METHOD AND ARRANGEMENT FOR CONTROLLED ACTUATION OF A MICROSCOPE, IN PARTICULAR OF A LASER SCANNING MICROSCOPE
    13.
    发明申请
    METHOD AND ARRANGEMENT FOR CONTROLLED ACTUATION OF A MICROSCOPE, IN PARTICULAR OF A LASER SCANNING MICROSCOPE 有权
    用于控制微波激光的方法和装置,特别是激光扫描显微镜

    公开(公告)号:US20100097694A1

    公开(公告)日:2010-04-22

    申请号:US12578202

    申请日:2009-10-13

    IPC分类号: G02B21/06

    摘要: Method for actuation control of a microscope, in particular of a Laser Scanning Microscope, in which, at least one first illumination light, preferably moving at least in one direction, as well as at least one second illumination light moving at least in one direction, illuminate a sample through a beam combiner, a detection of the light coming from the sample takes place, whereby, at least one part of the illumination light is generated through the splitting of the light from a common illuminating unit, characterized in that, by means of a common control unit, a controlled splitting into the first and the second illumination light takes place, in which the intensity of the first illuminating light, specified by the user or specified automatically, is assigned a higher priority (is prioritized) compared to the specified value for the second illumination light, and an adjustment for the second illumination light takes place until a maximum value is obtained, which is determined by the value specified for the first illumination light.

    摘要翻译: 显微镜,特别是激光扫描显微镜的致动控制方法,其中至少一个至少在一个方向上移动的第一照明光以及至少沿一个方向移动的至少一个第二照明光, 通过光束组合器照射样品,发生来自样品的光的检测,由此通过从公共照明单元分离光而产生照明光的至少一部分,其特征在于,通过装置 发生公共控制单元的受控分割,进入第一和第二照明光,其中由用户指定或自动指定的第一照明光的强度被分配为比较高的优先级(优先化) 对于第二照明光的指定值,并且进行第二照明光的调整,直到获得最大值,其由v 为第一个照明灯指定。

    Method and arrangement for the controlled actuation of a microscope, in particular of a laser scanning microscope
    14.
    发明申请
    Method and arrangement for the controlled actuation of a microscope, in particular of a laser scanning microscope 审中-公开
    用于显微镜的受控致动的方法和装置,特别是激光扫描显微镜

    公开(公告)号:US20080068709A1

    公开(公告)日:2008-03-20

    申请号:US11783290

    申请日:2007-04-06

    IPC分类号: G02B21/06

    摘要: Method for actuation control of a microscope, in particular of a Laser Scanning Microscope, in which, at least one first illumination light, preferably moving at least in one direction, as well as at least one second illumination light moving at least in one direction, illuminate a sample through a beam combination, a detection of the light coming from the sample takes place, whereby, at least one part of the illumination light is generated through the splitting of the light from a common illuminating unit, characterized in that, by means of a common control unit, a controlled splitting into the first and the second illumination light takes place, in which the intensity of the first illuminating light, specified by the user or specified automatically, is assigned a higher priority (is prioritized) compared to the specified value for the second illumination light, and an adjustment for the second illumination light takes place until a maximum value is obtained, which is determined by the value specified for the first illumination light.

    摘要翻译: 显微镜,特别是激光扫描显微镜的致动控制方法,其中至少一个至少在一个方向上移动的第一照明光以及至少沿一个方向移动的至少一个第二照明光, 通过光束组合照射样品,发生来自样品的光的检测,由此通过从公共照明单元分离光而产生照明光的至少一部分,其特征在于,通过装置 发生公共控制单元的受控分割,进入第一和第二照明光,其中由用户指定或自动指定的第一照明光的强度被分配为比较高的优先级(优先化) 对于第二照明光的指定值,并且进行第二照明光的调整,直到获得由th确定的最大值 为第一个照明灯指定的e值。

    Light scanning electron microscope and use
    15.
    发明申请
    Light scanning electron microscope and use 审中-公开
    光扫描电子显微镜和使用

    公开(公告)号:US20060012785A1

    公开(公告)日:2006-01-19

    申请号:US10967330

    申请日:2004-10-19

    IPC分类号: G01J3/44 G01N21/65

    摘要: In a confocal laser scanning microscope for Raman spectroscopy with an illuminating configuration (2), which provides an illuminating beam for illuminating a probe region (23), with a scanning configuration (3, 4), which guides the illuminating beam over the probe while scanning, and with a detector configuration (5), which via the scanning configuration (3, 4) images the illuminated probe region (23) by means of a confocal aperture (26) on to at least one detector unit (28), it is provided that the illuminating configuration (2) of the scanning configuration (3, 4) provides a line-shaped illuminating beam, that the scanning configuration (3, 4) guides the line-shaped illuminating beam over the probe f while scanning and that the confocal aperture is designed as a slotted aperture (26) or as a slot-shaped region (28, 48) of the detector unit (28) acting as a confocal aperture.

