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公开(公告)号:US20200264515A1
公开(公告)日:2020-08-20
申请号:US16866188
申请日:2020-05-04
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Hung-Wen CHO , Fu-Jye LIANG , Chun-Kuang CHEN , Chih-Tsung SHIH , Li-Jui CHEN , Po-Chung CHENG , Chin-Hsiang LIN
IPC: G03F7/20
Abstract: A method of controlling reticle masking blade positioning to minimize the impact on critical dimension uniformity includes determining a target location of a reticle masking blade relative to a reflective reticle and positioning the reticle masking blade at the target location. A position of the reticle masking blade is monitored during an imaging operation. The position of the reticle masking blade is compared with the target location and the position of the reticle masking blade is adjusted if the position of the reticle masking blade is outside a tolerance of the target location.
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公开(公告)号:US20200057381A1
公开(公告)日:2020-02-20
申请号:US16195945
申请日:2018-11-20
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Chao-Chen CHANG , Shao-Wei LUO , Jen-Yang CHUNG , Shang-Chieh CHIEN , Li-Jui CHEN , Po-Chung CHENG
Abstract: A device is disclosed that includes a master controller, a process chamber, a local controller, a switch, and a data storage. The process chamber is configured to generate a data according to a EUV light generation process. The local controller is coupled to the master controller and configured to control the process chamber. The switch is coupled between the master controller and the local controller, wherein the switch is configured to provide paths for the local controller to communicate with the master controller. The data storage directly connected to the local controller and configured to store the data. The local controller communicates directly with the data storage.
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公开(公告)号:US20200057376A1
公开(公告)日:2020-02-20
申请号:US16102887
申请日:2018-08-14
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Chun-Chia HSU , Chi YANG , Shang-Chieh CHIEN , Li-Jui CHEN , Po-Chung CHENG
IPC: G03F7/20
Abstract: A lithography method includes outputting, by an optical alignment sensor in a scanner system, a first signal in response to a light signal received by the optical alignment sensor; controlling, by a controller, a trajectory of a droplet in a light source system according to the first signal feedback to the controller; and irradiating the droplet by a drive laser to output a light beam from the light source system to the scanner system.
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公开(公告)号:US20200037427A1
公开(公告)日:2020-01-30
申请号:US16250026
申请日:2019-01-17
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chi YANG , Sheng-Ta LIN , Shang-Chieh CHIEN , Li-Jui CHEN , Po-Chung CHENG
Abstract: An extreme ultraviolet radiation source is provided, including a vessel, an optical collector, and a gas scrubber. The vessel has a gas inlet and a gas outlet. The optical collector is disposed within the vessel and configured to collect and reflect extreme ultraviolet light produced in the vessel. A cleaning gas is introduced into the vessel through the gas inlet to clean the surface of the optical collector. The gas scrubber is disposed within the vessel, arranged such that the cleaning gas leaves the vessel through the gas outlet after flowing through the gas scrubber. The gas scrubber has a number of gas passages to allow the cleaning gas to flow through, and the size of the gas passage close to the gas outlet is smaller than the size of the gas passage away from the gas outlet.
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公开(公告)号:US20200033194A1
公开(公告)日:2020-01-30
申请号:US16438710
申请日:2019-06-12
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Jen-Hao YEH , Chun-Lin CHANG , Han-Lung CHANG , Li-Jui CHEN , Po-Chung CHENG
Abstract: A light source system is provided. The light source system is capable of measuring a polarization angle and includes a light source configured to emit an original light beam, and the original light beam has an original polarization angle. The light source system further includes an amplifying module configured to amplify the original light beam and generate a forward beam for hitting a target, and the forward beam has a forward polarization angle that is equal to the original polarization angle. The light source system further includes a polarization measurement unit, and the polarization measurement unit includes a first polarization measurement module configured to receive a first return beam and measure a first polarization angle of the first return beam. The first return beam is reflected from the target.
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16.
