公开(公告)号：US20140291541A1

公开(公告)日：2014-10-02

申请号：US14229128

申请日：2014-03-28

Applicant: FUJIFILM Corporation

Inventor： Keita WATANABE ,  Kentaro NOMA ,  Yasufumi ODA

IPC: G01T1/16 ,  G01N23/04

CPC classification number: G01T1/16 ,  G01N23/04 ,  G01N2223/505 ,  H04N5/32 ,  H04N5/347 ,  H04N5/3655 ,  H04N5/3658 ,  H04N5/367

Abstract: Binning readout reads out electric charge accumulated in pixels to signal lines in blocks of a plurality of adjoining pixel-rows. A correction image generator of a line defect corrector scales up an image size of a reference frame image RP outputted by the binning readout and corrects pixel values of the reference frame image RP, to produce a correction image RPC to be used for correction of a line defect occurring in an X-ray image XP. The scale-up is performed by applying row interpolation processing to the reference frame image RP. The correction of the pixel values is performed by multiplying the reference frame image RP after being subjected to the row interpolation processing by a correction coefficient. An adder adds the correction image RPC to the X-ray image XP, and produces an X-ray image XPC in which the line defect is corrected.

Abstract translation: 分箱读出将多个相邻像素行中的块中的以像素累积的电荷读出为信号线。 线缺陷校正器的校正图像生成器对通过合并读出输出的参考帧图像RP的图像尺寸进行放大，并校正参考帧图像RP的像素值，以产生用于校正线的校正图像RPC 在X射线图像XP中出现缺陷。 通过对参考帧图像RP应用行内插处理来执行放大。 像素值的校正是通过将进行行内插处理后的基准帧图像RP乘以校正系数来进行的。 加法器将校正图像RPC添加到X射线图像XP，并产生校正线缺陷的X射线图像XPC。

公开(公告)号：US07400704B1

公开(公告)日：2008-07-15

申请号：US11537806

申请日：2006-10-02

Applicant: Wenbing Yun ,  David Dean Scott ,  David R. Trapp ,  Frederick William Duewer ,  Yuxin Wang

Inventor： Wenbing Yun ,  David Dean Scott ,  David R. Trapp ,  Frederick William Duewer ,  Yuxin Wang

IPC: G01N23/20 ,  A61B6/08 ,  H05G1/00

CPC classification number: G01N23/04 ,  A61B6/508 ,  G01N2223/505 ,  G01N2223/6113

Abstract: A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especially in a proximity mode where the same is held in close proximity to the scintillator. In this case, a sample holder is provided that can rotate the sample. Further, a z-axis motion stage is also provided that is used to control distance between the sample and the scintillator.

Abstract translation: 基于投影的X射线成像系统结合了投影放大倍数和光学放大倍率，以便减轻源光斑尺寸的限制，同时提高成像系统的覆盖面和效率。 该系统使得样品的层析成像特别是在接近模式下，其中相邻的模式保持在闪烁体附近。 在这种情况下，提供可以旋转样品的样品架。 此外，还提供了用于控制样品和闪烁体之间的距离的z轴运动级。

公开(公告)号：US20080013683A1

公开(公告)日：2008-01-17

申请号：US11825638

申请日：2007-07-05

Applicant: Yuko Shinden ,  Hiromu Ohara

Inventor： Yuko Shinden ,  Hiromu Ohara

IPC: G01N23/04

CPC classification number: G01N23/04 ,  A61B6/484 ,  G01N2223/505

Abstract: An X-ray source, a test substance holding section and an image recording section are arranged and structured to conduct a phase contrast radiographing such that when R1 represents a distance (m) from a focal point of the X-ray source to the test substance held by the test substance holding section and R3 represents a distance (m) from the focal point of the X-ray source to the X-ray detector, a magnifying power M represented by the formula of (M=R3/R1) is from 10 to 40 and an X-ray arrival ratio of an amount of X-rays having arrived to the X-ray detector to an amount of the emitted X-rays is 45% or more.

Abstract translation: X射线源，测试物质保持部和图像记录部被布置和构造成进行相位对比放射照相，使得当R 1表示从X射线源的焦点到测试的距离（m） 由测试物质保持部分保持的物质和R 3表示从X射线源的焦点到X射线检测器的距离（m），由式（M = R 3 / R 1）为10〜40，已经到达X射线检测器的X射线量与发射的X射线量的X射线到达率为45％以上。

公开(公告)号：US20060027742A1

公开(公告)日：2006-02-09

申请号：US10617643

申请日：2003-07-11

Applicant: Alok Srivastava ,  Holly Comanzo ,  Charles Greskovich

Inventor： Alok Srivastava ,  Holly Comanzo ,  Charles Greskovich

IPC: G01V5/04

CPC classification number: G01N33/2823 ,  C09K11/628 ,  C09K11/673 ,  C09K11/676 ,  C09K11/7719 ,  C09K11/772 ,  C09K11/7774 ,  G01N23/22 ,  G01N2223/1013 ,  G01N2223/505 ,  G01N2223/616 ,  G21K4/00

