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11.发明授权公开(公告)号：US10777380B2
公开(公告)日：2020-09-15
申请号：US16653162
申请日：2019-10-15
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , Daniel Stephen Gardiner , David P. Nackashi , William Bradford Carpenter
Abstract: A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.
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公开(公告)号：US20180372672A1
公开(公告)日：2018-12-27
申请号：US16013990
申请日：2018-06-21
Applicant: PROTOCHIPS, INC.
Inventor： Franklin Stampley Walden, II , Ian Patrick Wellenius , John Damiano, JR. , David P. Nackashi , Daniel Stephen Gardiner
IPC: G01N27/403
Abstract: An electrochemistry device for electrically measuring a sample during electron microscope imaging includes: a planar chip having a first longitudinal end along which at least three laterally spaced contact electrodes are positioned; a laterally extending working electrode in electrical communication with a first of the three contact electrodes; a counter electrode spaced from and at least partially encircling the working electrode, the counter electrode in electrical communication with a second of the three contact electrodes; and a reference electrode in electrical communication with a third of the three contact electrodes, the reference electrode positioned outside of an area defined between the working electrode and counter electrode.
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13.发明申请公开(公告)号：US20180294138A1
公开(公告)日：2018-10-11
申请号：US16004952
申请日：2018-06-11
Applicant: Protochips, Inc.
CPC classification number: H01J37/261 , B01L9/52 , B01L2200/0636 , F16J15/022 , F16J15/062 , F16J15/064 , F16J15/104 , H01J37/20 , H01J2237/2003 , H01J2237/2006 , H01J2237/2007
Abstract: A support for an electron microscope sample includes a body defining a void for receiving a first micro-electronic device, and a first gasket positioned about the first surface. The first gasket further defines an arm extending at an angle away from a horizontal extending through the first micro-electronic device. In operation, the first micro-electronic device is installed onto the first gasket and the arm engages an outer facing side of the first micro-electronic device to grip the first micro-electronic device.
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14.发明授权公开(公告)号：US10014154B2
公开(公告)日：2018-07-03
申请号：US15154157
申请日：2016-05-13
Applicant: PROTOCHIPS, INC.
CPC classification number: H01J37/20 , H01J37/26 , H01J2237/2003 , H01J2237/204
Abstract: An electron microscope sample holder that includes at least one capillary having a sufficient inner diameter to act as a catheter pathway that allows objects that can be accommodated within the at least one capillary to be replaced or swapped with other objects. The sample holder having at least one capillary allows the user to insert and remove temporary fluidic pathways, sensors or other tools without the need to dissemble the holder.
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15.发明申请公开(公告)号：US20180097307A1
公开(公告)日：2018-04-05
申请号：US15830127
申请日：2017-12-04
Applicant: Protochips, Inc.
Inventor： John Damiano, JR. , David P. Nackashi , Daniel Stephen Gardiner , Franklin Stampley Walden, II , William Bradford Carpenter
CPC classification number: H01R13/24 , H01J37/20 , H01J37/26 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/206 , H01R12/721 , H01R12/79
Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
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Patent Agency Ranking
16.发明申请METHOD FOR ENABLING MODULAR PART REPLACEMENT WITHIN AN ELECTRON MICROSCOPE SAMPLE HOLDER 有权在电子显微镜样品架中使用模块化零件更换的方法公开(公告)号：US20160336144A1
公开(公告)日：2016-11-17
申请号：US15154157
申请日：2016-05-13
Applicant: PROTOCHIPS, INC.
CPC classification number: H01J37/20 , H01J37/26 , H01J2237/2003 , H01J2237/204
Abstract: An electron microscope sample holder that includes at least one capillary having a sufficient inner diameter to act as a catheter pathway that allows objects that can be accommodated within the at least one capillary to be replaced or swapped with other objects. The sample holder having at least one capillary allows the user to insert and remove temporary fluidic pathways, sensors or other tools without the need to dissemble the holder.
Abstract translation: 一种电子显微镜样品保持器，其包括具有足够内径的至少一个毛细管，以用作导管路径，其允许容纳在所述至少一个毛细管内的物体被替换或与其他物体交换。 具有至少一个毛细管的样品保持器允许使用者插入和移除临时流体通道，传感器或其他工具，而不需要拆卸保持器。
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17.发明授权Method for optimizing fluid flow across a sample within an electron microscope sample holder 有权优化电子显微镜样品架内样品流体流动的方法公开(公告)号：US09466459B2
公开(公告)日：2016-10-11
申请号：US14729547
申请日：2015-06-03
Applicant: PROTOCHIPS, INC.
CPC classification number: H01J37/261 , B01L9/52 , B01L2200/0636 , F16J15/022 , F16J15/062 , F16J15/064 , F16J15/104 , H01J37/20 , H01J2237/2003 , H01J2237/2006 , H01J2237/2007
Abstract: A flow directing gasket for improving the flow of a gas or liquid across electron beam transparent membranes in environmental cells within a sample holder of an electron microscope, and uses of the sample holders comprising said flow directing gaskets.
Abstract translation: 用于改善气体或液体在电子显微镜的样品保持器内的环境细胞中的电子束透明膜的流动的流动引导衬垫，以及包括所述流动引导衬垫的样品保持器的用途。
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公开(公告)号：US12284445B2
公开(公告)日：2025-04-22
申请号：US18437770
申请日：2024-02-09
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs , Joshua Brian Friend , Katherine Elizabeth Marusak , Nelson L. Marthe, Jr. , Benjamin Bradshaw Larson
IPC: G01B11/16 , G06T7/215 , G06T7/33 , H01J37/20 , H04N23/695
Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
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公开(公告)号：US20250029810A1
公开(公告)日：2025-01-23
申请号：US18778444
申请日：2024-07-19
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, JR. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Joshua Friend , Katherine Marusak Stephens
IPC: H01J37/244 , H04N23/667
Abstract: Disclosed herein are methods and systems for selectively managing different temporal and/or spatial resolution images and metadata collected during a transmission electron microscope (TEM) session. The system includes a transmission electron microscope and a computer system communicatively coupled to the transmission electron microscope. The computer system includes memory, data storage, and at least one processor configured for continuously receiving, from the transmission electron microscope, data captured at a lower temporal and/or spatial resolution and selectively receiving, from the transmission electron microscope, data captured at a higher temporal and/or spatial resolution.
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公开(公告)号：US12130858B2
公开(公告)日：2024-10-29
申请号：US18244587
申请日：2023-09-11
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Joshua Friend , Katherine Elizabeth Marusak
IPC: A61B6/00 , G06F16/51 , G06F16/535 , G06F16/538 , G06F16/58 , G06T1/00 , G06T7/20 , G06T11/60
CPC classification number: G06F16/535 , G06F16/51 , G06F16/538 , G06F16/5866 , G06T1/0007 , G06T7/20 , G06T11/60 , G06T2200/24 , G06T2207/10061
Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.
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