voltage conversion circuit, a compare circuit (28) comparing a voltage level at the reference cell data line with a predefined voltage level, and a charging circuit (30) charging the reference cell data line, if the voltage level at the reference cell data line is lower than the predefined voltage level during pre-charging the reference cell data line. According to the present invention, the pre-charging period of the reference cell data line can be shortened, and the data read time can be shortened.
摘要:
A non-volatile semiconductor memory device, comprising: a non-volatile memory array, storing multi-values by setting a plurality of different threshold voltages for each memory cell, and a control circuit, controlling a write-in operation to the memory cell array. When data have been written into the memory cell, the control circuit selects an adjacent word line, uses an erasing level to perform write-in which is weaker than the data write-in, and verifies soft programming of the amount of one page, such that a narrow-banded erasing level distribution is realized in an adjacent memory cell.
摘要:
Structures, methods, and systems for multiple programming of spare memory region for nonvolatile memory are disclosed. In one embodiment, a nonvolatile memory system comprises a main memory cell array, a spare memory cell array, and a memory controller that divides the spare memory cell array into at least a first region and a second region. The system further comprises a selection module for selecting the main memory cell array and the first region to write data and the first reference cell to write first reference data associated with the data during an initial data writing operation and for selecting the second region to write additional data and the second reference cell to write second reference data associated with the additional data during an additional data writing operation.
摘要:
A semiconductor device includes a semiconductor substrate, word lines, global bit lines, and inversion gates that form inversion layers serving as local bit lines in the semiconductor substrate. The inversion layers are electrically connected to the global bit lines and a memory cell uses the inversion layers as a source and a drain.
摘要:
The precharge circuit is provided for precharging, before programming the data, the voltage of the source line ARVSS commonly connected to the memory cells provided in the same sector. The voltage of the source line ARVSS of the memory cell MC is precharged before programming the data, and the voltage of the source line ARVSS of the memory cell MC is not lowered at the time of programming the data, even if the data programming period is shortened. It is thus possible to prevent the leak current during the programming and program the data into the memory cell MC optimally.
摘要:
A non-volatile memory device includes a plurality of MOS transistors 34 and 36 connected to respective word lines 16 and 18 to allow individual pages of memory stored in the memory cells 8a, 10a and 8b, 10b on the respective word lines 16 and 18 to be erased and erase verified. A method of erasing a page of memory cells includes the steps of applying an erase voltage to one of the MOS transistors 16 and 18 to erase the page of memory cells along the respective word line, and applying an initial erase-inhibit floating voltage to other MOS transistors which are connected to the word lines unselected for page erase. In an erase verify mode, an erase verify voltage is applied to the word line which was selected for page erase in the erase mode, and an erase verify unselect voltage is applied to the word lines which was not selected for page erase.
摘要:
The shift register includes a front stage latch portion for inputting input data when a clock signal is at a first level and latching the input data when the clock signal is at a second level, a rear stage latch portion for inputting data from the front stage latch portion when the clock signal is at the second level and latching the input data when the clock signal is at the first level, an input switch for connecting a data input terminal to the front stage latch portion when a mode switching signal is at a first level, and a feedback switch for connecting the rear stage latch portion to the front stage latch portion when the mode switching signal is at a second level. A latch mode clock signal is provided as the aforementioned clock signal when the mode switching signal is at the first level, and a counter mode clock signal or front stage shift register latch output signal is provided as the aforementioned clock signal when the mode switching signal is at the second level. The shift register functions in latch mode when the mode switching signal is at the first level, and functions with a plurality of stages thereof as a counter when at the second level. A flash memory equipped with the above shift registers which have a function whereby command flags of decoded external command signals are latched, and a counter function whereby counting is performed with the plural shift register stages.
摘要:
When a key is inserted into a key hole of a lock, magnetism creating means creates a magnetic flux corresponding to a predetermined magnetic code set in the key. Magnetism detecting means detects the magnetic flux and outputs a signal representing the detected magnetic flux. Decision means compares the signal value with a predetermined value, and outputs an agreement signal when the two values are the same. Driving means enables at least unlocking by key operation in response to the agreement signal. The magnetism detecting means outputs, as the above signal, a voltage corresponding to the magnitude of the detected magnetic flux or pulses having a frequency corresponding to same. At least one of material, dimensions, and thickness of the magnetic element determines the predetermined magnetic code. Further, an unlocking mechanism has a magnetic actuator which unlocks the lock by coupling the lock with unlocking means via a cam in response to the agreement signal.