摘要:
A MRAM toggle type memory cell is read by first providing a first signal representative of the initial state to a sense amplifier (1300, 1500). A resistance of the cell is temporarily changed by altering a magnetic polarization of the free layer of the cell. A second signal responsive to altering the resistance of the MRAM cell is provided to the sense amplifier (1300, 1500). The first signal is compared to the second signal to determine the state of the MRAM cell.
摘要:
A magnetoresistive random access memory is operated in a toggle fashion so that its logic state is flipped from its current state to the alternate state when written. This provides for a more consistent and reliable programming because the magnetic transitional energy states during the toggle operation are stable. In a write situation, however, this does mean that the state of the cell must be read and compared to the desired state of the cell before the cell is flipped. If the cell is already in the desired logic state, then it should not be written. This read time penalty before writing is reduced by beginning the write process while reading and then aborting the write step if the cell is already in the desired state. The write can actually begin on the cell and be aborted without adversely effecting the state of the cell.
摘要:
A magnetic memory (400) is programmed by selectively conducting current in opposite directions in both word and bit lines to reduce electromigration effects in word lines and bit lines. Various criteria, such as a data value being programmed and a previous current direction are used to determine the direction of the write currents used in the word and bit lines during programming.
摘要:
A magnetoresistive random access memory (MRAM) (900) that is susceptible to a residual magnetic field is compensated during a write operation. A first magnetic field (208) is applied to a memory cell during a first time period, the first magnetic field having a first direction (y) and a first magnitude. A second magnetic field (212) is applied to the memory cell during a second time period and having a second direction (x) and a second magnitude. A third magnetic field (702) is applied to the memory cell during a third time period, wherein the third time period overlaps at least a portion of the second time period, the third magnetic field having a third direction (−y) which is approximately opposite to the first direction of the first magnetic field. Currents are selectively applied through conductors in the memory cell to apply the three magnetic fields.
摘要:
A memory provides a sensing scheme that maintains impedance balance between the route that the data takes to the sense amplifier and the route the reference or references take to the sense amplifier. Each sub-array of the memory has an adjacent column decoder that couples data to a data line that is also adjacent to the sub-array and may be considered part of the column decoder. The data for the selected sub-array is routed to the sense amplifier via its adjacent data line. The reference that is part of the selected sub-array is coupled to the data line of a non-selected sub-array. Thus the reference, which in the case of a MRAM type memory is preferably in close proximity to the location of the selected data, traverses a route to the sense amplifier that is impedance balanced with respect to the route taken by the data.
摘要:
A magnetoresistive random access memory (MRAM) has separate read and write paths. Switchable current mirrors, each having multiple series-connected stages, receive a common reference current. A timing circuit provides control signals to word and bit decoders and to the switchable current mirrors to selectively complete current paths through a predetermined write word line and a predetermined write bit line. Bit lines are connected together at a common end, and word lines are connected together at a common end. By precharging a common rail having multiple write bit lines connected together, the write noise immunity is improved and current spikes are minimized. Groups of bit lines may be connected via a metal option to adjust a transition time of a programming current.
摘要:
A circuit and method for counteracting stray magnetic fields generated by write currents in an MRAM memory reuses the write current in adjoining write columns via a current redistribution bus at a first end of the write lines. A first switch connected to a second end of each write line controls the write current in the write line. If the first switch is not conductive, a second switch connects the second end of the write line to a reference voltage terminal. For write lines located at sub-array edges, a predetermined amount of spacing may be used to avoid magnetic field disturbance in an adjacent sub-array. The number of spaces required can be minimized by specific activation of write line switches.
摘要:
A write driver uses a reference current that is reflected to a driver circuit by a voltage. The driver circuit is sized in relation to the device that provides the voltage so that the current through the driver is a predetermined multiple of the reference current. This voltage is coupled to the driver circuit through a switch. The switch is controlled so that the driver circuit only receives the voltage when the write line is to have write current through it as determined by a decoder responsive to an address. The driver is affirmatively disabled when the write line is intended to not have current passing through it. As an enhancement to overcome ground bounce due to high currents, the input to the driver can be capacitively coupled to the ground terminal that experiences such bounce. Additional enhancements provide benefits in amplitude and edge rate control.
摘要:
A magnetoresistive random access memory (MRAM) has separate read and write paths. Switchable current mirrors, each having multiple series-connected stages, receive a common reference current. A timing circuit provides control signals to word and bit decoders and to the switchable current mirrors to selectively complete current paths through a predetermined write word line and a predetermined write bit line. Bit lines are connected together at a common end, and word lines are connected together at a common end. By precharging a common rail having multiple write bit lines connected together, the write noise immunity is improved and current spikes are minimized. Groups of bit lines may be connected via a metal option to adjust a transition time of a programming current.
摘要:
A memory (10, 60) having at least two resistance states is tested. In one form, the memory includes a first transistor (16, 68) having a current electrode coupled to a memory cell (14, 64) and a second transistor (26, 66) having a current electrode coupled to a reference memory cell (28, 74). The control electrode of the first transistor receives either a first reference voltage or a second reference voltage based on a test control signal, and the control electrode of a second transistor receives the first reference voltage. In a test mode, after the memory cell is programmed with a resistance state, the second reference voltage (different from the first reference voltage) is provided to the first transistor. The memory cell is then read to determine whether the memory can sense the previously programmed resistance state. In one embodiment, this test mode can be used to identify weak bits in the memory.