公开(公告)号：US09819353B2

公开(公告)日：2017-11-14

申请号：US15282677

申请日：2016-09-30

Applicant: Infineon Technologies AG

Inventor： Dario Vagni ,  Peter Bogner ,  Jaafar Mejri

IPC: H03M1/10 ,  H03M1/12

CPC classification number: H03M1/1071 ,  H03M1/109 ,  H03M1/1245

Abstract: A method for use in testing an analog-to-digital converter. The method includes providing a set of bins, varying a voltage, taking samples of the voltage, providing a selection flag, associating each sample with one bin of the set of bins, and observing a number of samples associated with the bins. An apparatus includes an analog-to-digital converter configured to convert a voltage at an input node to a digital representation provided at an output node. The input node is configured to be coupled to a voltage generator. A sample select unit is configured to determine if a voltage at the input node at least equals a first threshold level and does not exceed a second threshold level. The apparatus is configured, based on the determining, to selectively associate the digital representation with a bin of a set of bins.

公开(公告)号：US08970408B2

公开(公告)日：2015-03-03

申请号：US13934554

申请日：2013-07-03

Applicant: Infineon Technologies AG

Inventor： Peter Bogner ,  Jaafar Mejri

IPC: H03M1/06 ,  H03M1/10 ,  G01R31/28

CPC classification number: H03M1/1071 ,  G01R31/2884 ,  H03M1/12

Abstract: A semiconductor chip with a built-in-self-test circuit including a first analog-to-digital converter (ADC) configured to convert an analog input voltage signal received at its input into a digital output voltage signal that characterizes the first ADC; and a second ADC coupled to the input of the first ADC and configured to convert the analog input voltage signal received at its input to a digital feedback voltage signal, wherein the analog input voltage signal is generated based on the digital feedback signal.

Abstract translation: 一种具有内置自测电路的半导体芯片，包括：第一模数转换器（ADC），被配置为将其输入端接收的模拟输入电压信号转换成表征第一ADC的数字输出电压信号; 以及耦合到所述第一ADC的输入并被配置为将在其输入处接收的模拟输入电压信号转换为数字反馈电压信号的第二ADC，其中所述模拟输入电压信号是基于所述数字反馈信号产生的。

公开(公告)号：US20210134508A1

公开(公告)日：2021-05-06

申请号：US17074473

申请日：2020-10-19

Applicant: Infineon Technologies AG

Inventor： Marcus Nuebling ,  Jaafar Mejri

IPC: H01F27/00 ,  H01F27/32 ,  G01R31/62 ,  H01F38/14

Abstract: A circuit is provided that comprises a transformer having a first coil, which is arranged on a substrate, a second coil, which is arranged above the first coil on the substrate, and a dielectric between the first coil and the second coil. The circuit furthermore comprises a resonant circuit, which is couplable to the first coil and/or the second coil to form a resonant loop, wherein a measure of a characteristic frequency of the resonant loop and/or a measure of a power consumption of the resonant loop is able to be tapped off at an output of the resonant circuit.
A corresponding method is also provided.

公开(公告)号：US20210123970A1

公开(公告)日：2021-04-29

申请号：US17068711

申请日：2020-10-12

Applicant: Infineon Technologies AG

Inventor： Marcus Nuebling ,  Jaafar Mejri

IPC: G01R31/28 ,  H01L23/58 ,  H01L23/522 ,  H01F27/28

Abstract: A circuit is provided, comprising a transformer having a first coil that is arranged on a substrate and a second coil that is arranged on the substrate above the first coil, and a dielectric between the first coil and the second coil. The circuit furthermore comprises a guard ring around the transformer. The circuit furthermore comprises a diagnostic circuit (55) that is configured so as to ground the guard ring in a normal operating mode and to measure a measurement voltage or a measurement current at a measurement impedance between the guard ring and the ground potential in a diagnostic operating mode.

公开(公告)号：US10574258B1

公开(公告)日：2020-02-25

申请号：US16387050

申请日：2019-04-17

Applicant: Infineon Technologies AG

Inventor： Siegfried Albel ,  Matthias Bogus ,  Christian Heiling ,  Jaafar Mejri ,  Markus Zannoth

IPC: H03M3/00 ,  H03M7/30

Abstract: A method includes applying a current to an input pin of an integrated circuit; converting an analog signal at the input pin to a digital stream using a Sigma-Delta modulator; converting the digital stream to a first digital output signal proportional to the analog signal in a first input range between a first analog signal value and a second analog signal value, where the first input range corresponds to a pre-determined range of the analog signal smaller than a full-scale input range of the analog signal; converting the digital stream to a second output signal; comparing the second output signal to a first threshold corresponding to a third analog signal value at the input pin that is outside of the first input range; and providing an indication of an open circuit condition at the input pin when the second output signal crosses the first threshold.

公开(公告)号：US10215795B1

公开(公告)日：2019-02-26

申请号：US15953146

申请日：2018-04-13

Applicant: Infineon Technologies AG

Inventor： Markus Zannoth ,  Jaafar Mejri

IPC: H03K5/153 ,  G01R31/26 ,  H02M1/08 ,  G01R19/165 ,  H03K17/0812 ,  H03K17/08

Abstract: A method of monitoring a gate of a transistor includes monitoring a gate voltage of the transistor; measuring a first time difference between when a gate control signal is asserted and when the gate voltage of the transistor crosses a first voltage threshold based on the monitoring; measuring a second time difference between when the gate voltage of the transistor crosses the first voltage threshold and when the gate voltage of the transistor crosses a second voltage threshold based on the monitoring; and determining whether the first time difference falls within a first time window, and whether the second time difference falls within a second time window.