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公开(公告)号：US09759584B2
公开(公告)日：2017-09-12
申请号：US14978419
申请日：2015-12-22
Applicant: MITUTOYO CORPORATION
Inventor： Yoshiaki Kato
CPC classification number: G01D5/34746 , G01D5/24438
Abstract: In a scale, a reference detection pattern and a displacement detection pattern are formed. A detection head outputs a reference detection signal, a phase compensation signal, and a displacement detection signal. A signal processing unit generates a reference signal by amplifying one or both of the phase compensation signal and the reference detection signal and adding up them, and detects a position of the detection head relative to the scale. A combined light receiving grating includes a reference detection light receiving grating and a phase compensation light receiving grating disposed so as to be shifted from the reference detection light receiving grating in the measurement direction. A combined light receiving element includes a reference detection light receiving element configured to output the reference detection signal and a phase compensation light receiving element configured to output the phase compensation signal.
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公开(公告)号：US20170248402A1
公开(公告)日：2017-08-31
申请号：US15440280
申请日：2017-02-23
Applicant: MITUTOYO CORPORATION
Inventor： Satoshi KOGA , Akinori SAITO , Hiroyuki KANAMORI , Yutaka KURIYAMA , Nobuhiro ISHIKAWA
IPC: G01B7/012
Abstract: A measuring probe includes two supporting members, each having a rotationally symmetric shape and allowing for an attitude change of a stylus, in an axial direction of a probe housing. Four detection elements are disposed at fourfold symmetric positions in one of the two supporting members that includes four deformable arm parts. A signal processing circuit includes a first processing part that processes outputs of the detection elements to output three displacement signals representing displacement components of a contact part in mutually perpendicular three directions, respectively. The measuring probe capable of reducing measurement directional dependency of sensitivity with a simple configuration while maintaining high sensitivity is thus provided.
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193.发明申请公开(公告)号：US20170241767A1
公开(公告)日：2017-08-24
申请号：US15433508
申请日：2017-02-15
Applicant: Mitutoyo Corporation
Inventor： Kaoru Miyata
CPC classification number: G01B11/002 , G06K9/2036 , G06K9/4604 , G06K9/4661 , G06K9/52 , G06K9/6215 , G06T7/521 , G06T7/73
Abstract: The geometry measurement apparatus includes: an image acquisition part that acquires a plurality of captured images generated by imaging an object to be measured, onto which a plurality of respectively different projection patterns are sequentially projected; a quantization part that generates a quantization value of a luminance value for each pixel in the plurality of captured images by comparing the luminance value with a predetermined reference value; a selection part that selects, based on the relationship between the reference value and the luminance value for a plurality of pixels having the same coordinates in the plurality of captured images, a quantization value to be used for identifying the geometry of the object to be measured, from among a plurality of quantization values corresponding to the plurality of captured images; and a geometry identification part that identifies the geometry of the object to be measured based on the quantization value selected by the selection part.
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公开(公告)号：US09736355B1
公开(公告)日：2017-08-15
申请号：US15145682
申请日：2016-05-03
Applicant: Mitutoyo Corporation
Inventor： Robert Kamil Bryll
CPC classification number: H04N5/23212 , G02B7/04 , G02F2001/294
Abstract: A variable focal length (VFL) lens system is utilized to determine surface Z-height measurements of imaged surfaces. A controller of the system is configured to control a VFL lens (e.g., a tunable acoustic gradient index of refraction lens) to periodically modulate its optical power and thereby periodically modulate a focus position at a first operating frequency, wherein the periodically modulated VFL lens optical power defines a first periodic modulation phase. A phase timing signal is synchronized with a periodic signal in the controller that has the first operating frequency and that has a second periodic modulation phase that has a phase offset relative to the first periodic modulation phase. A phase offset compensating portion is configured to perform a phase offset compensating process that provides Z-height measurements, wherein at least one of Z-height errors or Z-height variations that are related to a phase offset contribution are at least partially eliminated.
