公开(公告)号：US20240302210A1

公开(公告)日：2024-09-12

申请号：US18385168

申请日：2023-10-30

Applicant: SAMSUNG ELECTRONICS CO., LTD. ,  UNIST (ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY)

Inventor： Woo-Shik KIM ,  Youngshin KWAK ,  Heejin CHOI ,  Jisu OHK

IPC: G01J3/02 ,  G01J3/28

CPC classification number: G01J3/0297 ,  G01J3/2823 ,  G01J2003/2826 ,  G01J2003/2833 ,  G01J2003/2836 ,  G01J2003/284

Abstract: A method of performing color calibration of a multispectral image sensor (MIS) includes obtaining test measurement data of at least one color chart that is measured by a test MIS under at least one lighting environment, obtaining reference measurement data of the at least one color chart that is measured by a reference MIS under the at least one lighting environment, the reference MIS being calibrated in advance, and generating, based on the test measurement data and the reference measurement data, at least one transformation model configured to transform measurements between the test MIS and the reference MIS.

公开(公告)号：US20240167872A1

公开(公告)日：2024-05-23

申请号：US18429532

申请日：2024-02-01

Applicant: VIAVI Solutions Inc.

Inventor： Lan SUN ,  Chang Meng HSIUNG ,  Edward GOODING

IPC: G01J3/28

CPC classification number: G01J3/28 ,  G01J2003/2836 ,  G01J2003/284 ,  G01J2003/2886

Abstract: In some implementations, a device may receive spectroscopic data associated with a dynamic process. The device may generate a principal component analysis (PCA) model based on a first block of spectra from the spectroscopic data. The device may project a second block of spectra from the spectroscopic data to the PCA model generated based on the first block of spectra. The device may determine a value of a metric associated with the second block based on projecting the second block of spectra to the PCA model. The device may determine whether the dynamic process has reached an end point based on the value of the metric associated with the second block.

公开(公告)号：US20230243699A1

公开(公告)日：2023-08-03

申请号：US17805099

申请日：2022-06-02

Applicant: VIAVI Solutions Inc.

Inventor： Lan SUN ,  Chang Meng HSIUNG ,  Edward GOODING

IPC: G01J3/28

CPC classification number: G01J3/28 ,  G01J2003/2836 ,  G01J2003/284 ,  G01J2003/2886

Abstract: In some implementations, a device may receive spectroscopic data associated with a dynamic process. The device may generate a principal component analysis (PCA) model based on a first block of spectra from the spectroscopic data. The device may project a second block of spectra from the spectroscopic data to the PCA model generated based on the first block of spectra. The device may determine a value of a metric associated with the second block based on projecting the second block of spectra to the PCA model. The device may determine whether the dynamic process has reached an end point based on the value of the metric associated with the second block.

公开(公告)号：US20180128680A1

公开(公告)日：2018-05-10

申请号：US15586720

申请日：2017-05-04

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Dong Ho KIM

IPC: G01J3/10 ,  G01J3/28 ,  A61B5/145 ,  A61B5/1455

CPC classification number: G01J3/10 ,  A61B5/14532 ,  A61B5/14546 ,  A61B5/1455 ,  A61B2560/0242 ,  G01J3/28 ,  G01J3/32 ,  G01J3/44 ,  G01J2003/102 ,  G01J2003/106 ,  G01J2003/284

Abstract: A spectrometer according to one aspect may include a plurality of light sources configured to emit light to a target object, a plurality of wavelength controllers installed on one surface of each of the plurality of light sources and configured to adjust a peak wavelength band of each of the light sources, and a detection unit configured to detect light returning from the target object.

公开(公告)号：US11920980B2

公开(公告)日：2024-03-05

申请号：US17805099

申请日：2022-06-02

Applicant: VIAVI Solutions Inc.

Inventor： Lan Sun ,  Chang Meng Hsiung ,  Edward Gooding

IPC: G01J3/28

CPC classification number: G01J3/28 ,  G01J2003/2836 ,  G01J2003/284 ,  G01J2003/2886

Abstract: In some implementations, a device may receive spectroscopic data associated with a dynamic process. The device may generate a principal component analysis (PCA) model based on a first block of spectra from the spectroscopic data. The device may project a second block of spectra from the spectroscopic data to the PCA model generated based on the first block of spectra. The device may determine a value of a metric associated with the second block based on projecting the second block of spectra to the PCA model. The device may determine whether the dynamic process has reached an end point based on the value of the metric associated with the second block.

