摘要:
A reconfigurable circuit (10) includes an integrator (30) having switches (SW1-6) for selectively coupling input capacitors (C0,1,2,3,6,7) and integrating capacitors (C4,5) to terminals of the integrator (30) for operation of a hybrid delta-sigma/SAR ADC (400) so as to create a reference voltage value (Vref) equal to the sum of a first voltage (ΔVbe) and a second voltage (Vbe). A first integration is performed to reduce the integrator output voltage swing. A residue (Vresidue) of the integrator is multiplied by 2. Then the second voltage (Vbe) is integrated in a first direction if a comparator (22) coupled to the integrator changes state or in an opposite direction if the comparator does not change state. The first voltage (ΔVbe) is integrated in a direction that causes the integrator output voltage (Vout) to equal either 2×Vresidue−Vref or 2×Vresidue+Vref.
摘要翻译:可重构电路(10)包括积分器(30),其具有用于选择性地将输入电容器(C0,1,2,3,6,7)和积分电容器(C4,5)耦合到积分器的端子的开关(SW1-6) (30),用于操作混合Δ-Σ/ SAR ADC(400),以便产生等于第一电压(DeltaVbe)和第二电压(Vbe)之和的参考电压值(Vref)。 执行第一次积分以减小积分器输出电压摆幅。 如果比较器(22)耦合到积分器,则如果比较器不改变状态,则将第二电压(Vbe)积分在第一方向上。如果比较器(22)耦合到积分器,则将积分器的残余(Vresidue)乘以2.然后, 。 第一电压(DeltaVbe)集成在使积分器输出电压(Vout)等于2xVresidue-Vref或2xVresidue + Vref的方向上。
摘要:
A digital to analog converter includes a coarse resolution resistor circuit (11) coupled between a first voltage (Vin) and an intermediate voltage (V0) to produce coarse resolution node voltages (V0, . . . V240), and also includes a fine resolution resistor circuit (20) coupled between the intermediate voltage and a second voltage (GND). One of the coarse resolution node voltages is selected in response to a group of MSB bits of a digital input (D0,1 . . . ) to produce a first output voltage (Vout2), and one of the fine resolution node voltages is selected in response to group of LSB bits of the digital input to produce a second output voltage (Vout1), the second output voltage (Vout1) and the first output voltage (Vout2) providing a differential analog output signal (Vout1−Vout2). In one embodiment, the coarse resolution and fine resolution resistor circuits are string resistor circuits, and in another embodiment they are modified R-2R networks.
摘要:
Gain errors are corrected in an ADC chip including an integrator (17), a comparator (30), and a digital filter (37) by storing a gain-adjusted LSB size based on measured gain error in a memory (44). The gain-adjusted LSB size is applied to the digital filter to cause gain-adjusted LSB size values to be added to or subtracted from accumulated content of the digital filter in accordance with a first or second state, respectively, of the comparator (30) during each cycle of the ADC. The final accumulated content after all required cycles of the ADC is a gain-corrected digital output signal (Dout(gain-corrected)).
摘要:
An instrumentation amplifier includes first (11A) and second (12A) input amplifiers having outputs (15A,B) coupled to an output amplifier (13). A first auto-zero stage (20) in the first input amplifier is auto-zeroed to a first voltage level (VREFL), a first input signal (Vin+) is amplified by a second auto-zero stage (24) in the first input amplifier, and the amplified first input signal is coupled to the output amplifier, during a first phase (A). A third auto-zero stage (44) in the second input amplifier is auto-zeroed to a second voltage level (VREFH), a second input signal (Vin−) is amplified by a fourth auto-zero stage (40) in the second input amplifier, and the amplified second input signal is coupled to the output amplifier, during a second phase (B). The second auto-zero stage is auto-zeroed to the first voltage level, the first input signal is amplified by the first auto-zero stage (20), and the amplified first input signal is coupled to the output amplifier, during a third phase (C). The fourth auto-zero stage is auto-zeroed to a the second voltage level, the second input signal is amplified by the third auto-zero stage, and the amplified second input signal is coupled to the output amplifier, during a fourth phase (D).
摘要:
Various systems and methods for temperature measurement are disclosed. For example, some embodiments of the present invention provide temperature measurement systems. Such temperature measurement systems include a variable current source and a diode connected transistor. The variable current source is capable of applying two or more distinct currents to the diode connected transistor. The currents result in a different base-emitter voltage on the diode connected transistor. The systems further include an n-factor coefficient register and an analog to digital converter. The analog to digital converter is operable to receive two of the base-emitter voltages created by applying the different currents, and to provide a digital output based at least in part on a value stored in the n-factor coefficient register and the two base-emitter voltages.
摘要:
Various systems and methods for temperature measurement are disclosed. For example, some embodiments of the present invention provide temperature measurement systems. Such temperature measurement systems include a variable current source and a diode connected transistor. The variable current source is capable of applying two or more distinct currents to the diode connected transistor. The currents result in a different base-emitter voltage on the diode connected transistor. The systems further include an n-factor coefficient register and an analog to digital converter. The analog to digital converter is operable to receive two of the base-emitter voltages created by applying the different currents, and to provide a digital output based at least in part on a value stored in the n-factor coefficient register and the two base-emitter voltages.
摘要:
Various systems and methods for pulse width modulated clocking in a temperature measurement are disclosed. For example, some embodiments of the present invention provide temperature measurement systems with a variable current source, a transistor, and a pulse width modulation circuit. The variable current source is operable to provide a first current and a second current that are applied to the transistor. A first base-emitter voltage occurs on the transistor when the first current is applied, and a second base-emitter voltage occurs on the transistor when the second current is applied. The first base emitter voltage is associated with a first sample period, and a second base-emitter voltage is associated with a second sample period. The pulse width modulation circuit provides a pulse width modulated clock including a combination of the aforementioned first period and second period.
摘要:
Various systems and methods for pulse width modulated clocking in a temperature measurement are disclosed. For example, some embodiments of the present invention provide temperature measurement systems with a variable current source, a transistor, and a pulse width modulation circuit. The variable current source is operable to provide a first current and a second current that are applied to the transistor. A first base-emitter voltage occurs on the transistor when the first current is applied, and a second base-emitter voltage occurs on the transistor when the second current is applied. The first base emitter voltage is associated with a first sample period, and a second base-emitter voltage is associated with a second sample period. The pulse width modulation circuit provides a pulse width modulated clock including a combination of the aforementioned first period and second period.
摘要:
Various systems and methods for temperature measurement are disclosed. For example, some embodiments of the present invention provide methods for temperature measurement that include exciting a provided transistor with at least four sequential input signals of different magnitudes. In response, the transistor exhibits a sequence of output signals corresponding to the four sequential input signals. The sequence of output signals is sensed using a different gain for each of the output signals included in the sequence of output signals, and the output signals included in the sequence of output signals are combined such that the combined output signals eliminates a resistance error. The combined output signals are then used to calculate a temperature of the transistor.
摘要:
The synchronous logic device with reduced pin count scan chain includes: more than two flip/flops coupled to form a shift register for receiving a scan data input signal; a combinational logic circuit for receiving device inputs, generating flip/flop inputs for the more than two flip/flops, and generating an output signal; a first multiplexer for providing a clock signal to the more than two flip/flops during a test mode; a second multiplexer for selecting between a test mode output from the shift register and the output signal from the combinational logic circuit, and for providing a scan data output signal; and wherein the scan data input signal and the scan data output signal share an input/output pin.