摘要:
A method of detecting a focus position of a projection optical system at a high throughput and with high accuracy. A sensor pattern (SP) which is provided on a wafer stage (WS) as a light-receiving part of a photoelectric sensor (PES) is moved in the direction of an optical axis (AX) of a projection optical system (PL), and at the same time, it is moved in a direction (X) perpendicular to the optical axis (AX). While doing so, a reticle pattern (RP) which is provided on a reticle (R) is illuminated by illuminating light (IL) for exposure, and an image of the reticle pattern (RP) is formed on the sensor pattern (SP) through the projection optical system (PL). Light passing through the sensor pattern (SP) is received by the photoelectric sensor (PES), and a focus position is detected on the basis of the intensity of the transmitted light.
摘要:
Coil electrodes having a U-shape and shield electrodes having a plane shape are formed on plural dielectric layers. The coil electrodes are connected via through holes which are formed through the dielectric layers, and a spiral electrode is formed. An earth terminal and an input/output terminal are drawn out from the coil electrode to the end portion of the dielectric layer. The shield electrodes are formed on both of the coil electrodes. The dielectric layers are laminated, and the shield electrode and the earth terminal are connected by an external electrode. An external electrode connected to the input/output terminal is formed. A band-pass filter is made by forming plural spiral electrodes and magnetically coupling the spiral electrodes.
摘要:
Two coil electrode patterns are formed on one surface of a plate containing a dielectric material. These coil electrode patterns are formed in a loop shape, and disposed in a magnetically connected state with each other. Input/output terminal patterns and earth terminal patterns are drawn out from the coil electrode patterns toward edges on different sides of the plate. The input/output terminal pattern and the earth terminal pattern of one coil electrode pattern are disposed at a selected distance from each other so as to provide a predetermined impedance. An earth electrode pattern is formed opposite the coil electrode patterns with the plate between them. Earth terminal patterns are connected to the earth electrode pattern. The earth terminal patterns of the earth electrode pattern are connected to the earth terminal patterns of the coil electrode patterns. A trimming electrode may be formed for adjusting the passing band frequency of the band-pass filter optionally.
摘要:
Ultrashort optical pulses of a high peak output are generated by gain-switching of a semiconductor laser possessing a current non-injection region with short current pulses. By coupling this semiconductor laser to a wavelength conversion element, a second harmonic wave is generated, and ultrashort optical pulses of a short wavelength and a high peak output are generated.
摘要:
In a multilayer bandpass filter, a first capacitor is defined between a first capacitor electrode and a ground electrode. A second capacitor is defined between a second capacitor electrode and the ground electrode. A first inductor is defined by first and second via electrodes and a first inductor electrode. A second inductor is defined by third and fourth via electrodes and a second inductor electrode. Two LC parallel resonators, one of which includes the first inductor and the first capacitor and the other one of which includes the second inductor and the second capacitor, are provided. The second via electrode included in one of the LC parallel resonators and the fourth via electrode included in the other one of the LC parallel resonators are electrically connected to each other by a via coupling electrode.
摘要:
A laminated balance filter includes a first capacitor electrode and a ground electrode that are disposed opposite to each other to define a capacitor at an unbalanced side. An unbalanced side coil is provided in a dielectric layer. Three balanced side coils are provided in three dielectric layers. The three balanced side coils preferably have a substantially helical shape and are wound in the same winding directions. The coil located in the center of the three balanced side coils is disposed near the unbalanced side coil so as to be electromagnetic-field-coupled to the unbalanced side coil.
摘要:
Pattern transfer can be performed with improved exposure accuracy, by reducing the contamination caused by the attachment of a photosensitive agent or the like on an optical member of a projection optical member or the like. The pattern transfer onto a substrate W is performed after cleaning the objective member OB disposed at a given position by a cleaning device 8 at the time when pattern transfer is not performed, or while making flow a gas in a space between the substrate W and the optical member OB by a contamination protection device 98. Alternatively, the optical member OB disposed at a given position is inspected for contamination by a contamination inspection device 84 at the time when pattern transfer is not performed, and the pattern transfer or the cleaning or replacement of the optical member is performed based on the result.
摘要:
An apparatus is provided with an illumination optical system for irradiating illumination light from a light source onto a predetermined illumination area on a mask and a projection optical system for projecting a pattern formed on the mask onto a photosensitive substrate. The apparatus synchronously moves the mask and the substrate in predetermined scanning directions perpendicular to an optical axis of the projection optical system thereby to effect scanning exposure of a projected image of the pattern on the substrate. The apparatus comprises a device for inputting information on a distortion of a pattern having been already formed on the substrate, in a direction perpendicular to the scanning directions, and a device for controlling imaging characteristics of the projection optical system, based on the information thus input.
摘要:
A projection exposure apparatus has an illumination optical system for illuminating a mask, on which a predetermined pattern is formed, with light from a light source, a projection optical system for forming an image of the pattern of the mask on a photosensitive substrate, a mask stage for holding the mask and moving the mask within a plane perpendicular to the optical axis of the projection optical system, a substrate stage for moving the photosensitive substrate within a plane conjugate to the plane with respect to the projection optical system, and an imaging characteristic correction system for correcting an imaging characteristic of the projection optical system. The apparatus synchronously moves the mask and the photosensitive substrate along the optical axis of the projection optical system so as to expose the entire pattern surface of the mask. The apparatus includes an incident light intensity input system for inputting the intensity of the illumination light, which is incident on the projection optical system through the mask, in accordance with the position of the mask, and an imaging characteristic calculation device for calculating a variation in imaging characteristic of the projection optical system on the basis of information from the incident light intensity input system. The imaging characteristic correction system is controlled on the basis of a result obtained by the imaging characteristic calculation device.
摘要:
A projection exposure apparatus having an illuminating system for irradiating a mask, which has a pattern, with illuminating light for exposure and a projection optical system having a plurality of optical elements arranged along an optical axis to project an image of a pattern illuminated with light onto a substrate. One of a plurality of optical plates having different optical characteristics is interposed between the pattern and the substrate depending on the pattern. An adjusting system adjusts a characteristic of the projected image based on a calculation using one of a plurality of parameters corresponding to the optical plates, the one parameter being selected in accordance with the one optical plate to compensate for a change in an optical property of the projection optical system caused by the change of the optical plate. The projection exposure apparatus may include an optical filter for making light passing through a partial area, which is centered at an optical axis of the projection optical system and light passing through an area other than the partial area different from each other in phase or transmittance, or for reducing coherence between light passing through the said two areas. The projection exposure apparatus also may include a transparent plate having an optical thickness which is approximately equal to that of the optical filter, in which one of the optical filter and the transparent plate is disposed on a pupil plate of the projection optical system or a plane in the neighborhood of the pupil plane during exposure.