摘要:
An insulated gate thyristor is provided which includes: a first-conductivity-type base layer, first and second second-conductivity-type base regions formed in the base layer, a first-conductivity-type source region formed in the first base region, a first-conductivity-type emitter region formed in the second base region, and a gate electrode layer formed on a gate insulating film over the first base region, first-conductivity-type base layer, and second base region, which are interposed between the first-conductivity-type source region and the first-conductivity-type emitter region. The thyristor further includes a first main electrode that contacts with both the first base region and the first-conductivity-type source region, a second-conductivity-type emitter layer formed on the other surface of the first-conductivity-type base layer, a second main electrode that contacts with the second-conductivity-type emitter layer, a gate electrode connected to the gate electrode layer; and an insulating film covering entire surface areas of the second second-conductivity-type base region and the first-conductivity-type emitter region. In this insulated gate thyristor, an exposed surface portion of the first second-conductivity-type base region that is interposed between the first-conductivity-type base layer and the first-conductivity-type source region has a smaller width than an exposed surface portion of the second second-conductivity-type base region interposed between the first-conductivity-type base layer and the first-conductivity-type emitter region.
摘要:
A method that converts multimegabit-rate data into asynchronous transfer mode ATM cells and vice versa which are utilized in a switching system. The method includes determining whether the data is effective or ineffective in accordance with a portion of the data. Converting the data into the ATM cells when the data is determined to be effective. Disregarding the data when the data is determined to be ineffective. The method can be realized by an ATM interface converting unit connected with the switching system and a service interface unit. The service interface unit includes at least one of a switched multimegabit data services interface unit, a frame relay interface unit or a digital signal interface unit.
摘要:
Disclosed is a typewriter wherein a ribbon holder mounted on a carriage movable along a platen holds both a print ribbon and a correction ribbon thereon and is displaceable between its first lift position for facing the print ribbon to a print point on the platen and its second lift position for facing the correction ribbon to said print point.The disclosed typewriter is provided with lift means for displacing the ribbon holder between its first and second lift position, detecting means for detecting the lift position of the ribbon holder, and control means for controlling the lift means to displace the ribbon holder in response to the result of detection of the detecting means, thereby the possibility of errorneous initial printing is eliminated, which may occur when a power supply is once turned off during a correcting action with a correction ribbon and then is turned on again to perform a normal print operation.
摘要:
Disclosed is a typewriter wherein a ribbon holder mounted on a carriage movable along a platen holds both a print ribbon and a correction ribbon thereon and is displaceable between its first lift position for facing the print ribbon to a print point on the platen and its second lift position for facing the correction ribbon to said print point.The disclosed typewriter is provided with lift means for displacing the ribbon holder between its first and second lift position, detecting means for detecting the lift position of the ribbon holder, and control means for controlling the lift means to displace the ribbon holder in response to the result of detection of the detecting means, thereby the possibility of errorneous initial printing is eliminated, which may occur when a power supply is once turned off during a correcting action with a correction ribbon and then is turned on again to perform a normal print operation.
摘要:
A silicon carbide vertical field effect transistor includes a first-conductive-type silicon carbide substrate; a low-concentration first-conductive-type silicon carbide layer formed on a surface of the first-conductive-type silicon carbide substrate; second-conductive-type regions selectively formed on a surface of the first-conductive-type silicon carbide layer; first-conductive-type source regions formed in the second-conductive-type regions; a high-concentration second-conductive-type region formed between the first-conductive-type source regions in the second-conductive-type region; a source electrode electrically connected to the high-concentration second-conductive-type region and a first-conductive-type source region; a gate insulating film formed from the first-conductive-type source regions formed in adjacent second-conductive-type regions, onto the second-conductive-type regions and the first-conductive-type silicon carbide layer; a gate electrode formed on the gate insulating film; and a drain electrode on the back side of the first-conductive-type silicon carbide substrate, wherein an avalanche generating unit is disposed between the second-conductive-type region and the first-conductive-type silicon carbide layer.
摘要:
It is an object of the invention to provide a stage for scanning probe microscopy that can be used in any kind of SPM and can effectively irradiate light to a sample and a solution near the sample without irradiated light blocked by a cantilever. The stage for scanning probe microscopy of the invention is a stage for scanning probe microscopy for fixing a sample substrate that mounts a sample to be observed thereon and has optical transparency and includes an opening that is provided below a portion where the sample substrate is fixed and that has an opening area included within the sample substrate in plan view. Light is radiated from a bottom surface of the sample substrate onto the sample through the opening.
摘要:
A semiconductor device in includes a transistor and a surge absorption element such as Zener diode, that are formed on the same substrate and connected in parallel. The surge absorption element has a resistance during breakdown operation that is smaller than the resistance of the surge absorption element during breakdown operation of the transistor. In addition, the secondary breakdown current of the surge absorption element is larger than the secondary breakdown current of the transistor. Upon application of a high ESD voltage and high surge voltage, the energy of the ESD and surge is absorbed by operation of the surge absorption element and is limited to a voltage equal to or less than the breakdown voltage of the transistor, which would otherwise be destroyed.
摘要:
A semiconductor device is provided which includes a first p base region and a second p base region formed in one of opposite surface of a high-resistance n base region, a p collector region formed on the other surface of the n base region, an n emitter region formed in a surface layer of the first p base region, and a groove formed in the n base region between the first and second p base regions, to provide a trench gate electrode portion. The first and second p base regions are formed alternately in the Z-axis direction with certain spacing therebetween. The second p base region is held in a floating state in terms of the potential, thus assuring a reduced ON-resistance, and a large quantity of carriers present in the vicinity of the surface of the second p base region are quickly drawn away through a p channel upon turn-off, so that the turn-off time is reduced.
摘要:
An insulated gate thyristor includes a first-conductivity-type base layer having a high resistivity, first and second second-conductivity-type base regions formed in a surface layer of the first-conductivity-type base layer, a first-conductivity-type source region formed in a surface layer of the first second-conductivity-type base region, and a first-conductivity-type emitter region formed in a surface layer of the second second-conductivity-type base region. The thyristor further includes a gate electrode layer formed on an insulating film over the first second-conductivity-type base region, an exposed portion of the first-conductivity-type base layer and the second second-conductivity-type base region, a first main electrode that contacts both the first second-conductivity-type base layer and first-conductivity-type source region, a second-conductivity-type emitter layer formed on the first-conductivity-type base layer, a second main electrode that contacts the second-conductivity-type emitter layer, a gate electrode that contacts the gate electrode layer, and an insulating film covering entire areas of surfaces of the second second-conductivity-type base region and first-conductivity-type emitter region. In this insulated gate thyristor, the first-conductivity-type base layer includes a locally narrowed portion which is interposed between the first and second second-conductivity-type base regions.
摘要:
By connecting a protection diode (71) wherein p-anode layers (21) and n-cathode layers (22) are alternately formed in a polysilicon layer, and p-n junctions (74) that are in a reverse blocking state when there is a forward bias are alternately short circuited with a metal film (53), to a power semiconductor element (IGBT (72)), it is possible to achieve a balance between a high breakdown capability and a smaller chip area, a rise of breakdown voltage is suppressed even when a clamping voltage is repeatedly applied, and furthermore, it is possible to prevent destruction caused by a negative surge voltage input into a gate terminal (G).