-
公开(公告)号：US20180330787A1
公开(公告)日：2018-11-15
申请号：US16044280
申请日：2018-07-24
Inventor： Marco Pasotti , Marcella Carissimi , Vikas Rana
IPC: G11C13/00
CPC classification number: G11C13/0069 , G11C13/0004 , G11C13/0026 , G11C2013/0078
Abstract: A method is provided for operating a memory device that includes an array of memory cells coupled to a plurality of bitlines. A memory cell is selected from among the array of memory cells. The selected memory cell is coupled to a selected bitline. During a program operation, a program current pulse is injected into the selected memory cell via a first switch coupled to the bitline. At an end of the program current pulse, the selected bitline is discharged via a second switch coupled to the bitline.
-
公开(公告)号：US20170178727A1
公开(公告)日：2017-06-22
申请号：US15433795
申请日：2017-02-15
Inventor： Marco Pasotti , Marcella Carissimi , Vikas Rana
IPC: G11C13/00
CPC classification number: G11C13/0069 , G11C13/0004 , G11C13/0026 , G11C2013/0078
Abstract: An integrated circuit includes an array of phase-change memory (PCM) cells, and bitlines coupled to the array of PCM cells. The integrated circuit also includes a first decoder circuit having a respective plurality of transistors having a first conductivity type being coupled together and to a given bitline from among the plurality thereof and configured to inject a program current pulse into a selected PCM cell. In addition, the integrated circuit includes a second decoder circuit having a plurality of transistors having a second conductivity type being coupled together and to the given bitline and configured to discharge the given bitline at an end of the program current pulse.
-
公开(公告)号：US20230198386A1
公开(公告)日：2023-06-22
申请号：US18168936
申请日：2023-02-14
Inventor： Vikas Rana , Marco Pasotti , Fabio De Santis
IPC: H02M3/07
Abstract: A voltage supply circuit and a method for controlling a voltage supply circuit are provided. The voltage supply circuit includes a positive charge pump stage that generates a positive voltage and a negative charge pump stage that generates a negative voltage. The voltage supply circuit also includes a control stage that compares a voltage representative of the negative voltage with a reference voltage and causes a slope of the positive voltage to decrease when the voltage representative of the negative voltage exceeds the reference voltage.
-
公开(公告)号：US20230110870A1
公开(公告)日：2023-04-13
申请号：US17490976
申请日：2021-09-30
Inventor： Laura Capecchi , Marcella Carissimi , Marco Pasotti , Vikas Rana , Vivek Tyagi
Abstract: A system and method for operating a memory cell is provided. A non-volatile memory storage device includes an array of memory cells of differential or single-ended type. In an embodiment, a regulator is coupled to a sense amplifier. The regulator is configured to generate a voltage to gate terminals of one or two transistors of the sense amplifier. In the differential type, the voltage is generated such that the first bias current and the second bias current have a current value equal to the sum of a maximum current flowing in a memory cell being in a RESET state and a fixed current. In the single-ended type, the regulated voltage is generated such that the first bias current and the second bias current have a current value equal to the sum of a fixed current and the reference current generated by the reference current source across temperature.
-
公开(公告)号：US20220352817A1
公开(公告)日：2022-11-03
申请号：US17866372
申请日：2022-07-15
Inventor： Vikas Rana , Marco Pasotti , Fabio De Santis
IPC: H02M3/07
Abstract: A voltage supply circuit and a method for controlling a voltage supply circuit are provided. The voltage supply circuit includes a positive charge pump stage that generates a positive voltage and a negative charge pump stage that generates a negative voltage. The voltage supply circuit also includes a control stage that compares a voltage representative of the negative voltage with a reference voltage and causes a slope of the positive voltage to decrease when the voltage representative of the negative voltage exceeds the reference voltage.
-
Patent Agency Ranking
公开(公告)号：US20210366554A1
公开(公告)日：2021-11-25
申请号：US17306266
申请日：2021-05-03
Inventor： Fabio Enrico Carlo Disegni , Laura Capecchi , Marcella Carissimi , Vikas Rana , Cesare Torti
Abstract: An embodiment non-volatile memory device includes an array of memory cells in rows and columns; a plurality of local bitlines, the memory cells of each column being coupled to a corresponding local bitline; a plurality of main bitlines, each main bitline being coupleable to a corresponding subset of local bitlines; a plurality of program driver circuits, each having a corresponding output node and injecting a programming current in the corresponding output node, each output node coupleable to a corresponding subset of main bitlines. Each program driver circuit further includes a corresponding limiter circuit that is electrically coupled, for each main bitline of the corresponding subset, to a corresponding sense node whose voltage depends, during writing, on the voltage on the corresponding main bitline. Each limiter circuit turns off the corresponding programming current, in case the voltage on any of the corresponding sense nodes overcomes a reference voltage.