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195.发明授权公开(公告)号：US09726876B2
公开(公告)日：2017-08-08
申请号：US14092862
申请日：2013-11-27
Applicant: Mitutoyo Corporation
Inventor： Robert Kamil Bryll
CPC classification number: G02B21/367 , G02B21/241 , G02B21/361 , G02B27/0075
Abstract: A method for operating an imaging system of a machine vision inspection system to provide an extended depth of field (EDOF) image. The method comprises (a) placing a workpiece in a field of view; (b) periodically modulating a focus position of the imaging system without macroscopically adjusting the spacing between elements in the imaging system, the focus position is periodically modulated over a plurality of positions along a focus axis direction in a focus range including a workpiece surface height; (c) exposing a first preliminary image during an image integration time while modulating the focus position in the focus range; and (d) processing the first preliminary image to remove blurred image contributions occurring in the focus range during the image integration time to provide an EDOF image that is focused throughout a larger depth of field than the imaging system provides at a single focal position.
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Patent Agency Ranking
公开(公告)号：US09719779B2
公开(公告)日：2017-08-01
申请号：US14929588
申请日：2015-11-02
Applicant: MITUTOYO CORPORATION
Inventor： Nobuhiro Ishikawa , Hideyuki Nakagawa
CPC classification number: G01B21/045
Abstract: A form measuring machine includes: a scanning probe including a stylus with a tip ball and a probe body attached with the stylus; a movable slider supporting the scanning probe; a scale detecting a slider displacement of the slider; a tip ball displacement detector detecting a tip ball displacement of the tip ball; and an arithmetic unit calculating a measurement value based on the slider displacement, the tip ball displacement and a correction filter and comprising a correction filter setting section that: calculates a correction matrix diagonal component from the slider displacement and the tip ball displacement detected by calibration of the scanning probe; and calculates a correction factor of the correction filter from the correction matrix diagonal component to set the correction filter.
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公开(公告)号：US09689715B2
公开(公告)日：2017-06-27
申请号：US14716760
申请日：2015-05-19
Applicant: Mitutoyo Corporation
CPC classification number: G01D5/3473 , G01D5/347 , G01D5/34707 , G01D5/34715 , G01D5/34792 , G01D5/38
Abstract: A light source array used in illumination portions for optical encoders comprising an illumination portion, a scale grating extending along a measuring direction and receiving light from the illumination portion, and a detector configuration. The light source array comprises individual sources arranged in a grid pattern and coinciding with two transverse sets of parallel grid pattern lines that have two different grid line pitches between their parallel lines. Different instances of the light source array may be mounted with different rotational orientations about an axis normal to the grid pattern, for use in different illumination portions adapted for use with respective scale gratings having different grating pitches along the measuring axis direction. By using the different respective rotational orientations, the individual sources are aligned along respective illumination source lines that are spaced apart by different respective illumination source line pitches along the measuring axis direction.
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公开(公告)号：US20170167840A1
公开(公告)日：2017-06-15
申请号：US15344874
申请日：2016-11-07
Applicant: MITUTOYO CORPORATION
Inventor： Makoto FURUTA
CPC classification number: G01B3/004 , G01B5/20 , G01B21/047 , G01B2003/1064
Abstract: A measuring device which reduces reading errors caused by parallax. The measuring device has a gauge head abutting against an object to be measured, and includes a pointer-type display part which displays displacement of the gauge head obtained by being enlarged by an enlarging mechanism and being converted into a rotation amount of a pointer. The measuring device further includes a transparent cover plate provided so as to cover the pointer-type display part, and the cover plate has an antireflection film on the surface. The cover plate further has an antifouling film on the antireflection film. The cover plate has a flat surface.
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公开(公告)号：US09631915B2
公开(公告)日：2017-04-25
申请号：US14523138
申请日：2014-10-24
Applicant: MITUTOYO CORPORATION
Inventor： Tomonori Goto
CPC classification number: G01B5/008 , G01B21/045
Abstract: An arm type three-dimensional measuring machine includes: a multi-jointed arm mechanism comprising a probe in a distal end; a processing part for computing a position of said probe; and an inclinometer configured to detect an inclination amount of a base part from a vertical direction in the base part for supporting the multi-jointed arm mechanism, wherein the processing part computes a position of the probe using the base part as a criterion and corrects the position of the probe using the base part as the criterion in a time-series manner based on an output from the inclinometer.
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公开(公告)号：USD784170S1
公开(公告)日：2017-04-18
申请号：US29554321
申请日：2016-02-10
Applicant: MITUTOYO CORPORATION
Designer： Shuichi Kamiyama , Yoshinosuke Murai , Yu Sugai , Shigeru Ohtani
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