Methods and systems for determining the average atomic number and mass of materials
    211.
    发明授权
    Methods and systems for determining the average atomic number and mass of materials 有权
    用于确定材料的平均原子数和质量的方法和系统

    公开(公告)号:US08041007B2

    公开(公告)日:2011-10-18

    申请号:US12578956

    申请日:2009-10-14

    CPC classification number: G01N23/20 G01N23/04 G01N23/20083 G01N23/201

    Abstract: Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.

    Abstract translation: 本文公开了使用从目标散射的光子的能谱对潜在威胁进行扫描的方法和系统,以确定目标中平均原子数和/或质量的空间分布。 一种示例性方法包括:用光子束照射目标的多个体素中的每一个; 确定每个体素的入射通量; 测量从体素散射的光子的能谱; 使用能谱确定体素中的平均原子数; 并且使用入射磁通量确定体素中的质量,体素中的材料的平均原子数,能谱和对应于体素的散射核。 示例性系统可以使用威胁检测启发式来确定是否基于体素的平均原子数和/或质量触发进一步的动作。

    Vertical/horizontal small angle X-ray scattering apparatus and method for measuring small angle X-ray scattering
    212.
    发明授权
    Vertical/horizontal small angle X-ray scattering apparatus and method for measuring small angle X-ray scattering 有权
    垂直/水平小角度X射线散射装置及测量小角度X射线散射的方法

    公开(公告)号:US08000444B2

    公开(公告)日:2011-08-16

    申请号:US12064990

    申请日:2006-07-04

    Applicant: Yoshio Iwasaki

    Inventor: Yoshio Iwasaki

    CPC classification number: G01N23/201

    Abstract: A vertical/horizontal small angle X-ray scattering apparatus, for enabling plural numbers of X-ray diffraction measurements, such as, transmission small angle X-ray diffraction, reflection small angle scattered X-ray diffraction, and in-plane X-ray diffraction, etc., comprises an X-ray generating apparatus 11 for generating X-ray, an optic system 16 for forming the X-ray into a predetermined incident beam of X-ray, a sample holder portion 120 for mounting a sample to be measured thereon, to irradiate the incident beam of X-ray thereupon, a vacuum path 17 for passing through small angle scattered X-ray from the sample, and an X-ray detector 18 for detecting the small angle scattered X-ray passing through the vacuum path, wherein the sample holder portion is fixed on a support base 110, while attaching the X-ray generating apparatus, the optic system, the vacuum path and the X-ray detector on a bench 100, as well, to be rotatable around the sample holder portion, and thereby enabling plural numbers of measurements of small angle X-ray scattering.

    Abstract translation: 一种垂直/水平小角度X射线散射装置,用于实现多个X射线衍射测量,例如透射小角度X射线衍射,反射小角度散射X射线衍射和面内X射线 衍射等包括用于产生X射线的X射线产生装置11,用于将X射线形成为X射线的预定入射光束的光学系统16,用于安装样品的样品保持器部分120 在其上测量用于照射X射线的入射光束,用于通过来自样品的小角度散射X射线的真空通路17,以及用于检测通过该X射线的小角散射X射线的X射线检测器18 真空路径,其中样品保持器部分固定在支撑基座110上,同时将台架100上的X射线产生装置,光学系统,真空通路和X射线检测器安装在可旋转的位置 样品保持器部分,从而使得plu 小角度X射线散射的测量值。

    Measuring momentum for charged particle tomography
    214.
    发明授权
    Measuring momentum for charged particle tomography 有权
    测量带电粒子层析成像的动量

    公开(公告)号:US07838841B2

    公开(公告)日:2010-11-23

    申请号:US11977410

    申请日:2007-10-24

    CPC classification number: G01N23/201 G01N23/20 G01V5/0025 G01V5/0075 G06F17/18

    Abstract: Methods, apparatus and systems for detecting charged particles and obtaining tomography of a volume by measuring charged particles including measuring the momentum of a charged particle passing through a charged particle detector. Sets of position sensitive detectors measure scattering of the charged particle. The position sensitive detectors having sufficient mass to cause the charged particle passing through the position sensitive detectors to scatter in the position sensitive detectors. A controller can be adapted and arranged to receive scattering measurements of the charged particle from the charged particle detector, determine at least one trajectory of the charged particle from the measured scattering; and determine at least one momentum measurement of the charged particle from the at least one trajectory. The charged particle can be a cosmic ray-produced charged particle, such as a cosmic ray-produced muon. The position sensitive detectors can be drift cells, such as gas-filled drift tubes.