公开(公告)号：US20190041269A1

公开(公告)日：2019-02-07

申请号：US15881037

申请日：2018-01-26

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： HYO SUN HWANG ,  SO YOUNG LEE ,  JAE WOOK SHIM

IPC: G01J3/457 ,  G01J3/28

CPC classification number: G01J3/457 ,  G01J3/02 ,  G01J3/28 ,  G01J3/2803 ,  G01J2003/284 ,  G01J2003/2866 ,  G01N21/274 ,  G01N21/31 ,  G01N2201/1211

Abstract: Provided is a spectrum measurement apparatus including a light source configured to emit light to a sample; a light detector configured to receive light, which is reflected or scattered from, or transmitted through the sample, and to measure an intensity of the received light, and a processor configured to reconstruct a spectrum of the sample for calibration while adjusting a value of a spectrum reconstruction parameter in response to the light detector receiving the light and measuring the intensity of the received light, and to determine an optimal value of the spectrum reconstruction parameter based on a similarity between the reconstructed spectrum of the sample for calibration and an original spectrum of the sample for calibration.

公开(公告)号：US20170138791A1

公开(公告)日：2017-05-18

申请号：US15259687

申请日：2016-09-08

Applicant: Massachusetts Institute of Technology

Inventor： David Burghoff ,  Yang Yang ,  Qing Hu

IPC: G01J3/28 ,  G01J3/10

CPC classification number: G01J3/28 ,  G01J3/10 ,  G01J3/108 ,  G01J3/2803 ,  G01J3/42 ,  G01J3/4531 ,  G01J9/04 ,  G01J2003/102 ,  G01J2003/284

Abstract: According to one aspect, a multi-heterodyne system is disclosed, which comprises a first laser source for generating multi-mode radiation having a frequency spectrum characterized by a first plurality of phase coherent frequencies, and a second laser source for generating multi-mode radiation having a frequency spectrum characterized by a second plurality of phase coherent frequencies. The system further comprises at least one detector for detecting a combination of the multi-mode radiation generated by the first and second laser sources so as to provide a multi-heterodyne signal having a frequency spectrum characterized by a plurality of beat frequencies, each beat frequency corresponding to a pairwise difference in the first and second plurality of phase coherent frequencies. The system further comprises an analyzer for receiving said multi-heterodyne signal and configured to employ a predictive model of the multi-heterodyne signal to provide estimates of any of phase error and timing error associated with the beat frequencies.

公开(公告)号：US09612108B2

公开(公告)日：2017-04-04

申请号：US14657209

申请日：2015-03-13

Applicant: KABUSHIKI KAISHA TOSHIBA

Inventor： Toru Mikami

IPC: G01B11/16 ,  G01B11/02 ,  G01J3/44 ,  G01J3/02 ,  G01N21/95 ,  G01N21/956 ,  G01J3/28

CPC classification number: G01B11/02 ,  G01J3/0264 ,  G01J3/4412 ,  G01J2003/284 ,  G01N21/9501 ,  G01N21/95607 ,  G01N2021/95615

Abstract: In accordance with an embodiment, a measurement apparatus includes a library creation unit, a spectral profile acquiring unit, and a measurement unit. The library creation unit creates a library in which a layer stack model is matched to a theoretical profile regarding a pattern of stacked layers. The spectral profile acquiring unit acquires an actual measured profile by applying light to a measurement target pattern obtained when the pattern is actually created. The measurement unit measures the sectional shape of the measurement target pattern by performing fitting of the theoretical profile to the actual measured profile. The layer stack model is created by calculating a feature value that reflects the intensity of reflected light from an interface for each of the layers, determining a priority order of analysis from the feature value, and sequentially performing fitting of the theoretical profile to the measured profile in the determined priority order.

公开(公告)号：US3794425A

公开(公告)日：1974-02-26

申请号：US3794425D

申请日：1972-08-22

Applicant: SHELL OIL CO

Inventor： SMITH V ,  BOWERS R

IPC: G01J1/44 ,  G01J3/06 ,  G01J3/12 ,  G01J3/28 ,  G01J5/34 ,  G01N21/31 ,  G01N21/35 ,  G01N21/34 ,  G01J3/48

CPC classification number: G01J3/12 ,  G01J5/34 ,  G01J2001/4242 ,  G01J2003/1234 ,  G01J2003/284 ,  G01N21/31 ,  G01N21/314 ,  G01N21/3504

Abstract: A fast spectroscopic analyzer wherein chopped infrared light is passed through a sample cell, a rotating variable filter and to a detector. The angular position of the filter corresponds to various wave lengths of light and is used to synchronize a recording system, recording signals of interest.

Abstract translation: 一种快速光谱分析仪，其中切碎的红外光通过样品池，旋转可变过滤器和检测器。 滤光器的角度位置对应于各种波长的光，并用于同步记录系统，记录感兴趣的信号。