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公开(公告)号:US20070076463A1
公开(公告)日:2007-04-05
申请号:US11239903
申请日:2005-09-30
申请人: Ali Keshavarzi , Fabrice Paillet , Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Stephen Tang , Mohsen Alavi , Vivek De
发明人: Ali Keshavarzi , Fabrice Paillet , Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Stephen Tang , Mohsen Alavi , Vivek De
IPC分类号: G11C17/00
CPC分类号: G11C17/16 , G11C17/146 , G11C17/165 , G11C29/027
摘要: According to embodiments of the present invention, a one-time programmable (OTP) cell includes an access transistor coupled to an antifuse transistor. In on embodiment, access transistor has a gate oxide thickness that is greater than the gate oxide thickness of the antifuse transistor so that if the antifuse transistor is programmed, the voltage felt across the gate/drain junction of the access transistor is insufficient to cause the gate oxide of the access transistor to break down. The dual gate oxide OTP cell may be used in an array in which only one OTP cell is programmed at a time. The dual gate oxide OTP cell also may be used in an array in which several OTP cells are programmed simultaneously.
摘要翻译: 根据本发明的实施例,一次可编程(OTP)单元包括耦合到反熔丝晶体管的存取晶体管。 在实施例中,存取晶体管具有大于反熔丝晶体管的栅极氧化物厚度的栅极氧化物厚度,使得如果对反熔丝晶体管进行编程,则跨越存取晶体管的栅极/漏极结的电压不足以导致 栅极氧化层的存取晶体管分解。 双栅氧化物OTP单元可以用于其中一次只编写一个OTP单元的阵列中。 双栅氧化物OTP电池也可用于其中同时编程几个OTP电池的阵列中。
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公开(公告)号:US20060291265A1
公开(公告)日:2006-12-28
申请号:US11169106
申请日:2005-06-27
申请人: Gerhard Schrom , Fabrice Paillet , Tanay Karnik , Dinesh Somasekhar , Yibin Ye , Ali Keshavarzi , Muhammad Khellah , Vivek De
发明人: Gerhard Schrom , Fabrice Paillet , Tanay Karnik , Dinesh Somasekhar , Yibin Ye , Ali Keshavarzi , Muhammad Khellah , Vivek De
IPC分类号: G11C17/00
CPC分类号: G11C17/18
摘要: A system includes a pull-up circuit to program a memory cell. The pull-up circuit may include a level shifter to receive a control signal, a supply voltage, and one or more of a plurality of rail voltages, each of the plurality of rail voltages substantially equal to a respective integer multiple of the supply voltage, and to generate a second control signal, and a cascode stage. The cascode stage may include a plurality of transistors, a gate voltage of each of the plurality of transistors to be controlled at least in part by a respective one of the second control signal, the supply voltage, and at least one of the plurality of rail voltages, and an output node to provide a cell programming signal.
摘要翻译: 系统包括用于对存储器单元进行编程的上拉电路。 上拉电路可以包括电平移位器以接收控制信号,电源电压以及多个轨道电压中的一个或多个,多个轨道电压中的每一个基本上等于电源电压的相应整数倍, 并产生第二控制信号和共源共栅级。 共源共栅级可以包括多个晶体管,多个晶体管中的每一个的栅极电压至少部分地由第二控制信号,电源电压和多个轨道中的至少一个轨道 电压和输出节点以提供单元编程信号。
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公开(公告)号:US20060268626A1
公开(公告)日:2006-11-30
申请号:US11137905
申请日:2005-05-25
申请人: Fatih Hamzaoglu , Kevin Zhang , Nam Kim , Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Vivek De , Bo Zheng
发明人: Fatih Hamzaoglu , Kevin Zhang , Nam Kim , Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Vivek De , Bo Zheng
IPC分类号: G11C7/10
CPC分类号: G11C5/14 , G11C11/413
摘要: In some embodiments, a memory array is provided with cells that when written to or read from, can have modified supplies to enhance their read stability and/or write margin performance. Other embodiments may be disclosed and/or claimed.
摘要翻译: 在一些实施例中,存储器阵列具有当写入或读取时可以具有修改的电源以增强其读取稳定性和/或写入裕度性能的单元。 可以公开和/或要求保护其他实施例。
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公开(公告)号:US20060104128A1
公开(公告)日:2006-05-18
申请号:US11320789
申请日:2005-12-30
申请人: Dinesh Somasekhar , Muhammad Khellah , Yibin Ye , Vivek De , James Tschanz , Stephen Tang
发明人: Dinesh Somasekhar , Muhammad Khellah , Yibin Ye , Vivek De , James Tschanz , Stephen Tang
IPC分类号: G11C7/10
CPC分类号: G11C5/143 , G11C5/147 , G11C11/413
摘要: An apparatus and method are provided for limiting a drop of a supply voltage in an SRAM device to retain the state of the memory during an IDLE state. The apparatus may include a memory array, a sleep device, and a clamping circuit. The clamping circuit may be configured to activate the sleep device when a voltage drop across the memory array falls below a preset voltage and the memory array is in an IDLE state.
