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282 条记录 (耗时 0.058 秒)

    Optical waveguide device and multiple optical waveguide device
    11.
    发明授权
    Optical waveguide device and multiple optical waveguide device 失效
    光波导器件和多光波导器件

    公开(公告)号：US07373066B2

    公开(公告)日：2008-05-13

    申请号：US11582458

    申请日：2006-10-18

    申请人： Hiroshi Ishikawa ,  Tomoyuki Hakuta ,  Makoto Horie ,  Hitoshi Suzuki

    发明人： Hiroshi Ishikawa ,  Tomoyuki Hakuta ,  Makoto Horie ,  Hitoshi Suzuki

    IPC分类号： G02B6/10

    CPC分类号： G02B6/122

    摘要： In a multiple optical waveguide device, a transparent plate is bonded or joined on the top surface of a clad with which optical circuits and quartz glass substrates are covered, and optical reflection film is provided on the fringing area or the whole area of a joint surface of the transparent plate with the clad. Optical circuits or waveguide patterns can be recognized easily by visual inspection.

    摘要翻译： 在多重光波导装置中，透明板与覆盖光电路和石英玻璃基板的包层的顶面接合或接合，在接合面的边缘区域或整个区域设置光反射膜 的透明板与包层。 光学电路或波导图案可以通过目视检查轻松识别。

    Method and Apparatus for Automatic Pattern Analysis
    12.
    发明申请
    Method and Apparatus for Automatic Pattern Analysis 审中-公开
    自动模式分析的方法和装置

    公开(公告)号：US20080097991A1

    公开(公告)日：2008-04-24

    申请号：US11573048

    申请日：2005-08-01

    申请人： Hiroshi Ishikawa

    发明人： Hiroshi Ishikawa

    IPC分类号： G06T7/00 ,  G06K9/62

    CPC分类号： G06F16/904

    摘要： A method and apparatus is disclosed for pattern analysis by arranging given data so that highdimensional data can be more effectively analyzed. The method allows arrangements of given data so that patterns can be discovered within the data. By utilizing maps that characterizes the data and the type or the set it belongs to, the method produces many data items from relatively few input data items, thereby making it possible to apply statistical and other conventional data analysis methods. In the method, a set of maps from the data or part of the data is determined. Then, new maps are generated by combining existing maps or applying certain transformations on the maps. Next, the results of applying the maps to the data are examined for patterns. Optionally, certain strong patterns are chosen, idealized, and propagated backwards to find a data reflecting that pattern.

    摘要翻译： 公开了一种用于模式分析的方法和装置，通过布置给定数据使得可以更有效地分析高维数据。 该方法允许给定数据的布置，使得可以在数据内发现模式。 通过利用表征数据及其所属类型或集合的映射，该方法从相对较少的输入数据项产生许多数据项，从而可以应用统计学和其他常规数据分析方法。 在该方法中，确定来自数据或数据部分的一组映射。 然后，通过组合现有地图或在地图上应用某些转换来生成新地图。 接下来，检查将图应用于数据的结果。 可选地，某些强图案被选择，理想化并向后传播以找到反映该图案的数据。

    Diffraction grating and dispersion compensation circuit
    13.
    发明申请
    Diffraction grating and dispersion compensation circuit 失效
    衍射光栅和色散补偿电路

    公开(公告)号：US20080056643A1

    公开(公告)日：2008-03-06

    申请号：US11882511

    申请日：2007-08-02

    申请人： Hiroyuki Tsuda ,  Hiroshi Ishikawa ,  Hisato Uetsuka

    发明人： Hiroyuki Tsuda ,  Hiroshi Ishikawa ,  Hisato Uetsuka

    IPC分类号： G02B6/34 ,  G02B6/26

    CPC分类号： G02B6/12026 ,  G02B6/12011 ,  G02B6/12014 ,  G02B6/12021 ,  G02B6/12033 ,  G02B6/1221 ,  G02B6/29394 ,  G02B6/29395 ,  G02B6/29398

    摘要： A diffraction grating of the present invention includes a first block (101) and a second block (102). The first block (101) is made up of a plurality of input waveguides (103), a slab waveguide (104), a delay waveguide array (105) and narrow grooves (106): each of which being filled with resin. The second block (102) is made up of a plurality of input waveguides (107), a slab waveguide (108) and a plurality of output waveguides (109). Since a circuit is cut off at the ends of the arrayed waveguides, a relative phase can easily be measured. The resin has undergone a refractive-index adjustment and compensates a phase error.

