IMAGE SENSOR FOR HIGH-SPEED DATA READOUT
    21.
    发明申请
    IMAGE SENSOR FOR HIGH-SPEED DATA READOUT 有权
    用于高速数据读取的图像传感器

    公开(公告)号:US20090262229A1

    公开(公告)日:2009-10-22

    申请号:US12427214

    申请日:2009-04-21

    CPC classification number: H04N5/37455 G11C7/16

    Abstract: An image sensor for high-speed data readout is provided. The image sensor includes a line memory block temporarily storing a digital signal in unit of lines which is generated based on an analog signal output from a pixel array. The line memory block includes a plurality of line memories, a plurality of data line pairs respectively connecting the line memories to a sense amplifying unit, and a plurality of data line prechargers each including at least two precharge units separately connected with a corresponding one of the data line pairs to precharge the corresponding data line pair with a predetermined precharge voltage. Accordingly, the image sensor performs high-speed digital signal readout based on precharge operation of the data line prechargers.

    Abstract translation: 提供了用于高速数据读出的图像传感器。 该图像传感器包括一个行存储块,其临时存储基于从像素阵列输出的模拟信号产生的行单位的数字信号。 行存储块包括多个行存储器,分别将行存储器连接到读出放大单元的多个数据线对,以及多个数据线预充电器,每个数据线预充电器包括分别与相应的一个 数据线对以预定的预充电电压对相应的数据线对进行预充电。 因此,图像传感器基于数据线预充电器的预充电操作来执行高速数字信号读出。

    Lossless nonlinear analog gain controller in image sensor and manufacturing method thereof
    22.
    发明授权
    Lossless nonlinear analog gain controller in image sensor and manufacturing method thereof 有权
    图像传感器中的无损非线性模拟增益控制器及其制造方法

    公开(公告)号:US07379011B2

    公开(公告)日:2008-05-27

    申请号:US11508616

    申请日:2006-08-23

    CPC classification number: H03M1/58 H03M1/123 H03M1/56

    Abstract: An image sensor comprises an active pixel sensor (APS) array, a first analog-to-digital converter (ADC), and a ramp signal generator. The APS array has includes a plurality of pixels of arranged in a second order two-dimensional matrix, and wherein the APS array generates a reset signal and an image signal for each pixel of selected columns. The first ADC has includes correlated double sampling (CDS) circuits for each column of the APS array, and wherein the first ADC generates a digital code corresponding to the difference between the reset signal and the image signal using an output ramp signal that is applied to the CDS circuits for each column. The ramp generator generates the output ramp signal in which a low illumination portion and a high illumination portion have different slopes.

    Abstract translation: 图像传感器包括有源像素传感器(APS)阵列,第一模数转换器(ADC)和斜坡信号发生器。 APS阵列包括以二阶二维矩阵排列的多个像素,并且其中APS阵列为选定列的每个像素产生复位信号和图像信号。 第一ADC包括用于APS阵列的每列的相关双采样(CDS)电路,并且其中第一ADC使用输出斜坡信号产生与复位信号和图像信号之间的差相对应的数字码, 每列的CDS电路。 斜坡发生器产生输出斜坡信号,其中低照明部分和高照明部分具有不同的斜率。

    Electrostatic discharge protecting circuit having a plurality of current
paths in both directions
    24.
    发明授权
    Electrostatic discharge protecting circuit having a plurality of current paths in both directions 失效
    静电放电保护电路在两个方向上具有多个电流通路

    公开(公告)号:US5903420A

    公开(公告)日:1999-05-11

    申请号:US963238

    申请日:1997-11-03

    Applicant: Seog-Heon Ham

    Inventor: Seog-Heon Ham

    CPC classification number: H01L27/0259 H01L27/0251

    Abstract: An electrostatic discharge (ESD) protecting circuit for effectively discharging an overcurrent applied to a semiconductor circuit device, by providing a plurality of current paths. The ESD protecting circuit comprises a first discharging current path for discharging an overcurrent from the I/O pad to a first power supply, a second discharging current path for discharging the overcurrent from the I/O pad to a second power supply providing power for the internal circuit and a third discharging current path formed between the first power supply and the second power supply.