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15.
公开(公告)号:US07031203B2
公开(公告)日:2006-04-18
申请号:US11066395
申请日:2005-02-28
申请人: Stephen Tang , Ali Keshavarzi , Dinesh Somasekhar , Fabrice Paillet , Muhammad Khellah , Yibin Ye , Vivek De
发明人: Stephen Tang , Ali Keshavarzi , Dinesh Somasekhar , Fabrice Paillet , Muhammad Khellah , Yibin Ye , Vivek De
IPC分类号: G11C5/14
CPC分类号: H01L27/108 , G11C11/404 , G11C11/4085 , H01L29/7841
摘要: A DRAM memory cell uses a single transistor to perform the data storage and switching functions of a conventional cell. The transistor has a floating channel body which stores a potential that corresponds to one of two digital data values. The transistor further includes a gate connected to a first word line, a drain connected to a second word line, and a source connected to a bit line. By setting the word and bit lines to specific voltage states, the channel body stores a digital one potential as a result of impact ionization and a digital zero value as a result of forward bias of body-to-source junction.
摘要翻译: DRAM存储单元使用单个晶体管来执行常规单元的数据存储和切换功能。 晶体管具有浮置通道体,其存储对应于两个数字数据值之一的电位。 晶体管还包括连接到第一字线的栅极,连接到第二字线的漏极和连接到位线的源极。 通过将单词和位线设置为特定的电压状态,通道体由于碰撞电离而存储数字一个电位,并且由于体对源结的正向偏置而存储数字零值。
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公开(公告)号:US20060071646A1
公开(公告)日:2006-04-06
申请号:US10956285
申请日:2004-09-30
申请人: Fabrice Paillet , Ali Keshavarzi , Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Stephen Tang , Alavi Mohsen , Vivek De
发明人: Fabrice Paillet , Ali Keshavarzi , Muhammad Khellah , Dinesh Somasekhar , Yibin Ye , Stephen Tang , Alavi Mohsen , Vivek De
IPC分类号: H02J7/00
摘要: A method is described that induced dielectric breakdown within a capacitor's dielectric material while driving a current through the capacitor. The current is specific to data that is being written into the capacitor. The method also involves reading the data by interpreting behavior of the capacitor that is determined by the capacitor's resistance, where, the capacitor's resistance is a consequence of the inducing and the driving.
摘要翻译: 描述了一种在驱动电流通过电容器的同时在电容器的电介质材料内感应电介质击穿的方法。 电流特定于正在写入电容器的数据。 该方法还涉及通过解释由电容器电阻确定的电容器的行为来读取数据,其中电容器的电阻是诱导和驱动的结果。
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公开(公告)号:US20060067126A1
公开(公告)日:2006-03-30
申请号:US10954931
申请日:2004-09-30
申请人: Stephen Tang , Ali Keshavarzi , Dinesh Somasekhar , Fabrice Paillet , Muhammad Khellah , Yibin Ye , Shih-Lien Lu , Vivek De
发明人: Stephen Tang , Ali Keshavarzi , Dinesh Somasekhar , Fabrice Paillet , Muhammad Khellah , Yibin Ye , Shih-Lien Lu , Vivek De
CPC分类号: G11C16/12 , G11C11/4076 , G11C2216/14
摘要: A system to write to a plurality of memory cells coupled to a word line, each of the plurality of memory cells comprising a transistor having a source, a drain, a body and a gate coupled to the word line. Some embodiments provide biasing of one or more of the plurality of memory cells in saturation to inject charge carriers into the body of the one or more of the plurality of memory cells, and biasing of each of the plurality of memory cells in accumulation to tunnel charge carriers from the body of each of the plurality of memory cells to the gate of each of the plurality of memory cells.