    摘要翻译: 在具有照明配置(2)的拉曼光谱的共焦激光扫描显微镜中,其提供用于照射探针区域(23)的照明光束,其具有扫描配置(3,4),其将照射光束引导到探针上,同时 扫描和检测器配置(5),其经由扫描配置(3,4)通过共焦孔(26)将照射的探测区域(23)图像到至少一个检测器单元(28)上, 提供扫描配置(3,4)的照明配置(2)提供线形照明光束,扫描配置(3,4)在扫描时将线形照明光束引导到探头f上,而在扫描结构 共焦孔被设计为开槽孔(26)或作为用作共焦孔的检测器单元(28)的槽形区域(28,48)。

    Light scanning microscope and use
    16.
    发明授权
    Light scanning microscope and use 有权
    光扫描显微镜和使用

    公开(公告)号:US07561326B2

    公开(公告)日:2009-07-14

    申请号:US10967638

    申请日:2004-10-19

    IPC分类号: G02B21/00 G02B21/06

    摘要: In a confocal laser scanning microscope with an illuminating configuration (2), which provides an illuminating beam for illuminating a specimen region (23), with a scanning configuration (3, 4), which guides the illuminating beam over the specimen while scanning, and with a detector configuration (5), which via the scanning configuration (3, 4) images the illuminated specimen region (23) by means of a confocal aperture (26) on to at least one detector unit (28), it is provided that the illuminating configuration (2) of the scanning configuration (3, 4) provides a line-shaped illuminating beam, that the scanning configuration (3, 4) guides the line-shaped illuminating beam over the specimen f while scanning and that the confocal aperture is designed as a slit aperture (26) or as a slit-shaped region (28, 48) of the detector unit (28) acting as a confocal aperture.

    摘要翻译: 在具有照射配置(2)的共焦激光扫描显微镜中,其提供用于照射样本区域(23)的照明光束,其具有扫描配置(3,4),其在扫描时将照射光束引导到样本上;以及 具有检测器配置(5),其通过扫描配置(3,4)通过共焦孔(26)将照射的样品区域(23)图像到至少一个检测器单元(28)上, 扫描配置(3,4)的照明配置(2)提供线状照明光束,扫描配置(3,4)在扫描时将线状照射光束引导到样本f上,并且共焦孔 被设计为狭缝孔(26)或作为用作共焦孔的检测器单元(28)的狭缝形区域(28,48)。

    Light scanning electron microscope and use
    17.
    发明申请
    Light scanning electron microscope and use 有权
    光扫描电子显微镜和使用

    公开(公告)号:US20060012871A1

    公开(公告)日:2006-01-19

    申请号:US10967638

    申请日:2004-10-19

    IPC分类号: G02B21/06

    摘要: In a confocal laser scanning microscope with an illuminating configuration (2), which provides an illuminating beam for illuminating a probe region (23), with a scanning configuration (3, 4), which guides the illuminating beam over the probe while scanning, and with a detector configuration (5), which via the scanning configuration (3, 4) images the illuminated probe region (23) by means of a confocal aperture (26) on to at least one detector unit (28), it is provided that the illuminating configuration (2) of the scanning configuration (3, 4) provides a line-shaped illuminating beam, that the scanning configuration (3, 4) guides the line-shaped illuminating beam over the probe f while scanning and that the confocal aperture is designed as a slotted aperture (26) or as a slot-shaped region (28, 48) of the detector unit (28) acting as a confocal aperture.

