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公开(公告)号:US20220139897A1
公开(公告)日:2022-05-05
申请号:US17577647
申请日:2022-01-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: CHANHO KIM , JOO-YONG PARK , DAESEOK BYEON
Abstract: A three-dimensional semiconductor memory device, including a peripheral circuit structure including a first metal pad and a cell array structure disposed on the peripheral circuit structure and including a second metal pad. The peripheral circuit structure may include a first substrate including a first peripheral circuit region and a second peripheral circuit region, first contact plugs, second contact plugs, and a first passive device on and electrically connected to the second contact plugs. The cell array structure may include a second substrate disposed on the peripheral circuit structure, the second substrate including a cell array region and a contact region. The cell array structure may further include gate electrodes and cell contact plugs. The first passive device is vertically between the gate electrodes and the second contact plugs and includes a first contact line. The first metal pad and the second metal pad may be connected by bonding manner.
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12.
公开(公告)号:US20210124693A1
公开(公告)日:2021-04-29
申请号:US16865580
申请日:2020-05-04
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: TAEHYO KIM , DAESEOK BYEON , TAEHONG KWON , CHANHO KIM , TAEYUN LEE
IPC: G06F12/123 , G06F12/02 , G06F12/14 , G11C11/408 , G11C11/4094 , G11C11/4091
Abstract: A memory device includes; a memory area including a first memory area including first memory cells storing N-bit data and a second memory area including second memory cells storing M-bit data, where ‘M’ and ‘N’ are natural numbers and M is greater than N, and a controller configured to read data stored in the first memory area using a first read operation, read data stored in the second memory area using a second read operation different from the first read operation, and selectively store data in one of the first memory area and the second memory area based on a frequency of use (FOU) of the data.
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公开(公告)号:US20210074716A1
公开(公告)日:2021-03-11
申请号:US16931500
申请日:2020-07-17
Applicant: Samsung Electronics Co., Ltd.
Inventor: BONGSOON LIM , DAESEOK BYEON
IPC: H01L27/11573 , H01L27/11582 , H01L27/11565 , G11C8/14 , G11C7/18 , H01L27/1157 , H01L27/11519 , H01L27/11524 , H01L27/11539 , H01L27/11556
Abstract: Disclosed is a three-dimensional semiconductor device comprising channel regions that penetrate the stack structure and extend in a direction perpendicular to a top surface of the first substrate, a first interlayer dielectric layer on the stack structure, and a peripheral circuit structure on the first interlayer dielectric layer. The peripheral circuit structure includes peripheral circuit elements on a first surface of a second substrate. The peripheral circuit elements are electrically connected to the channel regions and at least one of the gate electrodes. The first substrate has a first crystal plane parallel to the top surface thereof. The second substrate has a second crystal plane parallel to the first surface thereof. An arrangement direction of atoms of the first crystal plane intersects an arrangement direction of atoms of the second crystal plane.
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14.
公开(公告)号:US20210365388A1
公开(公告)日:2021-11-25
申请号:US17118091
申请日:2020-12-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: YOUNGMIN JO , DAESEOK BYEON , KISUNG KIM
Abstract: A method of encrypting data in a nonvolatile memory device (NVM) includes; programming data in selected memory cells, sensing the selected memory cells at a first time during a develop period to provide random data, sensing the selected memory cells at a second time during the develop period to provide main data, encrypting the main data using the random data to generate encrypted main data, and outputting the encrypted main data to an external circuit, wherein the randomness of the random data is based on a threshold voltage distribution of the selected memory cells.
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15.
公开(公告)号:US20210132816A1
公开(公告)日:2021-05-06
申请号:US17027978
申请日:2020-09-22
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: YOUNGMIN JO , DAESEOK BYEON , TONGSUNG KIM
Abstract: A memory device comprises a smart buffer, and a memory area divided into a first memory area and a second memory area, wherein the smart buffer comprises a priority setting unit configured to receive a sensing data and a corresponding weight from a controller, determine a priority of the sensing data based on the weight, and classify the sensing data as one of first priority sensing data and second priority sensing data, and a channel controller configured to allocate at least one channel selected from among a plurality of channels to a first channel group, allocate at least another channel selected from among the plurality of channels to a second channel group, assign the first channel group to process the first priority sensing data in relation to the first memory area, and assign the second channel group to process the second priority sensing data in relation to the second memory area, wherein a number of data input/output (I/O) pins connected to the first channel group is greater than a number of data I/O pins connected to the second channel group, wherein the memory area includes at least one memory chip, wherein the at least one memory chip includes a first chip having a first metal pad and a cell region and a second chip having a second metal pad and a peripheral circuit region, and the first chip and the second chip are vertically connected to each other by the first metal pad and the second metal pad.