    摘要翻译： 本发明的衍射光栅包括第一块（101）和第二块（102）。 第一块（101）由多个输入波导（103），平板波导（104），延迟波导阵列（105）和窄槽（106）组成，每个都填充有树脂。 第二块（102）由多个输入波导（107），平板波导（108）和多个输出波导（109）组成。 由于在阵列波导的端部处切断电路，因此可以容易地测量相对相位。 树脂经历了折射率调整并补偿相位误差。

    Waveguide type optical branching device
    15.
    发明申请
    Waveguide type optical branching device 失效

    公开(公告)号：US20070086704A1

    公开(公告)日：2007-04-19

    申请号：US11580832

    申请日：2006-10-16

    申请人： Hiroshi Ishikawa ,  Tomoyuki Hakuta

    发明人： Hiroshi Ishikawa ,  Tomoyuki Hakuta

    IPC分类号： G02B6/26

    CPC分类号： G02B6/125 ,  G02B6/2804

    摘要： A waveguide type optical branching device having: two input ports; two output ports; optical waveguides extending from the input ports and the output ports respectively; and a coupling portion formed allowing the optical waveguides from the input ports and the output ports to gradually approach each other in a direction toward the output ports. The device is operable such that, in a direction from the input ports to an output end of the coupling portion, when light is inputted to one input port of the two input ports, an even more is predominantly excited, and when light is inputted to the other input port of the two input ports, an odd mode is predominantly excited. The optical waveguides in the coupling portion have a core width that is larger at a middle position in a height direction thereof than at an upper surface of the core.

    Stress detection method for force sensor device with multiple axis sensor and force sensor device employing this method
    20.
    发明申请
    Stress detection method for force sensor device with multiple axis sensor and force sensor device employing this method 失效
    采用这种方法的多轴传感器和力传感器装置的力传感器装置的应力检测方法

    公开(公告)号：US20050229720A1

    公开(公告)日：2005-10-20

    申请号：US11073944

    申请日：2005-03-08

    申请人： Toshio Hanazawa ,  Masaaki Ono ,  Tsutomu Miyashita ,  Hiroshi Tokunaga ,  Hiroshi Ishikawa

    发明人： Toshio Hanazawa ,  Masaaki Ono ,  Tsutomu Miyashita ,  Hiroshi Tokunaga ,  Hiroshi Ishikawa

    IPC分类号： G01L5/16 ,  G01P15/12 ,  G01P15/125

    CPC分类号： G01P15/123 ,  G01P15/18 ,  G01P21/00 ,  G01P2015/084

    摘要： The present invention provides the stress detection method for force sensor device with multiple axis sensor device and force sensor device employing this method, whose installation angle is arbitrary. The stress detection method includes, first and second force sensors whose detection axes are orthogonal to each other. When the detection axis of first force sensor forms angle θ with direction of detected stress Ax, and the stress component of direction perpendicular to direction of the detected stress Ax is Az, output Apx of the axis direction of first force sensor is found as Apx=αx (Ax×cos θ+Az×sin θ), and output Apz of the axis direction of the second force sensor is found as Apz=αz (Ax×sin θ+Az×cos θ), and, when αx and αz are detection sensitivity coefficients of first and second force sensors respectively, the detection sensitivity coefficient αz of second force sensor is set as αz=αx tan θ, and the detected stress Ax is found as Ax=(Apx−Apz)/αx(cos θ−tan θ×sin θ).

    摘要翻译： 本发明提供了具有多轴传感器装置的力传感器装置和采用该方法的力传感器装置的应力检测方法，其安装角度是任意的。 应力检测方法包括检测轴彼此正交的第一和第二力传感器。 当第一力传感器的检测轴与检测到的应力Ax的方向形成角度θ，并且垂直于检测应力的方向的方向的应力分量为Az时，第一力传感器的轴方向的输出Apx被发现为Apx = （Axxcosθ+Azxsinθ），第二力传感器的轴方向的输出Apz被找到为Apz =αz（Axxsinθ+Azxcosθ） ，并且当αx和αz分别是第一和第二力传感器的检测灵敏度系数时，第二和第二力传感器的检测灵敏度系数αz 力传感器被设置为α =α×tanθθ，并且检测到的应力Ax被发现为Ax =（Apx-Apz）/α×x / SUB>（cosθ-tan角蛋白θ）。