Abstract: An aspect of the present invention is directed to a system for use in oil well drilling applications. The system includes a scintillator material having a cubic garnet host and praseodymium distributed within the host. The scintillator material emits ultraviolet radiation in response to stimulating gamma ray radiation. A radiation detector optically coupled to the scintillator detects the emitted ultraviolet radiation. Another aspect of the invention is a method for detecting oil. A radiation detector is optically coupled to a scintillator material having a cubic garnet host and praseodymium distributed within the host, wherein the praseodymium acts as an activator, and wherein the scintillator material emits ultraviolet radiation in response to stimulating gamma ray radiation. The detector and the scintillator material are lowered below the surface of the earth, and ultraviolet radiation emitted by the scintillator material in response to stimulating gamma ray radiation reflected by hydrogen bearing compounds indicating the presence of oil is detected by the detector.

Abstract translation: 本发明的一个方面涉及一种用于油井钻井应用的系统。 该系统包括具有分布在主机内的立方石榴石主体和镨的闪烁体材料。 闪烁体材料响应于刺激的γ射线辐射而发射紫外线。 与闪烁体光学耦合的放射线检测器检测发射的紫外线辐射。 本发明的另一方面是检测油的方法。 放射线检测器光学耦合到具有分布在主机内的立方石榴石主体和镨的闪烁体材料，其中镨作为激活剂，并且其中闪烁体材料响应于刺激的γ射线辐射而发射紫外线辐射。 检测器和闪烁体材料降低到地球表面以下，并且由检测器检测响应由表示油存在的含氢化合物反映的刺激性伽马射线辐射而由闪烁体材料发射的紫外线辐射。

公开(公告)号：US4841153A

公开(公告)日：1989-06-20

申请号：US225623

申请日：1988-07-27

Applicant: Malcolm R. Wormald

Inventor： Malcolm R. Wormald

IPC: G01N23/222 ,  G01T1/20 ,  G01V5/00

CPC classification number: G01T1/20 ,  G01N23/222 ,  G01V5/00 ,  G01N2223/0745 ,  G01N2223/501 ,  G01N2223/505 ,  G01N2223/5055 ,  G01N2223/616 ,  G01N2223/617

Abstract: An analysis method and system for analyzing coal or other material causes the material to be bombarded with neutrons from a source, and this generates gamma rays from the material which are detected by a detector. The detector has scintillators which generate light when a gamma ray is detected, the light being detected by photomultipliers. Each gamma ray generates two other gamma rays, which may both be wholly absorbed in one or the other scintillator, or one absorbed in one scintillator and one in the other. By analyzing these events, the spectrum of gamma rays may be obtained, giving the composition of the material. One preferred detector has an array of scintillators and coincident gamma ray detection events in three adjacent scintillators detected by detecting if a primary scintillator detector event is coincident with detection events in the other two scintillators. For each detection event, one of the scintillators is selected as a primary scintillator, and two other scintillators, on opposite sides of the primary scintillator, are selected. The detection event in the selected primary scintillator is compared with the detection events in the two other selected scintillators to determine coincidence. In another embodiment, two gamma detectors of differing properties are used, with each detector having a plurality of scintillators. Coincident events are detected in one detector and anticoincident events in the other.

Abstract translation: 用于分析煤或其他材料的分析方法和系统使得材料被来自源的中子轰击，并且这产生由检测器检测到的材料的γ射线。 检测器具有当检测到伽马射线时产生光的闪烁体，光被光电倍增管检测。 每个伽马射线产生两个其他伽马射线，其可以完全吸收在一个或另一个闪烁体中，或者一个被吸收在一个闪烁体中，另一个在另一个中。 通过分析这些事件，可以获得伽马射线的光谱，给出材料的组成。 一个优选的检测器具有通过检测主闪烁体检测器事件是否与另外两个闪烁体中的检测事件一致的三个相邻闪烁体中的闪烁体阵列和一致的γ射线检测事件。 对于每个检测事件，选择闪烁体中的一个作为主闪烁体，并且选择在主闪烁体的相对侧上的另外两个闪烁体。 将选择的主闪烁体中的检测事件与两个其它选择的闪烁体中的检测事件进行比较以确定重合。 在另一个实施例中，使用具有不同性质的两个伽马检测器，每个检测器具有多个闪烁器。 在一个检测器中检测到重合事件，另一个检测到反紧致事件。

公开(公告)号：US20240319116A1

公开(公告)日：2024-09-26

申请号：US18578029

申请日：2022-03-31

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Haruki SUZUKI ,  Masahiro KAMIYA ,  Yukinobu SUGIYAMA ,  Naonori HOSOYA ,  Hidetoshi YOSHIMURA

IPC: G01N23/04 ,  G01N23/083 ,  H04N25/30

CPC classification number: G01N23/04 ,  G01N23/083 ,  H04N25/30 ,  G01N2223/3307 ,  G01N2223/505

Abstract: An X-ray image acquisition device includes a pixel unit having M pixel arrays each including N pixel portions (N and M are integers of 2 or more), M circuit units, and a control unit. Each circuit unit includes T (T is an integer of N or more) adding sections that sequentially add electrical signals corresponding to output signals from the N pixel portions and a switch section for switching connection states between the N pixel portions and the T adding sections. The control unit switches the connection states in synchronization with the transportation of an object along a first direction so that the electrical signals corresponding to the output signals output from the pixel portions by detecting X-rays transmitted through the same region of the object are added by the same adding sections.

