Abstract:
Errors in parallel binary data produced by a plurality of data track, e.g., a plurality of parallel shift registers, are corrected by a system in which the shift registers which are stuck, i.e., inalterable, are determined and counted. By single Hamming error detection means, the presence of a Hamming error and an indication of the bit position of a single Hamming error is made. Comparison means determine if the indicated Hamming error is coincident with a stuck track. Then, dependent on the parity condition of the data as well as the count of stuck tracks, apparatus is provided for complementing one or more of the stuck tracks and/or correcting the indicated Hamming error.
Abstract:
The decoding means, which is utilized to select a storage cell or word in a memory device, is divided into a main decoder and at least a first group of decoders whereby only one of the first group of the decoders is activated when the main decoder is energized. Each of the decoders of the first group may be divided into a plurality of decoders that form a second group so that only one of the decoders of the second group also needs to be activated when the decoder of the first group is energized.
Abstract:
A semiconductor storage cell for use in monolithic memories that perform storage and/or logic and storage functions. These cells each comprise a pair of semiconductor devices which are coupled together to form a bistable circuit. The bistable circuit is intermittently connected to a power supply in such a manner that the internal storage charge characteristics of the monolithic cell present a high-impedance discharge path when the power supply is in an off state. When the power supply is turned on the remaining voltage on the storage charge circuit is sufficient to insure that the monolithic memory cell attains its previous bistable state which existed prior to the power supply being turned off.