-
公开(公告)号：US10658364B2
公开(公告)日：2020-05-19
申请号：US15908575
申请日：2018-02-28
Inventor： Fabio De Santis , Vikas Rana
IPC: H01L27/105 , H01L27/11521 , G11C29/00 , H01L27/112 , H01L27/11519 , H01L27/11558 , G11C16/04 , H01L21/66
Abstract: According to principles as discussed herein, an EEPROM cell is provided and then, after testing the code, using the exact same architecture, transistors, memory cells, and layout, the EEPROM cell is converted to a read-only memory (“ROM”) cell. This conversion is done on the very same integrated circuit die using the same layout, design, and timing with only a single change in an upper level mask in the memory array. In one embodiment, the mask change is the via mask connecting metal 1 to poly. This allows the flexibility to store the programming code as non-volatile memory code, and then after it has been tested, at time selected by the customer, some or all of that code from a code that can be written to a read-only code that is stored in a ROM cell that is composed the same transistors and having the same layout.
-
公开(公告)号：US09466347B1
公开(公告)日：2016-10-11
申请号：US14971403
申请日：2015-12-16
Inventor： Marco Pasotti , Vikas Rana
CPC classification number: G11C8/10 , G11C8/08 , G11C13/0004 , G11C13/0028 , G11C13/004 , G11C13/0069
Abstract: An integrated circuit includes an array of phase-change memory (PCM) cells, a plurality of wordlines coupled to the array of PCM cells, and a row decoder circuit coupled to the plurality of wordlines. The row decoder circuit includes a first low voltage logic gate and a first high voltage level shifter coupled to the first low voltage logic gate. The row decoder circuit also includes a second low voltage logic gate, a second high voltage level shifter coupled to the second low voltage logic gate, and a first low voltage logic circuit coupled to the second low voltage logic gate. In addition, the row decoder circuit includes a second low voltage logic circuit coupled to the second low voltage logic gate, and a low voltage wordline driver having an input coupled to the outputs of the first and second low voltage logic gates, and an output coupled to a selected wordline.
Abstract translation: 集成电路包括相变存储器（PCM）单元的阵列，耦合到PCM单元阵列的多个字线以及耦合到多个字线的行解码器电路。 行解码器电路包括耦合到第一低电压逻辑门的第一低电压逻辑门和第一高电压电平移位器。 行解码器电路还包括第二低电压逻辑门，耦合到第二低电压逻辑门的第二高电压电平移位器和耦合到第二低电压逻辑门的第一低电压逻辑电路。 此外，行解码器电路包括耦合到第二低电压逻辑门的第二低电压逻辑电路和具有耦合到第一和第二低电压逻辑门的输出的输入的低电压字线驱动器，以及耦合到 到一个选定的字线。
-
公开(公告)号：US11615820B1
公开(公告)日：2023-03-28
申请号：US17490976
申请日：2021-09-30
Inventor： Laura Capecchi , Marcella Carissimi , Marco Pasotti , Vikas Rana , Vivek Tyagi
Abstract: A system and method for operating a memory cell is provided. A non-volatile memory storage device includes an array of memory cells of differential or single-ended type. In an embodiment, a regulator is coupled to a sense amplifier. The regulator is configured to generate a voltage to gate terminals of one or two transistors of the sense amplifier. In the differential type, the voltage is generated such that the first bias current and the second bias current have a current value equal to the sum of a maximum current flowing in a memory cell being in a RESET state and a fixed current. In the single-ended type, the regulated voltage is generated such that the first bias current and the second bias current have a current value equal to the sum of a fixed current and the reference current generated by the reference current source across temperature.
-
公开(公告)号：US11424676B2
公开(公告)日：2022-08-23
申请号：US17145107
申请日：2021-01-08
Inventor： Vikas Rana , Marco Pasotti , Fabio De Santis
Abstract: A voltage supply circuit and a method for controlling a voltage supply circuit are provided. The voltage supply circuit includes a positive charge pump stage that generates a positive voltage and a negative charge pump stage that generates a negative voltage. The voltage supply circuit also includes a control stage that compares a voltage representative of the negative voltage with a reference voltage and causes a slope of the positive voltage to decrease when the voltage representative of the negative voltage exceeds the reference voltage.
-
-
-
-
-
-
-
-
-
Search Results
60
records
(took 0.025 seconds)
