公开(公告)号：US20150355845A1

公开(公告)日：2015-12-10

申请号：US14729518

申请日：2015-06-03

Applicant: Samsung Electronics Co., Ltd.

Inventor： Kwang-Jin Lee ,  Seonghun Kim ,  Jeong-Han Kim ,  Sunghee Lee ,  Sanggyu Jang ,  Hong Suk Choi

IPC: G06F3/06

CPC classification number: G06F3/0679 ,  G06F3/0616 ,  G06F3/0659 ,  G06F12/0246 ,  G11C16/3418 ,  G11C16/349 ,  G11C16/3495 ,  G11C2211/5641

Abstract: Methods of operating nonvolatile memory devices include counting a number of consecutive read operations performed on a first memory region within the nonvolatile memory device, and executing a page reclaim operation on the first memory region in response to detecting that a count in the number of consecutive read operations meets or exceeds a threshold count. A page reclaim operation may include checking an error bit level within a page of data stored in a multi-level cell block within the memory device. The page reclaim operation may further include moving page data from the multi-level cell block to a single-level cell block in the memory device and error correcting the page data during the moving.

Abstract translation: 操作非易失性存储器件的方法包括对在非易失性存储器件内的第一存储器区域执行的连续读取操作的数量进行计数，以及响应于检测到连续读取数量的计数，对第一存储器区域执行页面回收操作 操作满足或超过阈值计数。 页面回收操作可以包括检查存储在存储器设备内的多级单元块中的数据页内的错误位级别。 页面回收操作可以进一步包括将页面数据从多级单元块移动到存储器件中的单级单元块，并且在移动期间纠错页面数据。

公开(公告)号：US12192840B2

公开(公告)日：2025-01-07

申请号：US16994344

申请日：2020-08-14

Applicant: Samsung Electronics Co., Ltd.

Inventor： Madhan Raj Kanagarathinam ,  Chounjong Nam ,  Gaurav Sinha ,  Gunjan kumar Choudhary ,  Karthikeyan Arunachalam ,  Sunghee Lee ,  Sujith Rengan Jayaseelan ,  Dronamraju Siva Sabareesh ,  Harikrishnan Natarajan ,  Jaheon Gu

IPC: H04W36/04 ,  H04L69/16 ,  H04W36/00 ,  H04W36/36 ,  H04W80/06 ,  H04W36/14 ,  H04W36/30

Abstract: Disclosed herein is a method and network handover system for handling a data session in a user equipment (UE). The method comprises initiating a data session of at least one application from a plurality of applications with a first communication interface using a first socket of the UE having a first socket file descriptor (SOCKFD) for the data session, detecting a deterioration in a network connection of the first communication interface, identifying a second communication interface, establishing a second socket having a second SOCKFD associated with the second communication interface and migrating the data session from the first communication interface to the second communication interface by mapping the first SOCKFD corresponding to the first socket to the second SOCKFD corresponding to the second socket.

公开(公告)号：US20240203788A1

公开(公告)日：2024-06-20

申请号：US18541091

申请日：2023-12-15

Applicant: Samsung electronics CO., LTD. ,  Incheon national university research & business foundation

Inventor： Eunhyoung CHO ,  Sunghee Lee ,  Jeongyub Lee ,  Hanboram Lee

IPC: H01L21/768 ,  H01L21/285

CPC classification number: H01L21/76849 ,  H01L21/28562 ,  H01L21/76831 ,  H01L21/76861 ,  H01L21/76879

Abstract: A method of selectively forming a layer according to atomic layer deposition includes providing a substrate which includes a first region consisting of a first material and having a first surface and a second region consisting of a second material and having a second surface, forming a first reaction inhibition layer on the second surface using a reaction inhibitor selectively adsorbed on the second surface, selectively forming a first deposition layer on the first surface using a first precursor and a first reactant, wherein the first reactant reacts with the first precursor to form an atomic layer and does not react with the reaction inhibitor to form the atomic layer, and converting the first reaction inhibition layer on the second surface into a second deposition layer using a second reactant which reacts with the first reaction inhibition layer to form the atomic layer.

公开(公告)号：US20210407099A1

公开(公告)日：2021-12-30

申请号：US17141770

申请日：2021-01-05

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sunghee Lee ,  Kyubaik Chang

IPC: G06T7/155 ,  G06T7/00

Abstract: A method for detecting a defect on a substrate, including receiving a first image, generating a second image, by converting the first image to grayscale levels, calculating a first gray level value, having a maximum number of pixels in the second image, and second and third gray level values, having a number of pixels in the second image equal to a predetermined fraction of the first gray level value, from a histogram of the number of pixels respective to the grayscale levels of the second image, converting the second image into a third image having pixels at a level lower than that of the first gray level value and a fourth image having pixels at a level equal to or higher than the first gray level value, generating fifth and sixth images by detecting edges by applying a Canny algorithm to the third and fourth images, respectively.

公开(公告)号：US09970906B2

公开(公告)日：2018-05-15

申请号：US14734229

申请日：2015-06-09

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jooho Lee ,  Changseung Lee ,  Jeoyoung Shim ,  Sunghee Lee ,  Woosung Jeon

IPC: G01N29/12 ,  G01N29/24

CPC classification number: G01N29/12 ,  G01N29/2437 ,  G01N2291/0256 ,  G01N2291/2697

Abstract: An apparatus for analyzing an active material of a secondary battery may include: a first electrode; a piezoelectric layer on the first electrode; a second electrode on the piezoelectric layer, configured to provide a voltage having a polarity opposite to a polarity of the first electrode; and/or an insulating layer on the second electrode and including a through hole exposing a portion of the second electrode. A method of analyzing an active material of a secondary battery may include: disposing an active material in a through hole of a bulk acoustic resonator, in which a first electrode, a piezoelectric layer, a second electrode, and an insulating layer are stacked; measuring a resonance frequency of the resonator by applying an electric signal to the first and second electrodes of the resonator; and/or measuring a weight of the active material in the through hole, based on the measured resonance frequency.