    Abstract translation: 用于检测带电粒子的方法,装置和系统,并通过测量带电粒子来测量体积的断层摄影,包括测量通过带电粒子检测器的带电粒子的动量。 位置敏感检测器的集合测量带电粒子的散射。 位置敏感检测器具有足够的质量以使带电粒子通过位置敏感检测器散射在位置敏感检测器中。 控制器可以被适配和布置成从带电粒子检测器接收带电粒子的散射测量,从测量的散射中确定带电粒子的至少一个轨迹; 并且从所述至少一个轨迹确定所述带电粒子的至少一个动量测量。 带电粒子可以是宇宙射线产生的带电粒子,例如宇宙射线产生的μ子。 位置敏感检测器可以是漂移电池,例如充气漂移管。

    Particle Detection and Applications in Security and Portal Monitoring
    215.
    发明申请
    Particle Detection and Applications in Security and Portal Monitoring 有权
    安全和门户监控中的粒子检测和应用

    公开(公告)号:US20100032564A1

    公开(公告)日:2010-02-11

    申请号:US12447459

    申请日:2007-10-26

    CPC classification number: G01N23/201 G01N23/20 G01V5/0025 G01V5/0075 G06F17/18

    Abstract: Techniques, apparatus and systems for detecting particles such as muons. In one implementation, a monitoring system has a cosmic ray-produced charged particle tracker with a plurality of drift cells. The drift cells, which can be for example aluminum drift tubes, can be arranged at least above and below a volume to be scanned to thereby track incoming and outgoing charged particles, such as cosmic ray-produced muons, whilst also detecting gamma rays. The system can selectively detect devices or materials, such as iron, lead, gold and/or tungsten, occupying the volume from multiple scattering of the charged particles passing through the volume and can also detect any radioactive sources occupying the volume from gamma rays emitted therefrom. If necessary, the drift tubes can be sealed to eliminate the need for a gas handling system. The system can be employed to inspect occupied vehicles at border crossings for nuclear threat objects.

    Abstract translation: 用于检测诸如μ子之类的颗粒的技术,装置和系统。 在一个实现中,监视系统具有带有多个漂移单元的宇宙射线产生的带电粒子跟踪器。 可以将漂移电池(例如铝漂移管)布置在待扫描的体积的至少上方和下方,从而跟踪进入和离开的带电粒子,例如宇宙射线产生的μ子,同时还检测伽马射线。 该系统可以选择性地检测诸如铁,铅,金和/或钨的装置或材料,其占据通过该体积的带电粒子的多次散射的体积,并且还可以检测占据从其发射的γ射线的体积的任何放射源 。 如有必要,漂移管可以被密封,以消除对气体处理系统的需要。 该系统可用于检查过境点的被占用车辆的核威胁物体。

    METHODS AND SYSTEMS FOR DETERMINING THE AVERAGE ATOMIC NUMBER AND MASS OF MATERIALS
    216.
    发明申请
    METHODS AND SYSTEMS FOR DETERMINING THE AVERAGE ATOMIC NUMBER AND MASS OF MATERIALS 有权
    用于确定平均原子数和材料质量的方法和系统

    公开(公告)号:US20100027749A1

    公开(公告)日:2010-02-04

    申请号:US12578956

    申请日:2009-10-14

    CPC classification number: G01N23/20 G01N23/04 G01N23/20083 G01N23/201

    Abstract: Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.

