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公开(公告)号：US11276748B2
公开(公告)日：2022-03-15
申请号：US16527830
申请日：2019-07-31
Applicant: International Business Machines Corporation
Inventor： Baozhen Li , Chih-Chao Yang , Andrew Tae Kim , Barry Linder
Abstract: A switchable metal insulator metal capacitor (MIMcap) and a method for fabricating the MIMcap. In another aspect of the invention operating the MIMcap is also described. A first capacitor plate and a second capacitor plate are separated by a capacitor dielectric and disposed over a substrate. A first via is electrically connected to the first capacitor plate and comprised of phase change material (PCM). The PCM is deposited in an electrically conductive state and convertible by application of heat to an insulating state. A first heater is proximate to and electrically isolated from the PCM in the first via. When the first heater is activated it converts the PCM in the first via to the insulating state. This isolates the first capacitor plate from an integrated circuit.
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公开(公告)号：US11105856B2
公开(公告)日：2021-08-31
申请号：US16189295
申请日：2018-11-13
Applicant: International Business Machines Corporation
Inventor： Emily A. Ray , Emmanuel Yashchin , Peilin Song , Kevin G. Stawiasz , Barry Linder , Alan Weger , Keith A. Jenkins , Raphael P. Robertazzi , Franco Stellari , James Stathis
IPC: G06F11/22 , G01R31/3193 , G01R31/319
Abstract: Methods and systems of detecting chip degradation are described. A processor may execute a test on a device at a first time, where the test includes executable instructions for the device to execute a task under specific conditions relating to a performance attribute. The processor may receive performance data indicating a set of outcomes from the task executed by the device during the test. The processor may determine a first value of a parameter of the performance attribute based on the identified subset. The processor may compare the first value with a second value of the parameter of the performance attribute. The second value is based on an execution of the test on the device at a second time. The processor may determine a degradation status of the device based on the comparison of the first value with the second value.
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公开(公告)号：US20200231278A1
公开(公告)日：2020-07-23
申请号：US16250551
申请日：2019-01-17
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Rasit Onur Topaloglu , Barry Linder
Abstract: A mobile energy delivery system is provided. The mobile energy delivery system includes an unmanned aerial vehicle (UAV) configured to deliver energy, a controller configured to deploy the UAV responsive to a request and a ground-based, drivable vehicle. The ground-based drivable vehicle includes an energy storage component disposed to store energy for ground-based driving, a controller configured to determine a current energy requirement for the ground-based driving and to issue the request to the controller accordingly and a frame. The frame is configured to accommodate the energy storage component and includes a single entirely smooth uppermost surface. The energy storage component is chargeable by the UAV upon the UAV being deployed by the controller in response to the request and subsequently contacting or entering into an immediate vicinity of the single entirely smooth uppermost surface during the ground-based driving.
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Patent Agency Ranking
公开(公告)号：US10388580B2
公开(公告)日：2019-08-20
申请号：US15925989
申请日：2018-03-20
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Keith A. Jenkins , Barry Linder
Abstract: Methods and circuits for monitoring circuit degradation include measuring degradation in a set of on-chip test oscillators that vary according to a quantity that influences a first type of degradation. A second type of contribution to the measured degradation is determined by extrapolating from the measured degradation for the plurality of test oscillators. The second type of contribution is subtracted from the measured degradation at a predetermined value of the quantity to determine the first type of degradation for devices represented by the predetermined value.
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公开(公告)号：US11647681B2
公开(公告)日：2023-05-09
申请号：US17060295
申请日：2020-10-01
Applicant: International Business Machines Corporation
Inventor： Baozhen Li , Chih-Chao Yang , Andrew Tae Kim , Barry Linder
CPC classification number: H10N70/063 , H10B63/80 , H10N70/231 , H10N70/823 , H10N70/8413 , H10N70/8828
Abstract: A phase change memory (PCM) cell in an integrated circuit and a method of fabricating it involve depositing a layer of PCM material on a surface of a dielectric, and patterning the layer of PCM material into a plurality of PCM blocks. Heater material is formed on both sidewalls of each of the plurality of the PCM blocks to form a plurality of PCM cells. Each of the plurality of the PCM blocks and the heater material on both the sidewalls represents a PCM cell. An additional layer of the dielectric is deposited above and between the plurality of the PCM cells, and trenches are formed in the dielectric. Trenches are formed in contact with each side of each of the plurality of the PCM cells. Metal is deposited in each of the trenches. Current flow in the metal heats the heater material of one of the PCM cells.
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公开(公告)号：US20210020836A1
公开(公告)日：2021-01-21
申请号：US17060295
申请日：2020-10-01
Applicant: International Business Machines Corporation
Inventor： Baozhen Li , Chih-Chao Yang , Andrew Tae Kim , Barry Linder
Abstract: A phase change memory (PCM) cell in an integrated circuit and a method of fabricating it involve depositing a layer of PCM material on a surface of a dielectric, and patterning the layer of PCM material into a plurality of PCM blocks. Heater material is formed on both sidewalls of each of the plurality of the PCM blocks to form a plurality of PCM cells. Each of the plurality of the PCM blocks and the heater material on both the sidewalls represents a PCM cell. An additional layer of the dielectric is deposited above and between the plurality of the PCM cells, and trenches are formed in the dielectric. Trenches are formed in contact with each side of each of the plurality of the PCM cells. Metal is deposited in each of the trenches. Current flow in the metal heats the heater material of one of the PCM cells.
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17.发明申请公开(公告)号：US20180292879A1
公开(公告)日：2018-10-11
申请号：US15482917
申请日：2017-04-10
Applicant: International Business Machines Corporation
Inventor： Chen-Yong Cher , Pierce I Chuang , Keith A. Jenkins , Barry Linder
CPC classification number: G06F1/3206 , G06F1/3237 , G06F1/3296
Abstract: Over at least part of a lifetime of a product circuit, quiescent current to a product circuit is periodically measured. Over the part of the lifetime of the product circuit, voltage to the product circuit is periodically adjusted based on the monitored quiescent current. Methods, apparatus, and computer program product are disclosed. A calibration procedure may also be performed as part of manufacturing the product circuit, in order to provide values for the quiescent current and corresponding voltage to which the voltage should be adjusted.
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18.发明申请ON-CHIP COMBINED HOT CARRIER INJECTION AND BIAS TEMPERATURE INSTABILITY MONITOR 有权片上组合热载体注入和偏温不稳定性监测公开(公告)号：US20160377672A1
公开(公告)日：2016-12-29
申请号：US14750748
申请日：2015-06-25
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Keith A. Jenkins , Barry Linder
CPC classification number: H01L22/34 , G01R31/2642 , G01R31/2884
Abstract: Methods and circuits for monitoring circuit degradation include measuring degradation in a plurality of on-chip test oscillators that vary according to a quantity that influences hot carrier injection (HCI) degradation. The measured degradation for the plurality of test oscillators is extrapolated to determine a bias temperature instability (BTI) contribution to the measured degradation. The BTI contribution is subtracted from the measured degradation at a predetermined value of the quantity to determine the HCI degradation for devices represented by the predetermined value.
Abstract translation: 用于监测电路劣化的方法和电路包括测量根据影响热载流子注入（HCI）劣化的量而变化的多个片上测试振荡器的劣化。 外推多个测试振荡器的测量退化，以确定偏压温度不稳定性（BTI）对测量退化的贡献。 在量的预定值处从所测量的劣化中减去BTI贡献，以确定由预定值表示的器件的HCI劣化。
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