Abstract:
A temperature sensor uses a semiconductor device that has a known voltage drop characteristic that is proportional to absolute temperature (PTAT). A controllable current source is coupled to the semiconductor device and is operable to sequentially inject a bias current having a value I(bias) and fixed ratio N of I(bias) into the semiconductor device. A delta sigma analog to digital converter (ADC) has an input coupled to the semiconductor device. The delta sigma ADC is configured to sample and integrate a sequence of voltages pairs produced across the semiconductor device by repeatedly injecting an ordered sequence of selected bias currents into the semiconductor device. The ordered sequence of selected bias currents comprises M repetitions of (N×I(bias); I(bias)) and one repetition of (M×I(bias); M×N×I(bias)).
Abstract:
A computing device uses a recursive discrete Fourier transform (RDFT) engine to reduce time required by a frequency transform module, memory required to hold intermediate products, and/or computing resources used for the testing. In an embodiment the windowing function is integrated and processed simultaneously with the recursive DFT funcions. A frequency-bin power module is configured to determine the frequency bin within the set of frequency bins that has a greatest signal power at various levels of recursion.
Abstract:
Methods for operating two or more analog-to-digital converters (ADCs) are presented herein. The method may be implemented in an integrated circuit. The integrated circuit may include a first ADC and a second ADC disposed on a single semiconductor die. The integrated circuit may also include logic circuitry operably coupled to the first and second ADCs. For a digital value obtained by conversion, by the first ADC, of a first analog signal sampled by the first ADC during a period of time overlapping with another period of time during which a second analog signal is being converted by the second ADC, the logic circuitry may be configured to cause the digital value to be marked as noisy.
Abstract:
A successive approximation analog-to-digital with an input for receiving an input analog voltage, and an amplifier with a first set of electrical attributes in a sample phase and a second set of electrical attributes, differing from the first set of electrical attributes, in a conversion phase.
Abstract:
A system includes a storage device containing machine instructions and a plurality of digital values of an oversampled sinuisoidal signal. The system also includes a core coupled to the storage. The core is configured to execute the machine instructions, wherein, when executed, the machine instructions cause the core to implement a sigma-delta modulator that retrieves the plurality of digital values from the storage device as input to the modulator. The sigma-delta modulator is configured compute an output bit stream. The system further includes an analog filter configured to receive the output bit stream from the core and to low-pass filter the output bit stream to produce a sinusoidal output signal.
Abstract:
An enhanced resolution successive-approximation register (SAR) analog-to-digital converter (ADC) is provided that includes a digital-to-analog converter (DAC), a comparator and enhanced resolution SAR control logic. The DAC includes analog circuitry that is configured to convert an M-bit digital input to an analog output. The comparator includes a plurality of coupling capacitors. The enhanced resolution SAR control logic is configured to generate an M-bit approximation of an input voltage and to store a residue voltage in at least one of the coupling capacitors. The residue voltage represents a difference between the input voltage and the M-bit approximation of the input voltage. The enhanced resolution SAR control logic is further configured to generate an N-bit approximation of the input voltage based on the stored residue voltage, where N>M.