    Abstract translation: 本文公开了使用从目标散射的光子的能谱对潜在威胁进行扫描的方法和系统,以确定目标中平均原子数和/或质量的空间分布。 一种示例性方法包括:用光子束照射目标的多个体素中的每一个; 确定每个体素的入射通量; 测量从体素散射的光子的能谱; 使用能谱确定体素中的平均原子数; 并且使用入射磁通量确定体素中的质量,体素中的材料的平均原子数,能谱和对应于体素的散射核。 示例性系统可以使用威胁检测启发式来确定是否基于体素的平均原子数和/或质量触发进一步的动作。

    Automated selection of X-ray reflectometry measurement locations
    217.
    发明授权
    Automated selection of X-ray reflectometry measurement locations 有权
    自动选择X射线反射测量位置

    公开(公告)号:US07649978B2

    公开(公告)日:2010-01-19

    申请号:US12232259

    申请日:2008-09-12

    CPC classification number: G01N23/201 G01N2223/052

    Abstract: The computer-implemented method for inspection of a sample includes defining a plurality of locations on a surface of the sample, irradiating the surface at each of the locations with a beam of X-rays, and measuring an angular distribution of the X-rays that are emitted from the surface responsively to the beam, so as to produce a respective plurality of X-ray spectra. The X-ray spectra are analyzed to produce respective figures-of-merit indicative of a measurement quality of the X-ray spectra at the respective location. One or more locations are selected out of the plurality of locations responsively to the figures-of-merit, and a property of the sample is estimated using the X-ray spectra measured at the selected location.

    Abstract translation: 用于检查样品的计算机实现的方法包括在样品的表面上限定多个位置,用X射线照射每个位置处的表面,并测量X射线的角度分布, 响应于光束从表面发射,以产生相应的多个X射线光谱。 分析X射线光谱以产生各自的相应的品质因数,表明在相应位置处的X射线光谱的测量质量。 响应于品质因数从多个位置中选择一个或多个位置,并且使用在所选择的位置处测量的X射线光谱来估计样品的性质。

    X-ray diffraction equipment for X-ray scattering
    218.
    发明授权
    X-ray diffraction equipment for X-ray scattering 有权
    用于X射线散射的X射线衍射设备

    公开(公告)号:US07542547B2

    公开(公告)日:2009-06-02

    申请号:US12014437

    申请日:2008-01-15

    Applicant: Vladimir Kogan

    Inventor: Vladimir Kogan

    CPC classification number: G01N23/20025 G01N23/201 G01N23/207

    Abstract: An X-ray scattering chamber 12 includes a housing 14 that may be mounted in X-ray diffraction equipment between an X-ray source 2 and an X-ray detector 4, for example on goniometer arm 6. The housing 14 includes sample holder 16 and beam conditioning optics 22,24, but the system also makes use of primary optics 10 outside the housing. The equipment is suitable for SAXS and/or SAXS-WAXS.

    Abstract translation: X射线散射室12包括壳体14,其可以安装在X射线衍射设备之间,例如在测角器臂6上的X射线源2和X射线检测器4之间。壳体14包括样品保持器16 和光束调节光学器件22,24,但是该系统还利用壳体外的主要光学器件10。 该设备适用于SAXS和/或SAXS-WAXS。

    Coherent-Scatter Computer Tomograph
    219.
    发明申请
    Coherent-Scatter Computer Tomograph 失效
    相干散射计算机断层扫描仪

    公开(公告)号:US20080285706A1

    公开(公告)日:2008-11-20

    申请号:US11569806

    申请日:2005-06-01

    CPC classification number: A61B6/032 A61B6/06 A61B6/4291 A61B6/483 G01N23/201

    Abstract: Conventional CSCT may require a complex reconstruction involving a large number of calculations. According to an exemplary embodiment of the present invention, additional collimators are used in combination with energy revolving detectors, which may allow that a CSCT image may be reconstructed by a simple superposition of images obtained from different viewing angles in a direct tomography data acquisition scheme. Advantageously, a reconstruction may be avoided. Advantageously, this may allow for an improved image quality while reducing an amount of calculations required for generating the output image.

    Abstract translation: 常规CSCT可能需要涉及大量计算的复杂重构。 根据本发明的示例性实施例,附加的准直器与能量循环检测器组合使用,这可以允许通过在直接层析成像数据采集方案中从不同视角获得的图像的简单叠加来重构CSCT图像。 有利地,可以避免重建。 有利地,这可以允许改善图像质量,同时减少生成输出图像所需的计算量。

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