Abstract:
An apparatus for testing setup/hold time includes a plurality of data input units, each configured to calibrate setup/hold time of input data in response to selection signals and setup/hold calibration signals, and an off-chip driver calibration unit configured to generate the selection signals and the setup/hold calibration signals by using the input data input of one of the plurality of data input units.
Abstract:
A key switch device includes inner and outer link members connected to each other to mutually move in a scissors fashion, a key top having receiving portions for receiving the support protrusions provided at respective upper ends of the link members, a hollow elastic switch provided at an inner surface thereof with a downward protrusion for performing a switching operation in accordance with vertical movement of the key top, a support plate arranged beneath the key top, a membrane arranged on the support plate, and a mounting member arranged on the membrane, a central opening for receiving the elastic switch, and fitting holes allowing the cocking members to be fitted therein.
Abstract:
An integrated circuit includes a reference voltage level setting circuit and a reference voltage generation circuit. The reference voltage level setting circuit is configured to set a level of an input reference voltage to a preset level in a power-up period or a self-refresh mode. The reference voltage generation circuit is configured to select one of a plurality of reference voltages and output the selected reference voltage as the input reference voltage when the power-up period is ended and an operation mode is not in the self-refresh mode.
Abstract:
Disclosure relates to a board block for vehicles. A housing forms an outer appearance of the board block of the present invention. The housing includes a housing body and a housing cover. A interior space is formed in the housing body, and a first connection unit is formed at one side of an upper end of the housing body. The housing cover covers the upper end of the housing body and the first connection unit.
Abstract:
A method to divide a file or merge files using a file allocation table (FAT) in which the method to divide a file includes storing data of a first cluster, among data intended to be separated from the file, into a second cluster, and generating a first cluster chain and a second cluster chain using a file allocation table (FAT), the first cluster chain containing data remaining in the first cluster, and the second cluster containing data existing in the second cluster. As a result, time delay due to a file copy process and shortening of a lifespan of NAND flash are prevented, and a reserve capacity for editing purposes is minimized.
Abstract:
A voltage stabilization circuit of a semiconductor memory apparatus includes an operation speed detecting unit configured to detect an operation speed of the semiconductor memory apparatus to generate a detection signal, and a voltage line controlling unit configured to interconnect a first voltage line and a second voltage line in response to the detection signal.
Abstract:
An integrated circuit includes: a reference voltage generation unit configured to be driven in response to an enable signal, select one of a plurality of reference voltages generated by dividing a power supply voltage as an input reference voltage, and output the input reference voltage; and a reference voltage level compensation unit configured to be driven in response to the enable signal and change a level of the input reference voltage by an amount of change in a level of an external voltage.
Abstract:
A semiconductor memory apparatus according to the embodiment includes a test mode controller, a first data alignment unit, a decoder, a test executing unit and a second data alignment unit. The test mode controller is configured to generate test enable signals in response to a test mode setting signal and a read command. The first data alignment unit is configured to parallely align first input data that are input in series, generate first alignment data, and transmit it to the first data driver. The decoder is configured to decode the first alignment data in response to the test enable signal and generate the decoding signal. The test executing unit is configured to execute the preset test mode in response to the decoding signal. The second data alignment unit is configured to parallely align second input data, which are input in series, in response to the test enable signal, generate second alignment data, and transmit it to a second data driver.
Abstract:
An apparatus for testing setup/hold time includes a plurality of data input units, each configured to calibrate setup/hold time of input data in response to selection signals and setup/hold calibration signals, and an off-chip driver calibration unit configured to generate the selection signals and the setup/hold calibration signals by using the input data input of one of the plurality of data input units.