摘要:
An electronic device characterized by a GaAs substrate and a base disposed n the substrate, the base comprising InAs channel layer, AlSb layer above the channel layer, In.sub.x Al.sub.1-x As.sub.y Sb.sub.1-y layer containing at least In, Al, and As disposed above the AlSb channel layer, InAs cap layer disposed above and in contact with the In.sub.x Al.sub.1-x As.sub.y Sb.sub.1-y layer disposed below the InAs channel layer and in contact with the substrate, p.sup.+ GaSb layer disposed within the AlSb layer, Schottky gate with a pad disposed on and in contact with the In.sub.x Al.sub.1-x As.sub.y Sb.sub.1-y layer, at least one ohmic contact disposed on the InAs cap layer, and a trench extending through the base to the substrate isolating the gate bonding pad from the device and providing a gate air bridge which prevents contact between the gate and the InAs layer. The gate air bridge fabrication is accomplished by a liquid etchant containing more than half, on volume basis, of concentrated lactic acid or acetic acid with remainder hydrogen peroxide and concentrated hydrofluoric acid. The etchant attacks InAs, In.sub.x Al.sub.1-x As.sub.y Sb.sub.1-y, AlSb, and GaSb but does not attack GaAs and Au-based alloys.
摘要翻译:一种电子器件,其特征在于具有GaAs衬底和设置在衬底上的基极,所述基底包括InAs沟道层,在沟道层上方的AlSb层,InxAl1-xAsySb1-y层至少包含位于AlSb沟道上方的In,Al和As 层InAs覆盖层设置在InAs1沟道层下方并与衬底接触的In x Al 1-x As y Sb 1-y层上方并与之接触,设置在AlSb层内的p + GaSb层,具有布置在并且接触的焊盘的肖特基栅极 与InxAl1-xAsySb1-y层,设置在InAs覆盖层上的至少一个欧姆接触,以及延伸穿过基底到衬底的沟槽,将栅极焊盘与器件隔离,并提供栅极空气桥, 门和InAs层。 门空气桥的制造是通过液体蚀刻剂来实现的,该液体蚀刻剂含有一半以上的体积基础上的浓缩乳酸或乙酸,剩余的是过氧化氢和浓缩的氢氟酸。 蚀刻剂攻击InAs,InxAl1-xAsySb1-y,AlSb和GaSb,但不会侵蚀GaAs和Au基合金。
摘要:
A semiconductor device including a heterostructure having at least one low-resistivity p-type GaSb quantum well is provided. The heterostructure includes a layer of In0.52Al0.48As on an InP substrate, where the In0.52Al0.48As is lattice matched to InP, followed by an AlAsxSb1-x buffer layer on the In0.52Al0.48As layer, an AlAsxSb1-x spacer layer on the AlAsxSb1-x buffer layer, a GaSb quantum well layer on the AlAsxSb1-x spacer layer, an AlAsxSb1-x barrier layer on the GaSb quantum well layer, an In0.2Al0.8Sb etch-stop layer on the AlAsxSb1-x barrier layer, and an InAs cap. The semiconductor device is suitable for use in low-power electronic devices such as field-effect transistors.
摘要翻译:提供包括具有至少一个低电阻率p型GaSb量子阱的异质结构的半导体器件。 异质结构包括InP衬底上的In0.52Al0.48As层,其中In0.52Al0.48As与InP晶格匹配,随后是In0.52Al0.48As层上的AlAsxSb1-x缓冲层,AlAsxSb1-x AlAsxSb1-x缓冲层上的间隔层,AlAsxSb1-x间隔层上的GaSb量子阱层,GaSb量子阱层上的AlAs x Sb 1-x势垒层,AlAs x Sb 1-x间隔层上的In 0.2 Al 0.8 Sb蚀刻停止层, x阻挡层和InAs帽。 半导体器件适用于诸如场效应晶体管的低功率电子器件。
摘要:
A semiconductor device including a heterostructure having at least one low-resistivity p-type GaSb quantum well is provided. The heterostructure includes a layer of In0.52Al0.48As on an InP substrate, where the In0.52Al0.48As is lattice matched to InP, followed by an AlAsxSb1-x buffer layer on the In0.52Al0.48As layer, an AlAsxSb1-x spacer layer on the AlAsxSb1-x buffer layer, a GaSb quantum well layer on the AlAsxSb1-x spacer layer, an AlAsxSb1-x barrier layer on the GaSb quantum well layer, an In0.2Al0.8Sb etch-stop layer on the AlAsxSb1-x barrier layer, and an InAs cap. The semiconductor device is suitable for use in low-power electronic devices such as field-effect transistors.
