Abstract:
A driver circuit includes detectors responsive to the operating region that a driven switch is operating in. The driver circuit is operative to drive the gate of the driven switch at a speed responsive to the output of the detectors.
Abstract:
A device includes a snapback clamp circuit configured to clamp a supply voltage in response to the supply voltage exceeding a trigger voltage level. In at least one embodiment, the snapback clamp circuit includes a clamp transistor and a programmable resistance portion that is responsive to a control signal to calibrate the trigger voltage level. Alternatively or in addition, the snapback clamp circuit may include a programmable bias device configured to calibrate the trigger voltage level by biasing a gate terminal of the clamp transistor. In another particular embodiment, a method of calibrating a snapback clamp circuit is disclosed. In another particular embodiment, a method of operating an integrated circuit is disclosed.
Abstract:
In a particular embodiment, an apparatus includes an electrostatic discharge (ESD) clamping transistor coupled to a ground terminal of a device. The apparatus further includes a switch coupled between a body terminal of the ESD clamping transistor and the around terminal.
Abstract:
A compute-in-memory bitcell is provided that includes a pair of cross-coupled inverters for storing a stored bit. The compute-in-memory bitcell includes a logic gate formed by a pair of switches for multiplying the stored bit with an input vector bit. A controller controls the pair of switches responsive to a sign bit during a computation phase of operation and controls the pair of switches responsive to a magnitude bit during an execution phase of operation.
Abstract:
A compute-in-memory array is provided that includes a set of compute-in-memory bitcells that time share a shared capacitor connected between the set of compute-in-memory bitcells and a read bit line.
Abstract:
A time-multiplexed group of MAC circuits for a machine learning application is provided in which at least one MAC circuit in the time-multiplexed group also functions as a capacitive-digital-to-analog converter (CDAC) within a successive approximation analog-to-digital converter (ADC). A comparator in the ADC is shared by the time-multiplexed group of MAC circuits.
Abstract:
A driver circuit includes detectors responsive to the operating region that a driven switch is operating in. The driver circuit is operative to drive the gate of the driven switch at a speed responsive to the output of the detectors.
Abstract:
A device includes a snapback clamp circuit configured to clamp a supply voltage in response to the supply voltage exceeding a trigger voltage level. In at least one embodiment, the snapback clamp circuit includes a clamp transistor and a programmable resistance portion that is responsive to a control signal to calibrate the trigger voltage level. Alternatively or in addition, the snapback clamp circuit may include a programmable bias device configured to calibrate the trigger voltage level by biasing a gate terminal of the clamp transistor. In another particular embodiment, a method of calibrating a snapback clamp circuit is disclosed. In another particular embodiment, a method of operating an integrated circuit is disclosed.
Abstract:
Electrostatic discharge protection for Class D power amplifiers is disclosed. In an exemplary embodiment, an apparatus includes an amplifier having an output transistor coupled to an interface pad, a snapback supply clamp coupled across first and second supplies of the amplifier and configured to provide a clamp voltage across the first and second supplies during ESD event; and a trigger circuit coupled to the output transistor, the trigger circuit configured to detect the clamp voltage and to enable the output transistor to provide a discharge path from the interface pad to the second supply when the clamp voltage is detected.
Abstract:
Various embodiments include devices and methods for a multi-bit multiplier-accumulator (MAC). Some embodiments may include an analog adder having a first adder capacitor. The first adder capacitor may add a plurality of single-bit MAC outputs by receiving the plurality of single-bit MAC outputs from a plurality of single-bit MACs, and storing the plurality of single-bit MAC outputs. In some embodiments, the analog adder may output a multi-bit MAC output based on addition of the stored plurality of single-bit MAC outputs.