APPARATUS FOR TREATING SUBSTRATE AND APPARATUS FOR MEASURING CONCENTRATION

    公开(公告)号:US20230111149A1

    公开(公告)日:2023-04-13

    申请号:US17957428

    申请日:2022-09-30

    Abstract: Provided is a concentration measuring apparatus, which measures a concentration of a fluid under a high-pressure environment, such as an environment in which a supercritical fluid is provided. The concentration measuring apparatus includes: a concentration meter for measuring a concentration of a first fluid contained in a fluid in the measurement line; a sampling line for transferring a process fluid of a processing space in which a substrate is treated in a high-pressure environment to the measurement line; a control valve for opening and closing the sampling line; a fluid pressure regulator installed downstream the control valve in the sampling line and configured to adjust the passing fluid to a set pressure; and a decompression tank installed between the sampling line and the measurement line.

    METHOD FOR TREATING A SUBSTRATE
    12.
    发明公开

    公开(公告)号:US20240152056A1

    公开(公告)日:2024-05-09

    申请号:US18502628

    申请日:2023-11-06

    CPC classification number: G03F7/423 G03F7/40

    Abstract: The inventive concept provides a substrate treating method. The substrate treating method includes supplying a liquid to a substrate; and heating the substrate after the supplying the liquid, and wherein the supplying the liquid includes: supplying a first liquid to the substrate; and supplying a second liquid which is different from the first liquid to a substrate to which the first liquid is supplied, and wherein the second liquid is supplied as a test to the substrate and a contact angle between the second liquid which is supplied and the substrate is measured to determine a degree of hydrophilization of the substrate, and a supply mechanism of the second liquid supplied to the substrate is determined based on the degree of hydrophilization of the substrate which is determined, before the supplying the second liquid is performed.

    SUBSTRATE TREATING APPARATUS AND SUBSTRATE TREATING METHOD

    公开(公告)号:US20230205091A1

    公开(公告)日:2023-06-29

    申请号:US18066380

    申请日:2022-12-15

    CPC classification number: G03F7/2041

    Abstract: Disclosed is a substrate treating apparatus including a support unit that supports and rotates a substrate, a heating unit including a laser irradiator that irradiates laser light in a pattern formed in the substrate, a movement module that changes a location of the laser irradiator by moving the heating unit, and a controller that controls the support unit and the heating unit, the movement module moves the heating unit between a heating location, at which the laser light is irradiated to the substrate, and a standby location that deviates from the substrate, and the movement module rotates and linearly moves the heating unit.

    APPARATUS AND METHOD FOR TREATING SUBSTRATE
    14.
    发明公开

    公开(公告)号:US20230205077A1

    公开(公告)日:2023-06-29

    申请号:US18146693

    申请日:2022-12-27

    CPC classification number: G03F1/72

    Abstract: The inventive concept provides a substrate treating apparatus. The substrate treating apparatus includes a housing; a support unit positioned within the housing and configured to support a substrate; a liquid supply unit configured to supply a treating liquid to the substrate supported on the support unit; and a laser module configured to irradiate a laser to the substrate to which the treating liquid is supplied; and a vision module for monitoring a point at which the laser is irradiated among the substrate.

    PRINTING APPARATUS AND PROVIDING METHOD THEREOF

    公开(公告)号:US20230115826A1

    公开(公告)日:2023-04-13

    申请号:US17961460

    申请日:2022-10-06

    Abstract: A printing apparatus and a method of providing printing apparatus are provided. A printing apparatus according to at least one embodiment of the present disclosure includes a base panel or head base, at least one or more head packs installed on the head base, a head pack holder installed on each of the head packs and configured to handle and fix the head pack, and a fastening structure configured to mount the head pack holder to the head packs.

    APPARATUS FOR TREATING SUBSTRATE AND METHOD FOR TREATING A SUBSTRATE

    公开(公告)号:US20230067973A1

    公开(公告)日:2023-03-02

    申请号:US17901941

    申请日:2022-09-02

    Abstract: The inventive concept provides a mask treating apparatus. The mask treating apparatus includes a support unit configured to support and rotate a mask, the mask having a first pattern within a plurality of cells thereof and a second pattern outside regions of the plurality of cells; and a heating unit having a laser irradiator for irradiating a laser light to a specific region of the mask supported on the support unit, and a controller configured to control the support unit and the heating unit, and wherein the support unit includes: a support part for supporting the mask; and a moving stage part configured to move a position of the support part, and wherein the controller controls the moving stage part so a position of the mask supported on the support part is changed so the second pattern is positioned at the specific region.

    APPARATUS FOR TREATING SUBSTRATE AND METHOD FOR TREATING A SUBSTRATE

    公开(公告)号:US20230185206A1

    公开(公告)日:2023-06-15

    申请号:US17901103

    申请日:2022-09-01

    CPC classification number: G03F7/70875 G03F7/70025

    Abstract: The inventive concept provides a mask treating apparatus. The mask treating apparatus includes a support unit configured to support and rotate a mask, the mask having a first pattern within a plurality of cells thereof and a second pattern outside regions of the plurality of cells; a heating unit including a laser irradiation module and a moving module, the laser irradiation module having a laser irradiator for irradiating a laser light to the second pattern, the moving module configured to change a position of the laser irradiation module; and a controller configured to control the support unit and the heating unit, and wherein when a treating position is divided into four equal parts from a first quadrant to a fourth quadrant based on a center of the mask, the laser irradiator is positioned at the fourth quadrant and the first quadrant in a direction linearly moving from a standby position to the treating position, positioned at the third quadrant in a direction which is perpendicular to the fourth quadrant, and positioned at the second quadrant in a direction which is perpendicular to the first quadrant, and wherein the controller controls a rotation of the support unit so the second pattern is positioned at the fourth quadrant.

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