    摘要翻译: 在具有照射配置(2)的共聚焦激光扫描显微镜中,其提供用于照射探针区域(23)的照明光束,所述照射光束具有扫描配置(3,4),其在扫描时将照射光束引导到探测器上;以及 具有检测器配置(5),其通过扫描配置(3,4)通过共焦孔(26)将照射的探测区域(23)映射到至少一个检测器单元(28)上, 扫描配置(3,4)的照明配置(2)提供线形照明光束,扫描配置(3,4)在扫描时将线形照明光束引导到探头f上,并且共焦孔 被设计为作为共焦孔的检测器单元(28)的开槽孔(26)或槽形区域(28,48)。

    Arrangement for the direct inout coupling of a laser, particularly of a short-pulse laser
    18.
    发明申请
    Arrangement for the direct inout coupling of a laser, particularly of a short-pulse laser 审中-公开
    用于激光器,特别是短脉冲激光器的直接入射耦合的布置

    公开(公告)号:US20050063051A1

    公开(公告)日:2005-03-24

    申请号:US10888186

    申请日:2004-07-09

    IPC分类号: G02B21/18 G02B21/00 G02B21/06

    CPC分类号: G02B21/002 G02B21/06

    摘要: An arrangement for direct input coupling of a laser, preferably of a short-pulse laser, for nonlinear sample excitation which is located outside of the microscope housing, into the beam path of a laser scanning microscope (LSM), comprising a housing in which is integrated an adjusting laser that can be coupled into the microscope beam path by beam splitters, wherein the housing is advantageously integrated so as to be insertable in the scan module of the LSMA, and a beam splitter for the direct coupling laser has high transmission in the direction of the objective and, further, partial transmission for back-reflections of the adjusting laser coming from the specimen for adjusting the overlapping of the adjusting laser and direct coupling laser.

    摘要翻译: 用于直接输入耦合激光扫描显微镜(LSM)的激光扫描显微镜(LSM)的光束路径中的用于将位于显微镜外壳之外的非线性样品激发的短脉冲激光器的激光直接输入耦合的装置,其中, 集成了可以通过分束器耦合到显微镜光束路径中的调节激光器,其中壳体有利地集成以便可插入到LSMA的扫描模块中,并且用于直接耦合激光器的分束器在 并且进一步地,用于调整来自测试样品的调节激光器的反射反射的部分透射以调节调节激光器和直接耦合激光器的重叠。

    Beam combiner employing a wedge-shaped cross-section
    19.
    发明授权
    Beam combiner employing a wedge-shaped cross-section 有权
    梁组合器采用楔形横截面

    公开(公告)号:US07656583B2

    公开(公告)日:2010-02-02

    申请号:US11783289

    申请日:2007-04-06

    IPC分类号: G02B27/10

    CPC分类号: G02B27/144 G02B21/0064

    摘要: A beam corradiator for combining two radiation beams, preferably movable beams independent from each other in at least one direction, to scan and/or influence a sample, preferably a manipulation system and an imaging system, with a partially reflecting layer being provided for the corradiation, wherein the thickness of the layer is provided with a preferably consistent incline or decline over the optically effective cross-section of the beam corradiatior.

    摘要翻译: 一种用于组合两个辐射束,优选在至少一个方向上彼此独立的可移动光束以扫描和/或影响样品,优选地操纵系统和成像系统的光束校正器,其中提供了部分反射层用于辐照 ,其中所述层的厚度在所述光束辐射体的光学有效横截面上被提供优选地一致的倾斜或下降。

    LASER SCANNING MICROSCOPE AND ITS OPERATING METHOD
    20.
    发明申请
    LASER SCANNING MICROSCOPE AND ITS OPERATING METHOD 审中-公开
    激光扫描显微镜及其操作方法

    公开(公告)号:US20120268749A1

    公开(公告)日:2012-10-25

    申请号:US13299515

    申请日:2011-11-18

    IPC分类号: G01B11/14

    摘要: Laser scanning microscope and its operating method in which at least two first and second scanning systems activated independently of each other and that can move in at least one direction illuminate a sample with the help of a beam-combining element, and the light is detected by the sample as it comes in, The scanning fields created by the light distributions on the sample mutually overlap to create a reference pattern on the sample with one of the light distributions, which is then captured and used to create the overlap using the second light distribution and/or a reference pattern arranged in the sample plane or in an intermediate image plane is captured by both scanning fields and used to create the overlap and/or structural characteristics of the sample are captured by the two scanning fields as reference pattern and used to create the overlap in which correction values are determined.

    摘要翻译: 激光扫描显微镜及其操作方法,其中至少两个第一和第二扫描系统彼此独立地激活并且可以在至少一个方向上移动,借助于光束组合元件照射样品,并且光被检测到 样品进入,由样品上的光分布产生的扫描场相互重叠,以在样品上产生参考图案,其中一个光分布被捕获并用于使用第二光分布来创建重叠 和/或布置在采样平面或中间图像平面中的参考图案由两个扫描场捕获并用于创建样本的重叠和/或结构特征由两个扫描场作为参考图案捕获,并用于 创建确定校正值的重叠。