摘要翻译:提供包括具有至少一个低电阻率p型GaSb量子阱的异质结构的半导体器件。 异质结构包括InP衬底上的In0.52Al0.48As层,其中In0.52Al0.48As与InP晶格匹配,随后是In0.52Al0.48As层上的AlAsxSb1-x缓冲层,AlAsxSb1-x AlAsxSb1-x缓冲层上的间隔层,AlAsxSb1-x间隔层上的GaSb量子阱层,GaSb量子阱层上的AlAs x Sb 1-x势垒层,AlAs x Sb 1-x间隔层上的In 0.2 Al 0.8 Sb蚀刻停止层, x阻挡层和InAs帽。 半导体器件适用于诸如场效应晶体管的低功率电子器件。
摘要:
This invention pertains to heterojunction bipolar transistors containing a semiconductor substrate, a buffer layer of an antimony-based material deposited on the substrate, a sub-collector layer of an antimony-based material deposited on the buffer layer, a collector layer of an antimony-based material deposited on the sub-collector layer, a base layer of an antimony-based material deposited on the collector layer, an emitter layer of an antimony-based material deposited on the base layer, and a cap layer of an antimony-based material deposited on the emitter layer.
摘要:
An improved signaling protocol for use in a multiprocessor system enables concurrent access to a common system bus during an I/O bus access. This reduces the system bus idling time without introducing complexities into the system bus architecture which might otherwise reduce the overall bus bandwidth increase. The improved bus architecture uses a system generated I/O bus busy (IOBUS.sub.-- BSY-) signal to indicate to all of the processors that the I/O bus is in use and that all other I/O requests must be held until the current transaction is completed. By preventing the other processors from executing an I/O request, the system bus does not have to be remain idle and can be used for memory-to-processor and for processor-to-processor transactions while the I/O bus is in use. By reducing the amount of time that the system bus is idle, the overall system bus performance is greatly increased.
摘要:
The invention comprises a pyrolytic process for the deposition of high quality silicon dioxide at temperatures of 100.degree.-330.degree. C. Deposition is achieved by reacting silane and oxygen in the 2-12 torr pressure range, yielding deposition rates of 140 .ANG./min at 300.degree. C. and 50 .ANG./min at 120.degree. C. Measurements of refractive index (1.45-1.46), field strength (3-10.times.10.sup.6 V/cm), and resistivity (10.sup.13 -10.sup.15 -cm) indicate that the oxides are near stoichiometric SiO.sub.2. This technology appears promising the Group IV and Group III-V device applications.
摘要翻译:本发明包括用于在100-330℃的温度下沉积高质量二氧化硅的热解方法。通过在2-12乇的压力范围内使硅烷和氧气反应来实现沉积,产生140安培/分钟的沉积速率 300℃,120℃时为50安培/分钟。折射率(1.45-1.46),场强(3-10×10 6 V / cm)和电阻率(1013-1015cm)的测量表明氧化物接近 化学计量的SiO2。 该技术显示出有希望的是第IV组和第III-V组设备应用。
摘要:
Systems and methods may provide for detecting a pending write operation directed to a target memory region and determining whether the target memory region satisfies a degradation condition in response to the pending write operation. Additionally, the target memory region may be automatically reconfigured as a cold storage region if the target memory region satisfies the degradation condition. In one example, determining whether the target memory region satisfies the degradation condition includes updating the number of write operations directed to the target memory region based on the pending write operation and comparing the number of write operations to an offset value, wherein the degradation condition is satisfied if the number of write operations exceeds the offset value.
摘要:
A system for facilitating debugging of software running within an information processing unit includes an external trigger state machine which selectively overrides the cacheability attribute of a cache line. An in-circuit emulator (ICE), which is used for debugging purposes, monitors addresses read by and written to a CPU. If an address which is of interest for debugging purposes is detected by the ICE, then the ICE issues a trigger signal. The trigger signal causes the external trigger state machine to designate the cache line associated with the detected address as a non-cacheable operation (i.e., to override the cacheability attribute) . Thus, the data associated with the cache line is written out to the main memory module where the data can be observed by an ICE, rather than to an internal cache memory location where the data would be invisible to an ICE. In a preferred embodiment of the invention, the external trigger state machine is configured to operate in a pipelining environment wherein multiple requests may be outstanding at one time.
摘要:
An improved bus architecture system for use in a multi-processor computer system has a shared address bus and a shared data bus, and has at least two separate memory modules. The system reduces the bus latency time by allowing sequential address requests to different memory modules to begin before previous cycles are terminated. Preferably, the physical memory is mapped onto several separate memory modules which will increase the probability that concurrent address requests from different processors on the common bus are for different memory modules. The processor address determines which memory module contains the data for a new request. If the memory module addressed by the new request differs from the memory module addressed by the current request, the bus controller may issue an early address request for the new data. While the early address request for the new request is being processed, the current bus cycle for the data located in the first memory module is completed on the shared data bus. Thus, the bus latency in a tightly-coupled multi-processor system can be significantly reduced using the improved bus architecture.
摘要:
A multiprocessor information processing system has a system bus with interleaved memory modules in communication with multiple CPUs. The multiprocessor system includes a subsystem monitoring circuit which monitors the addresses requested by the local CPU. If the local CPU addresses a memory module which is different from the last accessed memory module, then the subsystem monitoring circuit initiates a request to maintain control of the system bus. In this manner, sequential write and read operations are typically made to interleaved memory modules so that the effects of module recovery time are minimized. The subsystem monitoring circuit includes a transfer count register which indicates how many data transfer cycles can be run in succession before the local CPU has to relinquish control of the system bus. In this manner, fair arbitration is assured for other CPUs contending for control of the system bus.