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公开(公告)号:US20210066171A1
公开(公告)日:2021-03-04
申请号:US16827746
申请日:2020-03-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: TAEHYO KIM , CHANHO KIM , DAESEOK BYEON
IPC: H01L23/495 , H01L23/538 , H01L23/00
Abstract: A semiconductor die includes first pads, switches that are electrically connected with the first pads, respectively, a test signal generator that generates test signals and to transmit the test signals to the switches, internal circuits that receive first signals through the first pads and the switches, to perform operations based on the first signals, and to output second signals through the switches and the first pads based on a result of the operations, and a switch controller that controls the switches so that the first pads communicate with the test signal generator during a test operation and that the first pads communicate with the internal circuits after a completion of the test operation.
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公开(公告)号:US20210065799A1
公开(公告)日:2021-03-04
申请号:US16944312
申请日:2020-07-31
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: CHANHO KIM , KYUNGHWA YUN , DAESEOK BYEON
Abstract: A non-volatile memory device includes a memory cell region including a first metal pad and a memory cell array including a plurality of memory cells, and a peripheral circuit region including a second metal pad and vertically connected to the memory cell region. The memory cell region includes a plurality of word lines, a ground selection line in a layer on the word lines, a common source line in a layer on the ground selection line, a plurality of vertical pass transistors in the stair area, and a plurality of driving signal lines in the same layer as the common source line. The word lines form a stair shape in the stair area, and each of the vertical pass transistors is connected between a corresponding one of the word lines and a corresponding one of the driving signal lines.
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18.
公开(公告)号:US20180053554A1
公开(公告)日:2018-02-22
申请号:US15681479
申请日:2017-08-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: SANG-WAN NAM , DAESEOK BYEON , CHIWEON YOON
CPC classification number: G11C16/08 , G11C16/0408 , G11C16/0483 , G11C16/107 , G11C16/26 , G11C16/28 , G11C16/3459 , G11C2216/16
Abstract: A nonvolatile memory device includes a memory cell array and a row decoder circuit. The row decoder circuit turns on memory cells of a plurality of cell strings of a selected memory block after applying a first prepulse to a first dummy word line connected to first dummy memory cells after applying a second prepulse to a second dummy word line connected to second dummy memory cells.
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公开(公告)号:US20220122673A1
公开(公告)日:2022-04-21
申请号:US17227501
申请日:2021-04-12
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: SEUNGYEON KIM , DAESEOK BYEON , PANSUK KWAK , HONGSOO JEON
IPC: G11C16/24 , H01L27/11556 , H01L27/11582 , G11C5/06 , G11C16/26
Abstract: A memory device includes; a memory cell array including a first memory block and a second memory block adjacently disposed in a first direction, driving signal lines respectively corresponding to vertically stacked word lines, and a pass transistor circuit including an odd number of pass transistor groups and connected between the driving signal lines and the memory cell array. One of the odd number of pass transistor groups includes a first pass transistor connected between a first word line of the first memory block and a first driving signal line among the driving signal lines, and a second pass transistor connected between a first word line of the second memory block and the first driving signal line adjacently disposed to the first pass transistor in a second direction.
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公开(公告)号:US20210066282A1
公开(公告)日:2021-03-04
申请号:US17002149
申请日:2020-08-25
Applicant: Samsung Electronics Co., Ltd.
Inventor: CHANHO KIM , JOO-YONG PARK , DAESEOK BYEON
Abstract: A three-dimensional semiconductor memory device, including a peripheral circuit structure including a first metal pad and a cell array structure disposed on the peripheral circuit structure and including a second metal pad. The peripheral circuit structure may include a first substrate including a first peripheral circuit region and a second peripheral circuit region, first contact plugs, second contact plugs, and a first passive device on and electrically connected to the second contact plugs. The cell array structure may include a second substrate disposed on the peripheral circuit structure, the second substrate including a cell array region and a contact region. The cell array structure may further include gate electrodes and cell contact plugs. The first passive device is vertically between the gate electrodes and the second contact plugs and includes a first contact line. The first metal pad and the second metal pad may be connected by bonding manner.
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