    Abstract translation: 一种静电放电(ESD)保护电路,用于通过提供多个电流路径来有效地放电施加到半导体电路器件的过电流。 ESD保护电路包括用于将来自I / O焊盘的过电流放电到第一电源的第一放电电流路径,用于将来自I / O焊盘的过电流放电到第二电源的第二放电电流路径, 内部电路和形成在第一电源和第二电源之间的第三放电电流路径。

    IMAGE SENSOR FOR IMPROVING LINEARITY OF ANALOG-TO-DIGITAL CONVERTER AND IMAGE PROCESSING SYSTEM INCLUDING THE SAME
    25.
    发明申请
    IMAGE SENSOR FOR IMPROVING LINEARITY OF ANALOG-TO-DIGITAL CONVERTER AND IMAGE PROCESSING SYSTEM INCLUDING THE SAME 审中-公开
    用于改进模拟数字转换器和包括其中的图像处理系统的线性的图像传感器

    公开(公告)号:US20160301891A1

    公开(公告)日:2016-10-13

    申请号:US15087043

    申请日:2016-03-31

    CPC classification number: H04N5/37455 H04N5/3658 H04N5/374 H04N5/378

    Abstract: An image sensor and an image processing system including the same are provided. The image sensor includes a pixel array including a plurality of pixels each connected to one of first through m-th column lines to output a pixel signal, where “m” is an integer of at least 2; analog-to-digital converters each configured to receive the pixel signal corresponding to one of the first through m-th column lines, to compare the pixel signal with a ramp signal, and to convert the pixel signal to a digital pixel signal; and a blocking circuit connected to an input terminal of at least one of the analog-to-digital converters to block an influence of an operation of others among the analog-to-digital converters.

    Abstract translation: 提供了一种图像传感器和包括该图像传感器的图像处理系统。 图像传感器包括像素阵列,其包括多个像素,每个像素连接到第一至第m列之一,以输出像素信号,其中“m”为至少2的整数; 模拟 - 数字转换器,每个被配置为接收对应于第一至第m列列之一的像素信号,以将像素信号与斜坡信号进行比较,并将像素信号转换为数字像素信号; 以及阻塞电路,其连接到所述模数转换器中的至少一个的输入端子,以阻止所述模数转换器中的其他操作的影响。

    Semiconductor device and method of manufacturing the same
    26.
    发明授权
    Semiconductor device and method of manufacturing the same 有权
    半导体装置及其制造方法

    公开(公告)号:US08809990B2

    公开(公告)日:2014-08-19

    申请号:US13611759

    申请日:2012-09-12

    Abstract: Provided are a semiconductor device including a high voltage transistor and a low voltage transistor and a method of manufacturing the same. The semiconductor device includes a semiconductor substrate including a high voltage region and a low voltage region; a high voltage transistor formed in the high voltage region and including a first active region, a first source/drain region, a first gate insulating layer, and a first gate electrode; and a low voltage transistor formed in the low voltage region and including a second active region, a second source/drain region, a second gate insulating layer, and a second gate electrode. The second source/drain region has a smaller thickness than a thickness of the first source/drain region.

    Abstract translation: 提供了包括高压晶体管和低压晶体管的半导体器件及其制造方法。 半导体器件包括:包括高电压区域和低电压区域的半导体衬底; 形成在高电压区域中并包括第一有源区,第一源极/漏极区,第一栅极绝缘层和第一栅电极的高压晶体管; 以及形成在所述低电压区域中并包括第二有源区,第二源极/漏极区,第二栅极绝缘层和第二栅电极的低电压晶体管。 第二源极/漏极区域的厚度小于第一源极/漏极区域的厚度。

    Pixel sensor array including comparator and image sensor including the same
    28.
    发明授权
    Pixel sensor array including comparator and image sensor including the same 有权
    像素传感器阵列包括比较器和图像传感器

    公开(公告)号:US08379127B2

    公开(公告)日:2013-02-19

    申请号:US12591039

    申请日:2009-11-05

    CPC classification number: H04N5/3745 H04N5/3741 H04N5/378

    Abstract: Provided are a pixel sensor array and a complementary metal-oxide semiconductor (CMOS) image sensor including the same. The pixel sensor array includes a photoelectric transformation element configured to generate electric charges in response to incident light. A signal transmitting circuit is configured to output the electric charges accumulated in the photoelectric transformation element to a first node based on a first control signal, change an electric potential of the first node to an electric potential of a second signal line based on a second control signal, and output a signal sensed in the first node to a first signal line based on a third control signal. A switch element is configured to connect a supply power terminal to the second signal line based on a fourth control signal. A comparator connected to the first signal line and the second signal line and configured to compare a voltage of the signal and a voltage of a reference signal.

