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25 条记录 (耗时 0.015 秒)

    ACCESS CONTROL SYSTEM AND METHOD THEREOF
    11.
    发明申请
    ACCESS CONTROL SYSTEM AND METHOD THEREOF 审中-公开

    公开(公告)号：US20200242865A1

    公开(公告)日：2020-07-30

    申请号：US16083966

    申请日：2017-03-21

    申请人： SOREQ NUCLEAR RESEARCH CENTER ,  SECURITY MATTERS LTD.

    发明人： Yair GROF ,  Tzemah KISLEV ,  Nadav YORAN ,  Haggai ALON

    IPC分类号： G07C9/00

    摘要： The present invention relates to an access control system, an access object and a method for access control. The access control system comprises an access request receiving device being configured and operable for receiving an access object; the access request receiving device comprising an emitter configured and operable for irradiating the access object with a radiation having a wavelength in the range of about 10″12 and 10″9 m and a detector configured and operable for detecting a response signal from the irradiated access object; a control circuit being configured and operable to receive the response signal from the access request receiving device and process the response signal to identify spectral features indicative of an XRF signature of the access object; wherein the control circuit is adapted to generate an unlocking signal for switching a module device between a locked state and an unlocked state upon identification of the XRF signature.

    AN XRF ANALYZER FOR IDENTIFYING A PLURALITY OF SOLID OBJECTS, A SORTING SYSTEM AND A SORTING METHOD THEREOF
    12.
    发明申请
    AN XRF ANALYZER FOR IDENTIFYING A PLURALITY OF SOLID OBJECTS, A SORTING SYSTEM AND A SORTING METHOD THEREOF 审中-公开

    公开(公告)号：US20190193119A1

    公开(公告)日：2019-06-27

    申请号：US16311290

    申请日：2017-06-21

    申请人： SOREQ NUCLEAR RESEARCH CENTER ,  SECURITY MATTERS LTD.

    发明人： Yair GROF ,  Tzemah KISLEV ,  Nadav YORAN ,  Haggai ALON ,  Mor KAPLINSKY

    IPC分类号： B07C5/34 ,  G01N23/223

    CPC分类号： B07C5/3412 ,  B07C5/3427 ,  G01N23/223 ,  G01N2223/643

    摘要： The present invention discloses a novel XRF analyzer capable of simultaneously identifying the presence of a marking composition in a plurality of objects by modulating/varying the intensity of the excitation beam on the different objects and measuring the secondary radiation thereof. The XRF analyzer comprises a radiation emitter assembly adapted for emitting at least one X-Ray or Gamma-Ray excitation radiation beam having a spatial intensity distribution for simultaneously irradiating the plurality of objects; a radiation detector for detecting secondary radiation X-Ray signals arriving from a plurality of objects in response to irradiation of the objects by X-Ray or Gamma-Ray radiation, and providing data indicative of spatial intensity distribution of the detected data X-Ray signals on the plurality of objects; and a signal reading processor in communication with the detector, the processor being adapted for receiving and processing the detected response X-Ray signals to verify presence of the marking composition included at least one surface of each object of the plurality objects.

    METHOD AND A SYSTEM FOR XRF MARKING AND READING XRF MARKS OF ELECTRONIC SYSTEMS
    14.
    发明申请
    METHOD AND A SYSTEM FOR XRF MARKING AND READING XRF MARKS OF ELECTRONIC SYSTEMS 审中-公开

    公开(公告)号：US20190156075A1

    公开(公告)日：2019-05-23

    申请号：US16091222

    申请日：2017-04-04

    申请人： SOREQ NUCLEAR RESEARCH CENTER ,  SECURITY MATTERS LTD.

    发明人： Yair GROF ,  Tzemah KISLEV ,  Nadav YORAN ,  Haggai ALON

    IPC分类号： G06K7/10 ,  G01N23/223

    摘要： Methods and systems for verifying compatibility of components (e.g. parts or devices) of an electronic system are disclosed. In certain embodiments the method includes: irradiating a first and second components presumably associated with the electronic system, with XRF exciting radiation, and detecting one or more XRF response signals indicative of a first and a second XRF signatures, emitted from the first and second components in response to the irradiation. Then the first and second XRF signatures are processed to determine whether they are associated with respectively a first and second XRF marking compositions on the first and second components, and the compatibility of the first and second components to the electronic system is determined/verified based on the correspondence between the first and a second XRF signatures/marking. Certain embodiments also disclose electronic systems including at least a first and a second electronic components/devices respectively having the first and second XRF marking compositions that enable verification of compatibility of the components. Certain embodiments disclose techniques for pairing the first and second components (e.g. devices) based a correspondence between the first and second XRF signatures/markings thereof. Certain embodiments disclose various calibration techniques for calibrating the XRF measurements of XRF markings applied to different substrate materials of the electronic components.

    XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSING ON PRODUCTION LINE
    15.
    发明公开
    XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSING ON PRODUCTION LINE 审中-公开

    公开(公告)号：US20240035989A1

    公开(公告)日：2024-02-01

    申请号：US18258450

    申请日：2021-12-13

    申请人： SECURITY MATTERS LTD.

    发明人： Haggai ALON ,  Tehila NAHUM ,  Nataly TAL ,  Mor KAPLINSKY ,  Chen NACHMIAS ,  Ron DAFNI ,  Nadav YORAN

    IPC分类号： G01N23/207 ,  G01N23/223

    CPC分类号： G01N23/2076 ,  G01N23/223 ,  G01N2223/0766 ,  G01N2223/623 ,  G01N2223/643

    摘要： An X-Ray-Spectroscopy (XRS) inspection station is presented for inspecting objects progressing on a production line. The XRS station comprises: at least one XRS inspection system each defining an XRS inspection region and performing one or more XRS inspection sessions on the object passing through the inspection region while progressing on the production line and generating XRS inspection data piece for said object. The XRS inspection system comprises at least one emitter, each producing X-Ray or Gamma-Ray exciting radiation to excite at least a portion of the object, and at least one detection unit that detects a response of said at least portion of the object to the exciting radiation and generates corresponding XRS inspection data pieces comprising data indicative of an XRS signature of marking(s) embedded in plastic material composition of the object, said data indicative of the XRS signature being informative of one or more conditions of plastic material composition in the object. The inspection system also includes an analyzer utility adapted to, generate, based on the XRS inspection data pieces, object status in association with identification data of the respective object. Also provided at the inspection station is a control unit which is adapted to generate, based on the object status data, sorting data in relation to said object for use at a sorting station of the production line.

    METHOD AND A SYSTEM FOR XRF MARKING AND READING XRF MARKS OF ELECTRONIC SYSTEMS
    19.
    发明申请
    METHOD AND A SYSTEM FOR XRF MARKING AND READING XRF MARKS OF ELECTRONIC SYSTEMS 审中-公开

    公开(公告)号：US20200225174A1

    公开(公告)日：2020-07-16

    申请号：US16834732

    申请日：2020-03-30

    申请人： SECURITY MATTERS LTD.

    发明人： Nataly TAL ,  Mor KAPLINSKY ,  Tehila NAHUM ,  Hagit SADE ,  Dana GASPER ,  Ron DAFNI ,  Chen NACHMIAS ,  Michal FIRSTENBERG ,  Avital TRACHTMAN ,  Haggai ALON ,  Nadav YORAN ,  Tzemah KISLEV

    IPC分类号： G01N23/223 ,  C23C16/48

    摘要： Methods and systems for verifying compatibility of components (e.g. parts or devices) of an electronic system are disclosed. In certain embodiments the method includes: irradiating a first and second components presumably associated with the electronic system, with XRF exciting radiation, and detecting one or more XRF response signals indicative of a first and a second XRF signatures, emitted from the first and second components in response to the irradiation. Then the first and second XRF signatures are processed to determine whether they are associated with respectively a first and second XRF marking compositions on the first and second components, and the compatibility of the first and second components to the electronic system is determined/verified based on the correspondence between the first and a second XRF signatures/marking. Certain embodiments also disclose electronic systems including at least a first and a second electronic components/devices respectively having the first and second XRF marking compositions that enable verification of compatibility of the components. Certain embodiments disclose techniques for pairing the first and second components (e.g. devices) based a correspondence between the first and second XRF signatures/markings thereof. Certain embodiments disclose various calibration techniques for calibrating the XRF measurements of XRF markings applied to different substrate materials of the electronic components.