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公开(公告)号:US11837553B2
公开(公告)日:2023-12-05
申请号:US17405696
申请日:2021-08-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Junghoon Kang
IPC: H01L23/538 , H01L23/544 , H01L23/31 , H01L25/065 , H01L23/00
CPC classification number: H01L23/544 , H01L23/3121 , H01L23/5384 , H01L23/5386 , H01L24/16 , H01L25/0657 , H01L2224/16225 , H01L2225/06517
Abstract: A semiconductor package includes a first semiconductor chip; an encapsulant covering at least a portion of the first semiconductor chip; insulating layers provided on the encapsulant, each of the insulating layers being transparent or translucent; and wiring layers provided on the encapsulant, the wiring layers being partially covered by the insulating layers, wherein an outermost insulating layer of the insulating layers comprises a first region and a second region, a color of the first region is different from a color of the second region, the second region surrounds the first region, and at least one marking pattern comprising at least one step portion is provided in the first region of the outermost insulating layer.
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公开(公告)号:US20220165634A1
公开(公告)日:2022-05-26
申请号:US17405696
申请日:2021-08-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Junghoon Kang
IPC: H01L23/31 , H01L23/538 , H01L23/00 , H01L25/065
Abstract: A semiconductor package includes a first semiconductor chip; an encapsulant covering at least a portion of the first semiconductor chip; insulating layers provided on the encapsulant, each of the insulating layers being transparent or translucent; and wiring layers provided on the encapsulant, the wiring layers being partially covered by the insulating layers, wherein an outermost insulating layer of the insulating layers comprises a first region and a second region, a color of the first region is different from a color of the second region, the second region surrounds the first region, and at least one marking pattern comprising at least one step portion is provided in the first region of the outermost insulating layer.
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公开(公告)号:US20250149520A1
公开(公告)日:2025-05-08
申请号:US18780675
申请日:2024-07-23
Applicant: Samsung Electronics Co., Ltd.
Inventor: Junghoon Kang , Daegon Kim
IPC: H01L25/18 , G02B6/12 , H01L23/00 , H01L23/31 , H01L23/48 , H01L23/538 , H01L27/144
Abstract: A semiconductor package including a package substrate, a plurality of chiplets located on the package substrate, the plurality of chiplets including a photonics chip and a semiconductor chip located on the photonics chip, and a plurality of photonics bridge chips located on the package substrate. The plurality of chiplets are spaced apart from each other in a horizontal direction, and each of the plurality of photonics bridge chips is located between the plurality of chiplets.
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公开(公告)号:US20250149516A1
公开(公告)日:2025-05-08
申请号:US18780730
申请日:2024-07-23
Applicant: Samsung Electronics Co., Ltd.
Inventor: Junghoon Kang , Daegon Kim
IPC: H01L25/10 , H01L23/00 , H01L23/31 , H01L23/48 , H01L23/49 , H01L23/498 , H01L23/538 , H01L27/144 , H10B80/00
Abstract: A semiconductor package including a package substrate, a plurality of photonics bridge chips located on the package substrate, a molding layer located on the package substrate, surrounding the plurality of photonics bridge chips, and including a plurality of via electrodes, and a plurality of chiplets located on the molding layer and the plurality of photonics bridge chips, the chiplets each including a photonics chip and a semiconductor chip located on the photonics chip, wherein the plurality of chiplets are spaced apart from each other in a horizontal direction, and at least two chiplets adjacent to each other from among the plurality of chiplets overlap one photonics bridge chip from among the plurality of photonics bridge chips in a vertical direction.
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公开(公告)号:US12230580B2
公开(公告)日:2025-02-18
申请号:US17695478
申请日:2022-03-15
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Junghoon Kang
IPC: H01L23/538 , H01L21/48 , H01L23/00 , H01L23/31
Abstract: A method includes attaching a first anisotropic conductive film including first conductive particles to a front surface of a substrate structure; compressing a first redistribution structure on the front surface of the substrate structure such that a first redistribution conductor of the first redistribution structure that is exposed is electrically connected by the first conductive particles to a connection terminal or a vertical connection conductor that is exposed from the substrate structure, attaching a second anisotropic conductive film including second conductive particles to a rear surface of the substrate structure; and compressing a second redistribution structure on the rear surface of the substrate structure such that a second redistribution conductor of the second redistribution structure that is exposed is electrically connected by the second conductive particles to the vertical connection conductor.