公开(公告)号：US20230343549A1

公开(公告)日：2023-10-26

申请号：US18027191

申请日：2021-10-26

Applicant: Hitachi High-Tech Corporation

Inventor： Masahiro FUKUTA ,  Tomoyo SASAKI ,  Makoto SUZUKI ,  Masashi WADA ,  Hiroshi NISHIHAMA

IPC: H01J37/147 ,  G01N23/2251 ,  H01J37/10 ,  H01J37/244 ,  H01J37/28

CPC classification number: H01J37/244 ,  G01N23/2251 ,  H01J37/10 ,  H01J37/1474 ,  H01J37/28 ,  G01N2223/505 ,  H01J2237/0492 ,  H01J2237/2443 ,  H01J2237/24495

Abstract: The present invention overcomes a trade-off between throughput, SNR, and spatial resolution in a charged particle beam device. Accordingly, a computer 18 sets at least one of a charged particle optical system and a detection system so as to modulate the intensity of signal charged particles or an electromagnetic wave detected by a detector 12 at a prescribed frequency. The charged particle optical system scans a specimen with a charged particle beam. The computer 18 generates an image or a signal profile by associating an irradiation position of the charged particle beam with a DC component of a signal acquired through synchronous detection of a detection signal from the detector at the irradiation position with a reference signal having a prescribed frequency.

公开(公告)号：US20230314347A1

公开(公告)日：2023-10-05

申请号：US18194002

申请日：2023-03-31

Applicant: Viken Detection Corporation

Inventor： James P. Ryan ,  Lane Marsden ,  Peter J. Rothschild

IPC: G01N23/20008 ,  G01N23/203 ,  G01N23/04 ,  G01N23/083

CPC classification number: G01N23/20008 ,  G01N23/203 ,  G01N23/04 ,  G01N23/083 ,  G01N2223/505 ,  G01N2223/33

Abstract: A handheld or portable x-ray imaging system includes a housing containing an x-ray source for generating a sweeping beam, and an external detector panel mounted onto a positioning arm to allow an operator to position the external detector panel relative to the housing. The detector panel may have a width of between 1 inch and 18 inches. Embodiments allow for portable x-ray scanning in locations that can otherwise be difficult or impossible to reach with existing handheld detectors.

公开(公告)号：US20230258580A1

公开(公告)日：2023-08-17

申请号：US18025215

申请日：2021-08-10

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Tetsuya TAKA ,  Toshiyasu SUYAMA

IPC: G01N23/04 ,  G01N23/083

CPC classification number: G01N23/04 ,  G01N23/083 ,  G01N2223/505 ,  G01N2223/643

Abstract: An imaging unit includes a housing having an entrance window that allows radiation transmitted through an object to pass through, a scintillator having an input surface to which radiation passing through the entrance window is input, and a line scan sensor having an imaging surface that captures an image of scintillation light output from the input surface. The imaging unit further includes a slit member placed between the entrance window and the scintillator and configured to guide radiation passing through the entrance window toward the input surface and a 1X lens placed between the scintillator and the line scan sensor and configured to form scintillation light output from the input surface into an image on the imaging surface of the line scan sensor.

公开(公告)号：US11694873B2

公开(公告)日：2023-07-04

申请号：US17962915

申请日：2022-10-10

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Yoshifumi Sekiguchi ,  Shin Imamura ,  Shunsuke Mizutani ,  Shahedul Hoque ,  Uki Ikeda

IPC: H01J37/244 ,  G01N23/2251 ,  G02B6/42

CPC classification number: H01J37/244 ,  G01N23/2251 ,  G02B6/4214 ,  G01N2223/07 ,  G01N2223/418 ,  G01N2223/505 ,  G01N2223/507

Abstract: A charged particle beam apparatus using a light guide that improves light utilization efficiency includes a detector including a scintillator for emitting light when a charged particle is incident, a light receiving element, and a light guide for guiding the light from the scintillator to the light receiving element. The light guide includes: an incident surface that faces a light emitting surface of the scintillator and to which the light emitted by the scintillator is incident; an emitting surface that is configured to emit light; and a reflecting surface that is inclined with respect to the incident surface so that the light from the incident surface is reflected toward the emitting surface. The emitting surface is smaller than the incident surface. A slope surface is provided between the incident surface and the emitting surface, faces the reflecting surface, and is inclined with respect to the incident surface.