公开(公告)号：US20200298440A1

公开(公告)日：2020-09-24

申请号：US16820323

申请日：2020-03-16

Applicant: Jun Aoto ,  Muneaki Iwata ,  Kazumi Suzuki ,  Hiroyuki Suhara ,  Akihiro Kaneko ,  Takashige Omatsu ,  Ryosuke Nakamura

Inventor： Jun Aoto ,  Muneaki Iwata ,  Kazumi Suzuki ,  Hiroyuki Suhara ,  Akihiro Kaneko ,  Takashige Omatsu ,  Ryosuke Nakamura

IPC: B28B1/00 ,  B29C64/268 ,  G02B5/00 ,  B41J2/14

Abstract: Provided is a method for forming a flying body using optical vortex laser, the method including irradiating an opposite surface of a base to a surface of the base, on which a light-absorbing material is disposed, with an optical vortex laser beam to generate a liquid column or liquid droplet having a diameter smaller than an irradiation diameter of the optical vortex laser beam from the light-absorbing material in an irradiation direction of the optical vortex laser beam.

公开(公告)号：US09513573B2

公开(公告)日：2016-12-06

申请号：US14833510

申请日：2015-08-24

Applicant: Hiroto Tachibana ,  Hiroyuki Suhara

Inventor： Hiroto Tachibana ,  Hiroyuki Suhara

IPC: G03G15/00 ,  G03G15/043

CPC classification number: G03G15/043 ,  G03G2215/0431 ,  G03G2215/0482

Abstract: An image forming method includes exposing a surface of an image bearer with light according to an image pattern including an image portion and a non-image portion, the image portion constituted of a plurality of pixels, to form an electrostatic latent image correspondent to the image pattern, comparing the image pattern adjacent to each of the pixels with a comparison pattern constituted of a plurality of pixels to specify at least a group of pixels existing at a boundary with respect to the non-image portion as a group of non-exposure pixels among the pixels constituting the image portion, and executing determination of specifying at least a group of pixels adjacent to the group of non-exposure pixels as a group of high power exposure pixels exposed with light of a higher light power than a predetermined light power required for exposing the image portion among the pixels constituting the image portion.

Abstract translation: 图像形成方法包括：根据包括图像部分和非图像部分的图像图像，由多个像素构成的图像部分，用光曝光图像载体的表面，以形成与图像相对应的静电潜像 将与每个像素相邻的图像图案与由多个像素构成的比较图案进行比较，以将至少一组相对于非图像部分的边界存在的像素指定为非曝光像素组 在构成图像部分的像素中，并且执行确定至少一组与非曝光像素组相邻的像素组，作为以比所需的预定光功率更高的光功率曝光的高功率曝光像素的组 用于在构成图像部分的像素中曝光图像部分。

公开(公告)号：US08847158B2

公开(公告)日：2014-09-30

申请号：US13224873

申请日：2011-09-02

Applicant: Hiroyuki Suhara ,  Hiroaki Tanaka ,  Hidekazu Murata ,  Hiroshi Shimoyama

Inventor： Hiroyuki Suhara ,  Hiroaki Tanaka ,  Hidekazu Murata ,  Hiroshi Shimoyama

IPC: H01J37/00 ,  G03G15/00

CPC classification number: G03G15/5037

Abstract: A surface charge measuring distribution method includes the steps of irradiating a sample with a charged particle beam and charging a sample surface in a spot-like manner, irradiating the charged sample with the charged particle beam to measure a potential at a potential saddle point formed above the sample, selecting one of preset multiple structure models and a tentative space charge distribution associated with the selected structure model, calculating a space potential at the potential saddle point by electromagnetic field analysis using the selected structure model and tentative space charge distribution, comparing the calculated space potential and measured value to determine the tentative space charge distribution as a space charge distribution of the sample when an error between the space potential and the measured value is within a predetermined range, and calculating a surface charge distribution of the sample by electromagnetic field analysis based on the determined space charge distribution.

