摘要:
A metallic-ceramic substrate having a ceramic layer and metal layers on both sides of the ceramic layer is provided with a high-impedance layer at the surface of the ceramic layer. The high-impedance layer is located adjacent to the metal layers. Therefore, the electrical field intensity at the edges of the metal layers is limited and an even distribution of the electrical potential at the surface of the ceramic layer is achieved. For example, the high-impedance layer may include a thin CrNi-layer, a doped Si-layer, an a—C:H-layer or a Ti-implantation.
摘要:
A light-triggerable power thyristor having controllable emitter short circuits in the form of MIS transistors which are conductive in the blocking condition of the thyristor and suppressed during the ignition operation. An optically controlled npn lateral transistor is integrated on the cathode side of the thyristor in the light-irradiated emitter region, the collector of the npn lateral transistor being connected to the gates of the MIS transistors, its emitter being formed by a part of the thyristor emitter and its base consisting of a part of the p-base of the thyristor. The gates of the MIS transistors are connected to the anode of the thyristor over a charging resistor.
摘要:
A power thyristor has controllable emitter short circuits in the form of MIS transistors which are conductive in the blocking condition of the thyristor and are switched off during the trigger operation. The ignition of the thyristor, including the control of the emitter short circuits, is accomplished in a simple manner from a gate trigger current pulse. To this end, a npn lateral transistor is integrated on the cathode side of the thyristor, the collector of the lateral transistor being connected to the gates of the MIS transistors, with its base consisting of a sub-region of the p-base and its emitter consisting of an edge region of the n-emitter of the thyristor. The gates of the MIS transistors are connected to the anode of the thyristor over a charging resistor.
摘要:
The invention relates to a method for the production of a first lateral high-voltage MOS transistor and a second lateral high-voltage MOS transistor complimentary thereto on a substrate, wherein the first and second lateral high-voltage MOS transistors each have a conductivity type opposite a drift region, comprising the steps of providing a substrate of a first conductivity type comprising a first active region for the first lateral high-voltage MOS transistor and a second active region for the second lateral high-voltage MOS transistor, and the producing at least one first doping region of the first conductivity type in the first active region and, on the other hand, in the second active region, a drain extension region of the first conductivity type extending from the substrate surface to the interior of the substrate, which allows a simultaneous implantation of doping material in the first and second active regions through respective mask openings of one and the same mask.
摘要:
The power semiconductor components in prior art high-voltage smart power ICs frequently take up more than half of the total chip surface. To be able to produce the ICs more economically, the material consumption must be reduced, and hence, in particular, the surfaces of the drift zones of the power semiconductor components must be made significantly smaller. Based on the premise that the electrical breakdown field strength of silicon carbide is approximately ten times higher than that of silicon, the parts of a semiconductor component which receive voltage are integrated in silicon carbide. The drift zone can be made much smaller for the same reverse voltage. In an SiC MOS transistor with lateral current conduction, the SiC layer, which is only approximately 1-2 &mgr;m thick and is covered by an SiO2 layer, is arranged so as to be dielectrically insulated on an Si substrate. Two n+-doped SiC regions are used as source and drain contacts. The electron-conducting channel is formed on that surface of a p+-doped region of the SiC layer which is opposite the gate electrode. The SiC drift zone, which is only weakly electron-conducting, adjoins the channel in the lateral direction.
摘要:
A lateral IGBT in an SOI configuration having a top side and an underside is proposed. The lateral IGBT has a drain zone extending to the top side and is of a first conductivity type. The underside of the LIGBT forms a substrate of a second conductivity type. A lateral insulation layer is situated between the substrate and the drain zone. At least one laterally formed region of the second conductivity type is situated in the drain zone, in the vicinity of the lateral insulation layer. These laterally formed regions being spaced apart from one another lying in one plane.
摘要:
A p-n junction is connected between two terminals. The p-n junction is formed between two semiconductor regions of a semiconductor with a breakdown field strength of at least 10.sup.6 V/cm. A channel region, which adjoins the p-n junction is connected in series with a silicon component between the two terminals. The channel region is provided in a first of the two semiconductor regions. A depletion zone of the p-n junction carries the reverse voltage in the off state of the silicon component. The silicon component is preferably a
摘要:
In a bipolar power component, for example an IGBT, having an emitter structure and a drift zone of the opposite conductivity type, the emitter structure is provided with a first contact and the drift zone is provided with a second contact. The first contact and the second contact are connected to a drivable resistor circuit such that, dependent on a control signal at the resistor circuit, the current through the power component optionally flows via the first contact and/or via the second contact to a third contact of the resistor circuit.
摘要:
An emitter of a thyristor is divided into a plurality of emitter regions. An electrode is provided next to each of these regions, and a turn-off current path proceeds via this electrode from the base adjoining the emitter region over a first field effect transistor to a main terminal of the thyristor. Every emitter region is also connected to this main terminal via a second field effect transistor which is integrated into the semiconductor body of the thyristor, or is manufactured in thin-film technology.