X-ray backscattering detector
    12.
    发明授权

    公开(公告)号:US11061149B2

    公开(公告)日:2021-07-13

    申请号:US16544523

    申请日:2019-08-19

    Inventor: Morteza Safai

    Abstract: Disclosed herein is a scintillator for use in an x-ray backscattering system. The scintillator comprises an inorganic scintillator portion made of inorganic scintillating material and comprising one or more inorganic material elements. Each inorganic material element of the one or more inorganic material elements comprises an outer surface, and an inner surface opposite the outer surface. The outer surface is configured to be proximate to a subject to be scanned, such that the outer surface is configured to receive x-ray photons scattered by the subject. The scintillator also comprises an organic scintillator portion made of an organic scintillating material and comprising a front surface. At least a portion of the front surface abuts the inner surface of at least one of the one or more inorganic material elements.

    SYSTEM AND METHOD FOR MONOCHROMATIC X-RAY GAS EXCITATION BOND INSPECTION

    公开(公告)号:US20210148841A1

    公开(公告)日:2021-05-20

    申请号:US16687606

    申请日:2019-11-18

    Inventor: Morteza Safai

    Abstract: A system and method for determining the strength of a bond joining a composite structure is provided. The system includes a gas gun produces a short gas pulse directed normal to a surface of the composite structure and that creates a compression wave through the composite structure; a monochromatic x-ray system produces a monochromatic x-ray that is incident at an angle to the surface and that passes through the composite structure; a scintillator screen receives transmitted x-rays that pass through the composite structure; a mirror receives and magnifies radiation emitted from the scintillator screen; a detector receives the radiation from the scintillator screen; an electronic processor configured to process the radiation detected by the detector; and a synchronization controller configured to synchronize operation of the gas gun, the monochromatic x-ray system, and the detector.

    NONCONFORMANCE DETECTION SYSTEM
    16.
    发明申请

    公开(公告)号:US20210056658A1

    公开(公告)日:2021-02-25

    申请号:US16548538

    申请日:2019-08-22

    Abstract: A method, apparatus, and system for generating images. An imaging system comprises a computer system with a controller. The controller is configured to receive from a shearography camera system an unloaded visible light image generated of a coating in an area of a structure while the area is in an unloaded state and a loaded visible light image generated while the area is in a loaded state and receive from an infrared camera system an unloaded thermal image generated while the area is in the unloaded state and a loaded thermal image generated while the area is in the loaded state. The controller is configured to subtract the loaded visible light image from the unloaded visible light image to form a subtracted visible light image. The controller is configured to subtract the loaded thermal image from the unloaded thermal image to form a subtracted thermal image.

    Adjustable multifacet x-ray sensor array

    公开(公告)号:US10859719B2

    公开(公告)日:2020-12-08

    申请号:US16219245

    申请日:2018-12-13

    Inventor: Morteza Safai

    Abstract: Disclosed herein is a system for x-ray inspection. The system comprises an x-ray emitter. The system also comprises an x-ray sensor array comprising a first x-ray sensor, a second x-ray sensor adjacent the first x-ray sensor, and a coupler movably coupling the first x-ray sensor to the second x-ray sensor. The first x-ray sensor is movable into a plurality of orientations relative to the second x-ray sensor via the coupler. The system further comprises an imaging device to generate an inspection image based on information from the x-ray sensor array.

    Composite structure bondline inspection

    公开(公告)号:US10801973B2

    公开(公告)日:2020-10-13

    申请号:US16151934

    申请日:2018-10-04

    Inventor: Morteza Safai

    Abstract: An X-ray inspection system is presented. The X-ray inspection system comprises an X-ray source, an X-ray scintillator, a light detector, a first objective lens, and a second objective lens. The first objective lens is positioned between the X-ray scintillator and the light detector. The second objective lens is positioned between the first objective lens and the light detector.

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