摘要:
The present invention provides a thin-film transistor substrate comprising: a gate electrode 40 and a gate insulating film 41 formed on a substrate 36; a semiconductor active film 42 oppositely provided on the gate electrode via the gate insulating film; a pair of ohmic contact films 43 and 44 separately provided on the semiconductor active film; a low-resistance silicon compound film 45 ranging from the ohmic contact films to the gate insulating film so as to cover the ohmic contact films and the portions of the semiconductor active film superposing with the ohmic contact films; and a source electrode 46 and a drain electrode 48 provided on the low-resistance silicon compound film.
摘要:
The present invention provides a thin-film transistor substrate comprising: a gate electrode 40 and a gate insulating film 41 formed on a substrate 36; a semiconductor active film 42 oppositely provided on the gate electrode via the gate insulating film; a pair of ohmic contact films 43 and 44 separately provided on the semiconductor active film; a low-resistance silicon compound film 45 ranging from the ohmic contact films to the gate insulating film so as to cover the ohmic contact films and the portions of the semiconductor active film superposing with the ohmic contact films; and a source electrode 46 and a drain electrode 48 provided on the low-resistance silicon compound film.
摘要:
A source line is directly connected to a source terminal composed of indium zinc oxide in a thin-film transistor substrate. A gate line is directly connected to a gate terminal composed of indium zinc oxide. Alternatively, drain electrodes of thin-film transistors for switching a plurality of pixel electrodes are directly connected to pixel electrodes composed of indium zinc oxide. These configurations do not require a passivation film which is essential for conventional thin-film transistor substrates, and the resulting thin-film transistor substrate can be made by a reduced number of manufacturing steps.
摘要:
A liquid crystal display unit has wider viewing angles and a brighter display. In this display unit, an alignment film is not required to be processed for alignment of a liquid crystal, thereby simplifying the manufacturing process. A first substrate and a second substrate are disposed such that they face each other. A liquid crystal having a negative anisotropy of dielectric constant is provided between the substrates. A common electrode and an alignment film which has a pretilt angle of 90°±1° and which is not rubbed are sequentially disposed on the surface of the first substrate facing the second substrate. A plurality of pixel electrodes are provided on the surface of the second substrate facing the first substrate so as to cover a display area of the liquid crystal. A conductive light-shielding member is disposed on the second substrate and positioned around each of the pixel electrodes in a non-display area of the liquid crystal. The conductive light-shielding member is electrically insulated from the pixel electrode. An alignment film which has a pretilt angle of 90°±1° and which is not rubbed is formed on the pixel electrodes and on the light-shielding members. The conductive light-shielding member is set at substantially the same potential as the common electrode.
摘要:
The invention intends to provide a TFT having a gate insulating film which has a high dielectric withstand voltage and can ensure a desired carrier mobility in an adjacent semiconductor active film. A gate electrode and a semiconductor active film are formed on a transparent substrate with a gate insulating film, which is formed of two layered insulating films, held between them. The gate insulating film is made up of a first gate insulating film which improves a withstand voltage between the gate electrode and the semiconductor active film, and a second gate insulating film which improves an interface characteristic between the gate insulating film and the semiconductor active film . The first and second gate insulating films are each formed of a SiNx film. The optical band gap of the first gate insulating film has a value in the range of 3.0 to 4.5 eV, and the optical band gap of the second gate insulating film has a value in the range of 5.0 to 5.3 eV.
摘要:
A method of manufacturing a thin film transistor comprising the steps of: forming a gate electrode on the surface of a substrate; forming a gate insulation film covering the gate electrode; forming an active semiconductor layer and an ohmic contact layer on the gate insulation film; forming a source/drain electrode made of Cr; and removing a portion of the ohmic contact layer except for the portion in contact with the source/drain electrode by an etching solution, wherein the step of removing the ohmic contact layer is conducted in a state of at least partially or entirely peeling a resist on the source/drain electrode made of Cr.