    Abstract translation: 提供了一种像素传感器阵列和包括该像素传感器阵列的互补金属氧化物半导体(CMOS)图像传感器。 像素传感器阵列包括被配置为响应于入射光而产生电荷的光电转换元件。 信号发送电路被配置为基于第一控制信号将累积在光电变换元件中的电荷输出到第一节点,基于第二控制将第一节点的电位改变为第二信号线的电位 信号,并且基于第三控制信号将在第一节点中感测的信号输出到第一信号线。 开关元件被配置为基于第四控制信号将电源端子连接到第二信号线。 比较器,连接到第一信号线和第二信号线,并被配置为比较信号的电压和参考信号的电压。

    Two-path sigma-delta analog-to-digital converter and image sensor including the same
    29.
    发明授权
    Two-path sigma-delta analog-to-digital converter and image sensor including the same 有权
    包括两路Σ-Δ模数转换器和图像传感器

    公开(公告)号:US08300116B2

    公开(公告)日:2012-10-30

    申请号:US12656577

    申请日:2010-02-04

    CPC classification number: H04N5/335 H03M3/474 H04N5/378

    Abstract: A two-path sigma-delta analog-to-digital converter and an image sensor including the same are provided. The two-path sigma-delta analog-to-digital converter includes at least one integrator configured to integrate a first integrator input signal during a second half cycle of a clock signal and integrate a second integrator input signal during a first half cycle of the clock signal by using a single operational amplifier; a quantizer configured to quantize integrated signals from the at least one integrator and output a first digital signal and a second digital signal; and a feedback loop configured to feed back the first and second digital signals to an input of the at least one integrator. A first analog signal and a second analog signal respectively input from two input paths are respectively converted to the first and second digital signals using the single operational amplifier, thereby increasing power efficiency and reducing an area.

    Abstract translation: 提供了一个双通道Σ-Δ模数转换器和包括它的图像传感器。 双通道Σ-Δ模数转换器包括至少一个积分器,其被配置为在时钟信号的第二半周期期间积分第一积分器输入信号,并且在时钟的前半周期期间积分第二积分器输入信号 信号通过使用单个运算放大器; 量化器,被配置为量化来自所述至少一个积分器的积分信号并输出​​第一数字信号和第二数字信号; 以及反馈回路,其被配置为将所述第一和第二数字信号反馈到所述至少一个积分器的输入。 分别从两个输入路径输入的第一模拟信号和第二模拟信号分别使用单个运算放大器转换为第一和第二数字信号,从而提高功率效率并缩小面积。

    Analog-to-digital conversion and implementations thereof
    30.
    发明授权
    Analog-to-digital conversion and implementations thereof 有权
    模数转换及其实现

    公开(公告)号:US08203477B2

    公开(公告)日:2012-06-19

    申请号:US12662449

    申请日:2010-04-19

    CPC classification number: H03M1/1225 H03M1/144 H03M1/56

    Abstract: In one embodiment, an analog-to-digital converter (ADC) includes a comparator and a supply circuit. The comparator is configured to compare an input signal to a reference signal. The supply circuit is configured to supply the reference signal. The supply circuit is configured to provide different circuit configurations for supplying the reference signal during different stages of analog-to-digital conversion such that the reference signal is scaled in substantially a same manner during at least two of the stages.

    Abstract translation: 在一个实施例中,模数转换器(ADC)包括比较器和电源电路。 比较器被配置为将输入信号与参考信号进行比较。 供电电路被配置为提供参考信号。 供电电路被配置为提供不同的电路配置,用于在模数转换的不同阶段期间提供参考信号,使得参考信号在至少两个阶段期间以基本上相同的方式缩放。

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