摘要:
A sensing circuit for sensing logic data is disclosed. A memory cell is electrically connected to a bit line. The sensing circuit includes a first pre-charging module electrically connected to the bit line for pre-charging the bit line. A selecting module is electrically connected between the bit line and a first data line for transmitting signals and for isolating capacitances. A second pre-charging module is electrically connected to the first data line for pre-charging the first data line. A first voltage keeping module is electrically connected to the first data line for maintaining a signal on the first data line at a voltage level. An isolating module is electrically connected between the first data line and a second data line for transmitting signals and for isolating capacitances. A third pre-charging module is electrically connected to the second data line for pre-charging the second data line.
摘要:
The invention provides a memory output circuit. The memory output circuit is capable of receiving bit line data and bit bar line data output by a memory cell array. In one embodiment, the memory output circuit comprises a pre-charge circuit, a pre-amplifier circuit, and a sense amplifier. The pre-charge circuit is capable of pre-charging a first node and a first inverse node wherein the bit line data and bit bar line data are respectively output to the first node and the first inverse node. The pre-amplifier circuit is capable of generating a second voltage on a second node and a second inverse voltage on a second inverse node according to a first voltage on the first node and a first inverse voltage on the first inverse node. The sense amplifier is capable of detecting the second voltage on the second node and the second inverse voltage on the second inverse node to generate a third voltage on a third node and a third inverse voltage on a third inverse node.
摘要:
A pre-charge and sense out circuit for differential type ROM. The ROM is capable of connecting to either a first bit line or a second bit line. The pre-charge and sense out circuit contains a pre-charging module electrically connected to the first and the second bit lines, for pre-charging the first and the second bit lines; a selecting module electrically connected to the first bit line, the second bit line, a first data line, and a second data line, for transmitting data according to a first control signal; a charge sharing module electrically connected to the first and the second data lines, for sharing electrical charges to the first and the second data lines; and a sensing module electrically connected to the first and the second data lines, for sensing signals on the first and the second data lines so as to generate an output signal.
摘要:
A selective memory refresh circuit for refreshing a memory cell array. The memory cell array has a plurality of word lines connected to a plurality of word line selection circuits for determining if a particular word line needs to be refresh during a refresh cycle. Each word line refresh selection circuit further has a word line address latching device for receiving a word line pre-decode signal, a release signal, a triggering signal and outputting a word line latching signal and a word line refresh compare circuit for receiving the word line pre-decode signal and the word line latching signal and transmitting the result of comparison to a word line driver. When the word line latching signal is at a high level, memory cells attached to the word line are refreshed. On the contrary, when the word line latching signal is at a low level, memory refresh for that word line is skipped.
摘要:
A tissue mimicking phantom is disclosed, in which the tissue-mimicking phantom comprises: at least an upper gelatin layer, each configured with at least a sunken area; at least a lower gelatin layer, each disposed beneath the at least one upper gelatin layer while being configured with at least a microchannel network having blood-mimicking fluid flowing therein; and at least a micro-heater. By the use of the sunken area of the at least one upper gelatin layer to simulate shapes and depths of different trauma wounds, the healing of anyone of the trauma wounds can be accessed clinically through a physical properties test while subjecting the trauma wound under different negative pressures and different dressings.
摘要:
The invention provides a memory circuit. In one embodiment, the memory circuit comprises a first PMOS transistor, a second PMOS transistor, a first NMOS transistor, a second PMOS transistor, and a memory cell array. The first PMOS transistor is coupled between a first voltage terminal and a first node. The second PMOS transistor is coupled between the first voltage terminal and a second node. The first NMOS transistor is coupled between a third node and a second voltage terminal. The second NMOS transistor is coupled between a fourth node and the second voltage terminal. The memory cell array comprises a plurality of memory cells, at least one comprising a first inverter and a second inverter. A positive power terminal of the first inverter is coupled to the first node, a negative power terminal of the first inverter is coupled to the third node, a positive power terminal of the second inverter is coupled to the second node, and a negative power terminal of the second inverter is coupled to the fourth node.
摘要:
A sensing circuit for sensing logic data is shown. A memory cell is electrically connected to a bit line. The sensing circuit contains a first pre-charging module electrically connected to the bit line for pre-charging the bit line. A selecting module is electrically connected between the bit line and a first data line for transmitting signals and for isolating capacitances. A second pre-charging module is electrically connected to the first data line for pre-charging the first data line. A first voltage keeping module is electrically connected to the first data line for maintaining the signal on the first data line at a high voltage level. An isolating module is electrically connected between the first data line and a second data line for transmitting signals and for isolating capacitances. Finally, a third pre-charging module is electrically connected to the second data line for pre-charging the second data line.
摘要:
A digital delay phase locked loop, to quickly perform the phase lock on an input clock signal. The digital delay phase locked circuit has a delay apparatus, a buffer, a phase comparator, an adder-register, a clock divider and a demultiplexer. After a delay operation performed on the input clock signal by the delay apparatus, the phase locked clock signal is output via the buffer. The above two signals are then compared with each other using the phase comparator to output a comparison signal to the adder-register for addition/subtraction delay. Being controlled by the clock divider, the objective of fast phase lock is achieved by the addition/subtraction operation of the demultiplexer.
摘要:
A memory device has an output buffer. The output buffer is electrically connected to a data output port of a sense amplifier of the memory device for amplifying an output signal from the data output port. The output buffer has a detector for producing a control signal according to the output signal from the data output port, and an amplifier for amplifying the output signal from the data output port. The amplifier has an input port electrically connected to the data output port for accepting the output signal from the data output port, and a control terminal electrically connected to the output terminal of the detector for accepting the control signal from the detector to control operations of the amplifier. When the detector produces the control signal and transmits the control signal to the control terminal of the amplifier, the amplifier begins amplifying the output signal transmitted from the data output port to the input port of the amplifier.
摘要:
A apparatus uses a test method to perform burn-in testing of a static random access memory that has a plurality of word lines, a plurality of first bit lines, a plurality of second bit lines, and a plurality of memory cells for storing data. Each of the memory cells is coupled to a corresponding word line, a corresponding first bit line, a corresponding second bit line, and a power supply that is used to apply a working voltage to the memory cell to drive the memory cell. When the apparatus tests the static random access memory, the apparatus adjusts the working voltage according to a potential of the word lines and voltage gaps between the first bit lines and the second bit lines.