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公开(公告)号:US20060054971A1
公开(公告)日:2006-03-16
申请号:US11268430
申请日:2005-11-07
申请人: Ali Keshavarzi , Stephen Tang , Dinesh Somasekhar , Fabrice Paillet , Muhammad Khellah , Yibin Ye , Shih-Lien Lu , Vivek De
发明人: Ali Keshavarzi , Stephen Tang , Dinesh Somasekhar , Fabrice Paillet , Muhammad Khellah , Yibin Ye , Shih-Lien Lu , Vivek De
IPC分类号: H01L29/76
CPC分类号: G11C11/404 , G11C2211/4016 , H01L27/0207 , H01L27/0214 , H01L27/105 , H01L27/1052 , H01L27/108
摘要: Some embodiments provide a memory cell comprising a body region doped with charge carriers of a first type, a source region disposed in the body region and doped with charge carriers of a second type, and a drain region disposed in the body region and doped with charge carriers of the second type. According to some embodiments, the body region, the source region, and the drain region are oriented in a first direction, the body region and the source region form a first junction, and the body region and the drain region form a second junction. Moreover, a conductivity of the first junction from the body region to the source region in a case that the first junction is unbiased is substantially less than a conductivity of the second junction from the body region to the drain region in a case that the second junction is unbiased. Some embodiments further include a transistor oriented in a second direction, wherein the second direction is not parallel to the first direction.
摘要翻译: 一些实施例提供一种存储单元,其包括掺杂有第一类型的电荷载体的体区,设置在体区中的源极区,并掺杂有第二类型的电荷载流子,以及设置在体区中的掺杂电荷 第二种载体。 根据一些实施例,身体区域,源区域和漏极区域在第一方向上定向,身体区域和源区域形成第一结,并且体区域和漏区域形成第二结。 此外,在第一结无偏置的情况下,从体区到源极区的第一结的导电率基本上小于从体区到漏区的第二结的导电率,在第二结 是不偏不倚的 一些实施例还包括在第二方向上取向的晶体管,其中第二方向不平行于第一方向。
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19.
公开(公告)号:US20050141290A1
公开(公告)日:2005-06-30
申请号:US11066395
申请日:2005-02-28
申请人: Stephen Tang , Ali Keshavarzi , Dinesh Somasekhar , Fabrice Paillet , Muhammad Khellah , Yibin Ye , Vivek De
发明人: Stephen Tang , Ali Keshavarzi , Dinesh Somasekhar , Fabrice Paillet , Muhammad Khellah , Yibin Ye , Vivek De
IPC分类号: G11C11/404 , G11C11/408 , H01L27/108 , H01L29/78 , G11C5/00
CPC分类号: H01L27/108 , G11C11/404 , G11C11/4085 , H01L29/7841
摘要: A DRAM memory cell uses a single transistor to perform the data storage and switching functions of a conventional cell. The transistor has a floating channel body which stores a potential that corresponds to one of two digital data values. The transistor further includes a gate connected to a first word line, a drain connected to a second word line, and a source connected to a bit line. By setting the word and bit lines to specific voltage states, the channel body stores a digital one potential as a result of impact ionization and a digital zero value as a result of forward bias of body-to-source junction.
摘要翻译: DRAM存储单元使用单个晶体管来执行常规单元的数据存储和切换功能。 晶体管具有浮置通道体,其存储对应于两个数字数据值之一的电位。 晶体管还包括连接到第一字线的栅极,连接到第二字线的漏极和连接到位线的源极。 通过将单词和位线设置为特定的电压状态,通道体由于碰撞电离而存储数字一个电位,并且由于体对源结的正向偏置而存储数字零值。
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公开(公告)号:US20050135162A1
公开(公告)日:2005-06-23
申请号:US10738216
申请日:2003-12-18
申请人: Dinesh Somasekhar , Muhammad Khellah , Yibin Ye , Vivek De , James Tschanz , Stephen Tang
发明人: Dinesh Somasekhar , Muhammad Khellah , Yibin Ye , Vivek De , James Tschanz , Stephen Tang
IPC分类号: G11C5/00 , G11C5/14 , G11C11/413
CPC分类号: G11C5/143 , G11C5/147 , G11C11/413
摘要: An apparatus and method are provided for limiting a drop of a supply voltage in an SRAM device to retain the state of the memory during an IDLE state. The apparatus may include a memory array, a sleep device, and a clamping circuit. The clamping circuit may be configured to activate the sleep device when a voltage drop across the memory array falls below a preset voltage and the memory array is in an IDLE state.
摘要翻译: 提供了一种用于限制SRAM装置中的电源电压下降以保持IDLE状态期间存储器的状态的装置和方法。 该装置可以包括存储器阵列,睡眠装置和钳位电路。 钳位电路可以被配置为当存储器阵列上的电压降低于预设电压并且存储器阵列处于空闲状态时激活睡眠装置。
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