DEVICE FOR CORRECTING LIGHT ABSORPTION SPECTRUM, METHOD OF MANUFACTURING THE DEVICE, AND METHOD OF CORRECTING LIGHT ABSORPTION SPECTRUM
    11.
    发明申请
    DEVICE FOR CORRECTING LIGHT ABSORPTION SPECTRUM, METHOD OF MANUFACTURING THE DEVICE, AND METHOD OF CORRECTING LIGHT ABSORPTION SPECTRUM 审中-公开
    用于校正光吸收光谱的装置,制造装置的方法和校正光吸收光谱的方法

    公开(公告)号:US20160089088A1

    公开(公告)日:2016-03-31

    申请号:US14818485

    申请日:2015-08-05

    Abstract: Provided are light absorption spectrum correction devices, methods of manufacturing the light absorption spectrum correction devices, and methods of correcting a light absorption spectrum. The light absorption spectrum correction device includes: a light source configured to emit light; an attenuated total reflectance (ATR) crystal layer configured to contact a subject and provide an optical passage along which the light emitted from the light source travels to the subject; a pressure sensor configured to detect a contact pressure applied to the ATR crystal layer by the subject; a spectrum detector and analyzer configured to detect light emitted from the ATR crystal layer, form a light absorption spectrum based on the detected light, and determine an intensity of the light emitted from the ATR crystal layer; and a spectrum correction device configured to correct the light absorption spectrum based on the contact pressure.

    Abstract translation: 提供了光吸收光谱校正装置,制造光吸收光谱校正装置的方法和校正光吸收光谱的方法。 光吸收光谱校正装置包括:配置为发光的光源; 衰减的全反射(ATR)晶体层,被配置为接触被摄体并且提供光源,所述光通路沿着所述光通路传播到所述被摄体; 压力传感器,被配置为检测被检体施加到所述ATR晶体层的接触压力; 配置为检测从ATR晶体层发射的光的光谱检测器和分析器,基于检测到的光形成光吸收光谱,并确定从ATR晶体层发射的光的强度; 以及频谱校正装置,被配置为基于接触压力校正光吸收光谱。

    ELECTRONIC SYSTEM AND METHOD FOR TASK SCHEDULING

    公开(公告)号:US20240338250A1

    公开(公告)日:2024-10-10

    申请号:US18392956

    申请日:2023-12-21

    CPC classification number: G06F9/4893

    Abstract: An electronic system includes a multi-core processor including a plurality of cores; a performance index logger configured to log a performance index per core for a plurality of tasks allocated to the multi-core processor, respectively; a target core selector configured to calculate a suitability index based on a performance index per core for a target task from among the plurality of tasks, and based on an index per core determined independently of the target task, and to select a target core based on the suitability index; and a task allocator configured to allocate the target task to the target core.

    NONINVASIVE APPARATUS AND METHOD FOR TESTING GLYCATED HEMOGLOBIN
    17.
    发明申请
    NONINVASIVE APPARATUS AND METHOD FOR TESTING GLYCATED HEMOGLOBIN 有权
    非活性装置和测试糖化血红蛋白的方法

    公开(公告)号:US20160061810A1

    公开(公告)日:2016-03-03

    申请号:US14825302

    申请日:2015-08-13

    Abstract: An apparatus for testing glycated hemoglobin includes a first light measurement device configured to radiate a first light to an object and detect first information about the first light reflected from the object, a second light measurement device configured to radiate a second light to the object and detect second information about the second light reflected from the object, a data extractor configured to extract first extracted data related to hemoglobin from the first information and second extracted data related to glucose from the second information, and a data processor configured to determine information related to glycated hemoglobin from the first extracted data and the second extracted data.

    Abstract translation: 一种测试糖化血红蛋白的装置,包括:第一光测量装置,被配置为向对象辐射第一光,并检测关于从物体反射的第一光的第一信息;第二光测量装置,被配置为向对象辐射第二光,并检测 关于从物体反射的第二光的第二信息,数据提取器,被配置为从第一信息中提取与血红蛋白相关的第一提取数据和从第二信息提取与葡萄糖相关的第二提取数据;以及数据处理器,被配置为确定与糖化相关的信息 来自第一提取数据的血红蛋白和第二提取数据。

    METHOD OF CONTROLLING PERFORMANCE BOOSTING OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE PERFORMING THE METHOD

    公开(公告)号:US20210057420A1

    公开(公告)日:2021-02-25

    申请号:US16823483

    申请日:2020-03-19

    Abstract: There is provided a method of controlling performance boosting of a semiconductor device. According to the method, input of a user is monitored. A performance of the semiconductor device is boosted by consecutively executing a plurality of boosting policies associated with a plurality of macros based on an input event associated with the input of the user and available energy during a boosting interval. Boosting level in each of the boosting policies may be adaptively determined based on the boosting level and the amount of usage of the semiconductor device used in the previous boosting policy and the boosting policies are consecutively executed. Accordingly, improved and/or optimal performance boosting can be provided to the semiconductor device and at the same time, a waste of power can be mitigated and/or prevented.

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