公开(公告)号:US20200004168A1
公开(公告)日:2020-01-02
申请号:US16404235
申请日:2019-05-06
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Yen-Hsun CHEN , Ming-Hsun TSAI , Shao-Hua WANG , Han-Lung CHANG , Li-Jui CHEN , Chia-Chen CHEN
Abstract: An extreme ultraviolet radiation source apparatus includes a chamber including at least a droplet generator, a nozzle of the droplet generator, and a dry ice blasting assembly. The droplet generator includes a reservoir for a molten metal, and the nozzle has a first end connected to the reservoir and a second opposing end where molten metal droplets emerge from the nozzle. The dry ice blasting assembly includes a blasting nozzle, a blasting air inlet and a blaster carbon dioxide (CO2) inlet. The blasting nozzle is disposed inside the chamber. The blasting nozzle is arranged to direct a pressurized air stream and dry ice particles at the nozzle of the droplet generator.
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公开(公告)号:US20200004159A1
公开(公告)日:2020-01-02
申请号:US16405530
申请日:2019-05-07
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jhan-Hong YEH , Cheng-Chieh CHEN , Jeng-Yann TSAY , Li-Jui CHEN , Yee-Shian Henry TONG , Wen-Chih WANG , Hsin-Liang CHEN
Abstract: In a method of diagnosing an RF generator of a laser produced plasma extreme ultra violet (LPP EUV) radiation source apparatus, a testing system is connected to the RF generator of the LPP EUV radiation source apparatus. An output power is measured by the testing system with changing an input power of the RF generator. Using a computer system, the measured output power is analyzed. Based on the analyzed measured output power, whether the RF generator is operating properly is determined.
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公开(公告)号:US20190150266A1
公开(公告)日:2019-05-16
申请号:US16178157
申请日:2018-11-01
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Wei-Chih LAI , Han-Lung CHANG , Bo-Tsun LIU , Li-Jui CHEN , Po-Chung CHENG
Abstract: A droplet generator for an extreme ultraviolet imaging tool includes a reservoir for a molten metal, and a nozzle having a first end connected to the reservoir and a second opposing end where molten metal droplets emerge from the nozzle. A gas inlet is connected to the nozzle, and an isolation valve is at the second end of the nozzle configured to seal the nozzle droplet generator from the ambient.
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19.
公开(公告)号:US20240377752A1
公开(公告)日:2024-11-14
申请号:US18781567
申请日:2024-07-23
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Tai-Yu CHEN , Heng-Hsin LIU , Li-Jui CHEN , Shang-Chieh CHIEN
Abstract: A photolithography system utilizes tin droplets to generate extreme ultraviolet radiation for photolithography. The photolithography system irradiates the droplets with a laser. The droplets become a plasma and emit extreme ultraviolet radiation. An array of sensors sense the extreme ultraviolet radiation and charged particles emitted by the droplets. A control system analyses sensor signals from the sensors and adjusts plasma generation parameters responsive to the sensor signals.
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公开(公告)号:US20230367225A1
公开(公告)日:2023-11-16
申请号:US18361254
申请日:2023-07-28
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Tai-Yu CHEN , Sagar Deepak KHIVSARA , Kuo-An LIU , Chieh HSIEH , Shang-Chieh CHIEN , Gwan-Sin CHANG , Kai Tak LAM , Li-Jui CHEN , Heng-Hsin LIU , Chung-Wei WU , Zhiqiang WU
IPC: G03F7/00
CPC classification number: G03F7/70033 , G03F7/70166 , G03F7/705 , G03F7/70916 , G03F7/70933
Abstract: A photolithography system utilizes tin droplets to generate extreme ultraviolet radiation for photolithography. The photolithography system irradiates the droplets with a laser. The droplets become a plasma and emit extreme ultraviolet radiation. The photolithography system senses contamination of a collector mirror by the tin droplets and adjusts the flow of a buffer fluid to reduce the contamination.
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