Abstract translation: 表面电荷测量分配方法包括以下步骤：用带电粒子束照射样品并以点样方式填充样品表面，用带电粒子束照射带电样品以测量在上述形成的电位鞍点处的电位 采样，选择一个预设的多重结构模型和与所选择的结构模型相关联的暂定空间电荷分布，通过使用所选择的结构模型和暂定空间电荷分布的电磁场分析来计算潜在鞍点处的空间电位，比较计算出的 空间电位和测量值，当空间电位和测量值之间的误差在预定范围内时，确定作为样本的空间电荷分布的暂定空间电荷分布，并且通过电磁场分析来计算样品的表面电荷分布 基于确定的空间ch arge分布。

公开(公告)号：US08411123B2

公开(公告)日：2013-04-02

申请号：US12230013

申请日：2008-08-21

Applicant: Hiroyuki Suhara

Inventor： Hiroyuki Suhara

IPC: B41J2/47

CPC classification number: H04N1/113 ,  H04N1/1135 ,  H04N1/193 ,  H04N2201/04703 ,  H04N2201/04755

Abstract: A light scanning apparatus is provided in which a light source is controlled so that the total exposure energy density of when light beams are emitted to an image carrying member across light deflection scanning of a plurality of times becomes constant on the image carrying member, thereby high image quality, long lasting output images are obtained. Exposure energy density necessary when exposure is completed by light deflection scanning of one time is set to Ex1, the latent image electrical potential deepness of a latent image formed thereof is set to Vs1, total exposure energy density across light deflection scanning of a plurality of times is set to Ex_n, the latent image electrical potential deepness thereof is set to Vs_n, wherein Ex_n=Ex1−ΔEx and {(Vs_n/Vs1)^3−1.05}×Ex1

Abstract translation: 提供了一种光扫描装置，其中控制光源，使得在多次的光偏转扫描上将光束发射到图像承载构件的总曝光能量密度在图像承载构件上变得恒定，因此高 获得图像质量，持久的输出图像。 将通过一次的光偏转扫描完成曝光所需的曝光能量密度设定为Ex1，将其形成的潜像的潜像电位深度设定为Vs1，多次进行偏光扫描的总曝光能量密度 被设置为Ex_n，其潜像电位深度被设定为Vs_n，其中Ex_n = Ex1-＆Dgr; Ex和{（Vs_n / Vs1）^ 3-1.05}×Ex1 <＆Dgr; Ex <{（Vs_n / Vs1） ^ 3-0.95}×Ex1。

公开(公告)号：US08314627B2

公开(公告)日：2012-11-20

申请号：US11866758

申请日：2007-10-03

Applicant: Hiroyuki Suhara

Inventor： Hiroyuki Suhara

IPC: G01R31/305 ,  G01R31/308

CPC classification number: G01R29/14 ,  G03G15/75

Abstract: A latent-image measuring device that measures the state of a photoconductor. The latent-image measuring device emits a charged-particle beam to the photoconductor to detects a charged-particle signal obtained through the emission of the charged-particle beam. The latent-image measuring device then exposes the photoconductor a plurality of times to form electrostatic latent images on the photoconductor, and measures an amount of change in latent-image depth while changing a time interval between a plurality of exposures.

Abstract translation: 一种测量光电导体状态的潜像测量装置。 潜像测量装置向光电导体发射带电粒子束，以检测通过发射带电粒子束获得的带电粒子信号。 然后，潜像测量装置多次曝光光电导体，以在感光体上形成静电潜像，并且在改变多次曝光之间的时间间隔的同时测量潜像深度的变化量。

公开(公告)号：US07612570B2

公开(公告)日：2009-11-03

申请号：US11847790

申请日：2007-08-30

Applicant: Hiroyuki Suhara

Inventor： Hiroyuki Suhara

IPC: G01R31/305

CPC classification number: G01R31/305 ,  G03G15/5037 ,  G03G2215/00033 ,  G03G2215/00054 ,  H01J37/244 ,  H01J37/268 ,  H01J2237/0047 ,  H01J2237/0048 ,  H01J2237/2444 ,  H01J2237/24564 ,  H01J2237/2594

Abstract: A surface-potential distribution measuring apparatus includes an electron gun, an electron-beam optical system, an electron-emission panel, a detector, and a control system. The electron-beam optical system is located between the electron gun and a sample, and focuses a beam of electrons emitted from the electron gun to the surface of the sample. The electron-emission panel is located near the sample to be collided with at least part of the electrons via the sample, and emits secondary electrons corresponding to the number of collided electrons. The detector detects at least part of the secondary electrons. The control system obtains potential distribution on the surface of the sample based on a detection result obtained by the detector.