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公开(公告)号:US20240319454A1
公开(公告)日:2024-09-26
申请号:US18611499
申请日:2024-03-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Junghoon Kang
IPC: G02B6/42 , H01L23/00 , H01L23/498 , H01L25/065
CPC classification number: G02B6/4219 , G02B6/4206 , H01L23/49822 , H01L24/08 , H01L24/16 , H01L25/0652 , H01L2224/08146 , H01L2224/08155 , H01L2224/16104 , H01L2224/16157 , H01L2924/0665 , H01L2924/13091 , H01L2924/182
Abstract: Provided is a semiconductor package including a printed circuit board including a cavity extending inward from an upper surface thereof, an optical waveguide extending onto the cavity along the upper surface of the printed circuit board, a first semiconductor chip positioned inside the cavity and including a photonic integrated circuit overlapping a portion of the optical waveguide in a vertical direction, an interposer on the first semiconductor chip, and a second semiconductor chip on the interposer.
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公开(公告)号:US20240055364A1
公开(公告)日:2024-02-15
申请号:US18496372
申请日:2023-10-27
Applicant: Samsung Electronics Co.,Ltd.
Inventor: Junghoon Kang
IPC: H01L23/544 , H01L23/31 , H01L23/538 , H01L25/065 , H01L23/00
CPC classification number: H01L23/544 , H01L23/3121 , H01L23/5386 , H01L23/5384 , H01L25/0657 , H01L24/16 , H01L2225/06517 , H01L2224/16225
Abstract: A semiconductor package includes a first semiconductor chip; an encapsulant covering at least a portion of the first semiconductor chip; insulating layers provided on the encapsulant, each of the insulating layers being transparent or translucent; and wiring layers provided on the encapsulant, the wiring layers being partially covered by the insulating layers, wherein an outermost insulating layer of the insulating layers comprises a first region and a second region, a color of the first region is different from a color of the second region, the second region surrounds the first region, and at least one marking pattern comprising at least one step portion is provided in the first region of the outermost insulating layer.
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公开(公告)号:US20250116810A1
公开(公告)日:2025-04-10
申请号:US18887727
申请日:2024-09-17
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Daegon Kim , Junghoon Kang
IPC: G02B6/12 , G02B6/13 , H01L23/00 , H01L23/538 , H01L25/16
Abstract: A semiconductor package includes an interposer including an interposer optical waveguide, and a plurality of chiplets coupled onto the interposer and each including a semiconductor chip and a photonics chip electrically coupled to the semiconductor chip, wherein the photonics chip includes a photonic integrated circuit configured to input or output an optical signal, and an optical waveguide optically coupled to the interposer optical waveguide.
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公开(公告)号:US11929315B2
公开(公告)日:2024-03-12
申请号:US17527414
申请日:2021-11-16
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Junghoon Kang
IPC: H01L23/498 , H01L23/31 , H01L23/00
CPC classification number: H01L23/49838 , H01L23/3128 , H01L23/49822 , H01L23/49894 , H01L24/16 , H01L2224/16227
Abstract: A semiconductor package including a redistribution substrate having lower and upper surfaces, the redistribution substrate including a pad on the lower surface, the pad having a first surface and a second surface, and a redistribution layer electrically connected to the pad; a semiconductor chip on the upper surface of the redistribution substrate and electrically connected to the redistribution layer; an encapsulant encapsulating at least a portion of the semiconductor chip; and a protective layer on the lower surface of the redistribution substrate and having an opening exposing at least a portion of the first surface of the pad, wherein the portion of the first surface exposed through the opening includes a recess surface including regular depressions and protrusions and being depressed inwardly toward the second surface, and an edge surface including irregular depressions and protrusions and having a step difference with respect to the recess surface.
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公开(公告)号:US20230326871A1
公开(公告)日:2023-10-12
申请号:US18131258
申请日:2023-04-05
Applicant: Samsung Electronics Co., Ltd.
Inventor: Junghoon Kang , Seungwan Shin , Byungmin Yu , Junghyun Lee
IPC: H01L23/544 , H01L25/10 , H01L23/498 , H01L23/31 , B23K26/364
CPC classification number: H01L23/544 , H01L25/105 , H01L23/49833 , H01L23/49838 , H01L23/49816 , H01L24/48 , B23K26/364 , H01L2225/1023 , H01L2225/1041 , H01L2225/1058 , H01L23/3135
Abstract: A semiconductor package includes an encapsulation layer encapsulating at least one semiconductor chip, and a redistribution level layer disposed on the encapsulation layer. The redistribution level layer includes a redistribution layer and a redistribution insulating layer insulating the redistribution layer, a laser mark area is disposed on the redistribution layer and the redistribution insulating layer, and the redistribution insulating layer of the laser mark area comprises a plurality of mesh-type redistribution insulating patterns arranged apart from each other on a plane and surrounded by the redistribution layer. The redistribution level layer includes a laser mark insulating layer located on the redistribution layer and the redistribution insulating layer, wherein the laser mark insulating layer includes a laser mark exposing the redistribution layer and the mesh-type redistribution insulating patterns in the laser mark area.
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