Abstract:
A system and method for a memory system are provided. A memory device includes an array of non-volatile memory cells. A memory controller is connected to the array of non-volatile memory cells. The memory controller is configured to perform the steps of receiving a request to read a value of a memory flag, wherein the memory flag includes a 2-bit value stored in a first memory cell and a second memory cell of the array of non-volatile memory cells, reading a first value of the first memory cell, reading a second value of the second memory cell, and determining the value of the memory flag based on the first value and the second value. In embodiments, the memory flag may have more than 2-bits.
Abstract:
Various embodiments relate to a method for storing and reading data from a memory. Data words stored in the memory may be grouped, and word specific parity information and shared parity information is generated, and the shared parity information is distributed among the group of words. During reading of a word, if more errors are detected than can be corrected with word parity data, the shared parity data is retrieved and used to make the error corrections.
Abstract:
Various embodiments relate to a method for storing and reading data from a memory. Data words stored in the memory may be grouped, and word specific parity information and shared parity information is generated, and the shared parity information is distributed among the group of words. During reading of a word, if more errors are detected than can be corrected with word parity data, the shared parity data is retrieved and used to make the error corrections.
Abstract:
In accordance with a first aspect of the present disclosure, a non-volatile memory is provided, comprising: a plurality of storage elements; a plurality of access transistors, said access transistors being connected to one or more of said storage elements; a measurement unit, wherein said measurement unit is configured to measure a variation between electrical characteristics of said access transistors; a processing unit configured to use said variation between electric characteristics as a physical unclonable function. In accordance with a second aspect of the present disclosure, a corresponding method of manufacturing a non-volatile memory is conceived.
Abstract:
According to an aspect of the invention an integrated circuit is conceived which comprises a physical unclonable function which is at least partially implemented in a passivation layer of said integrated circuit. According to a further aspect of the invention, a corresponding method for manufacturing an integrated circuit is conceived. According to a further aspect of the invention, an electronic device is conceived which comprises an integrated circuit of the kind set forth.
Abstract:
There is provided a detection arrangement for detecting an attack to internal signals in a semiconductor device. The detection arrangement comprises a first input terminal, a second input terminal, and a comparison unit. The first input terminal is adapted to receive a first signal being indicative for a signal at a first stage of a driver of the semiconductor device, the driver being capable to drive signals internally to the semiconductor device. The second input terminal is adapted to receive a second signal being indicative for a signal at a second stage of the driver of the semiconductor device. The comparison unit is adapted to compare the first signal and the second signal and to determine a time period during which the signals are equal, wherein the determined time period is indicative for a potential attack, if the determined time period is above a predefined threshold.
Abstract:
An electronic counter is provided having a sequence of memory cells and increment logic. Each memory cell of the sequence is non-volatile and supports a one state and a zero state. The one state can also be referred to as a ‘programmed state’, the zero state as an ‘erased state’. The counter is configured to represent at least part of a current counting-state of the counter as a pattern of one and zero states in the memory cells of the sequence of memory cells, and increment logic configured to advance the pattern of one and zero states to a next pattern to represent an increment of the counter.