Abstract translation: 表面电位分布测量装置包括电子枪，电子束光学系统，电子发射面板，检测器和控制系统。 电子束光学系统位于电子枪和样品之间，并将从电子枪发射的电子束聚焦到样品的表面。 电子发射面板位于样品附近，通过样品与至少部分电子碰撞，并发射对应于碰撞电子数的二次电子。 检测器检测至少部分二次电子。 控制系统根据检测器得到的检测结果，获得样品表面的电位分布。

公开(公告)号：US07239148B2

公开(公告)日：2007-07-03

申请号：US11001048

申请日：2004-12-02

Applicant: Hiroyuki Suhara

Inventor： Hiroyuki Suhara

IPC: G01N27/60 ,  G03G15/00

CPC classification number: G03F7/70675 ,  H01J37/268 ,  H01J2237/2594

Abstract: In a surface potential distribution measurement method and device, a sample having a surface with a surface potential distribution is scanned using a charged particle beam in a two-dimensional manner. A detection signal caused by the two-dimensional scanning is obtained to measure the surface potential distribution. Charged particles, other than charged particles of the charged particle beam incident to the sample surface by the two-dimensional scanning, with which components of an incidence velocity vector of the charged particles in a direction perpendicular to the sample surface are reversed, are detected so that a detection signal indicating an intensity according to the detected charged particles is obtained in correspondence with a position on the sample surface.

Abstract translation: 在表面电位分布测量方法和装置中，使用二维方式的带电粒子束来扫描具有表面电位分布的表面的样品。 获得由二维扫描引起的检测信号，以测量表面电位分布。 通过二维扫描将带电粒子入射到样品表面的带电粒子之外的带电粒子与被检测器的垂直于样品表面的方向上的带电粒子的入射速度矢量的分量反转，被检测为 与样品表面上的位置对应地获得表示根据检测到的带电粒子的强度的检测信号。

公开(公告)号：US20060262417A1

公开(公告)日：2006-11-23

申请号：US11483665

申请日：2006-07-11

Applicant: Hiroyuki Suhara

Inventor： Hiroyuki Suhara

IPC: G02B3/00

CPC classification number: G02B3/0087 ,  B41J2/471 ,  G02B13/0005

Abstract: An optical scanning lens used in a scanning and imaging optical system in which a beam deflected by a light deflector is condensed on or in the vicinity of a surface to be scanned. The optical scanning lens is formed through plastic mold, and a distribution of the refractive indexes Δn(x) inside of the optical scanning lens has a local maximum within a range through which the beam passes through the lens.

Abstract translation: 用于扫描和成像光学系统的光学扫描透镜，其中由光偏转器偏转的光束在被扫描表面上或附近冷凝。 光学扫描透镜通过塑料模具形成，并且光学扫描透镜内部的折射率Deltan（x）的分布在光束通过透镜的范围内具有局部最大值。

公开(公告)号：US11740453B2

公开(公告)日：2023-08-29

申请号：US16887366

申请日：2020-05-29

Applicant: Hiroyuki Suhara ,  Takashi Fujita ,  Atsushi Takeuchi ,  Kohji Sakai ,  Asato Tamura ,  Shohta Kobashigawa

Inventor： Hiroyuki Suhara ,  Takashi Fujita ,  Atsushi Takeuchi ,  Kohji Sakai ,  Asato Tamura ,  Shohta Kobashigawa

IPC: G02B26/12 ,  G02F1/11 ,  G01B11/24 ,  H01S3/067

CPC classification number: G02B26/124 ,  G01B11/24 ,  G02F1/11 ,  H01S3/067

Abstract: An apparatus configured to fly a light-absorbing material, includes a unit configured to irradiate a light-absorbing material absorbing light with a laser beam corresponding to a light absorption wavelength of the light-absorbing material to fly the light-absorbing material. When a preceding beam radiation region and a following beam radiation region overlap, the following beam radiation region is irradiated with the laser beam such that a beam centroid position is outside the preceding beam radiation region.

公开(公告)号：US10814423B2

公开(公告)日：2020-10-27

申请号：US15870490

申请日：2018-01-12

Applicant: Hiroyuki Suhara

Inventor： Hiroyuki Suhara

IPC: B23K26/04 ,  H05K3/00 ,  B23K26/066 ,  B23K26/06 ,  B23K26/073

Abstract: An optical processing apparatus includes a light source, a condensing optical system, and a shaping optical system. The light source emits light. The condensing optical system condenses the light emitted from the light source onto a processing target position on a surface of an object to be processed. The shaping optical system shapes a spot shape of the condensed light, such that a ratio of a major axis diameter of the spot shape to a minor axis diameter of the spot shape, in a cross section orthogonal to an optical axis of the condensed light on the object to be processed, is a minimum at or adjacent to a focal position of the shaping optical system. A method for optically processing an object is also provided.