摘要:
A voltage droop monitoring and correcting circuit for a microprocessor includes: a monitor circuit configured to monitor voltage droops of the microprocessor and perform a temporary clock-skipping technique to compensate for the voltage droops. A method for monitoring and correcting voltage droops of a microprocessor includes: monitoring voltage droops of the microprocessor; and performing a temporary clock-skipping technique to compensate for the voltage droops. A computer system includes memory; a processor operatively connected to the memory; and computer-readable instructions stored in the memory for causing the processor to: monitor voltage droops of the microprocessor; and perform a temporary clock-skipping technique to compensate for the voltage droops.
摘要:
A capacitor structure in a semiconductor device is provided. The capacitor structure includes a first power rail on a topmost level of the semiconductor device, and a second power rail on the topmost level of the semiconductor device. The capacitor structure also includes a dielectric layer disposed over at least a portion of one of the first power rail and the second power rail. The capacitor structure further includes a conductive layer disposed over and between the first power rail and the second power rail where the conductive layer is in electrical contact with the power rail not having the dielectric layer, and the conductive layer is disposed over the dielectric layer.
摘要:
A method and apparatus for assigning a set of region-based voltage drop budgets to an integrated circuit is provided. Further, a method for partitioning an integrated circuit into optimal voltage drop regions includes analyzing the integrated circuit for worst-case voltage drop data. The worst-case voltage drop data is used to partition the integrated circuit into a set of voltage drop regions, wherein each voltage drop region is assigned a region-based voltage drop budget. The region-based voltage drop budget assigned to a particular voltage drop region is based on a worst-case voltage drop experienced by that voltage drop region.
摘要:
A device that uses an input clock signal to generate an output clock signal with a desired frequency is provided. The device uses a voltage controlled delay element that outputs a reset signal to a flip-flop dependent on a bias signal and the input clock signal. When triggered, the flip-flop outputs a transition on the output clock signal, which, in turn, serves as an input to a duty cycle corrector that generates the bias signal dependent on the configuration of the duty cycle corrector. The duty cycle corrector may be configured to generate the bias signal so as to be able to operatively control the duty cycle of the output clock signal.
摘要:
A technique for optimizing decoupling capacitance on an integrated circuit while meeting leakage power constraints of the integrated circuit is provided. The technique involves the formulation of a linear optimization problem using physical characteristics and constraints of the integrated circuit, where a linear solution to the linear optimization problem yields an optimal decoupling capacitance presence on the integrated circuit.
摘要:
A method for preferentially shielding a signal to increase implicit decoupling capacitance is provided. The signal is preferentially shielded by using a probability of the signal being at a specific value to determine where to route the signal. Further, an integrated circuit that preferentially shields a signal to increase decoupling capacitance by 2using a probability of the signal being at a specific value to determine where to route the signal. Further, a computer system for preferentially shielding a signal to increase decoupling capacitance by using a probability of the signal being at a specific value to determine where to route the signal. Further, a computer readable medium having executable instructions for preferentially shielding a signal to increase implicit decoupling capacitance by using a probability of the signal being at a specific value to determine where to route the signal.
摘要:
A transmission gate immune to noise that selectively delivers/draws charge to/from a noisy input node in order to ensure that an output node is not adversely affected by the noise on the input node is provided. Further, an NMOS pass gate immune to noise that delivers charge to a noisy input node in order to ensure that an output node is not adversely affected by the noise on the input node is provided. Further, a PMOS pass gate immune to noise that draws charge from a noisy input node in order to ensure that an output node is not adversely affected by the noise on the input node is provided.
摘要:
A 60 degree bump placement layout for an integrated circuit power grid is provided. This layout improves integrated circuit performance and reliability and gives an integrated circuit designer added flexibility and uniformity in designing the integrated circuit. Further, a patterned bump array for a top metal layer of an integrated circuit having a plurality of 60 degree bump placement structures is provided.
摘要:
A method for improving integrated circuit by using a patterned bump layout on a layer of the integrated circuit is provided. The method creates various bump structures by varying an angle between a line from a reference bump to a first bump and a line from the reference bump to a second bump. By varying the angle, a designer may generate a particular bump structure that meets the needs of a particular design. Further, a particular bump placement may be repeated across all or a portion of the metal layer in order to create a patterned bump layout.
摘要:
Disclosed is a digital voltage regulator system and method for mitigating voltage droop in an integrated circuit. If an unacceptable voltage droop is detected, the digital voltage regulator may take action to allow the power supply voltage to recover. A digital voltage regulator in accordance with embodiments discussed herein detects voltage droop by comparing a power supply voltage measurement with a threshold voltage. The threshold voltage may be calibrated based on power supply voltage measurements taken while the integrated circuit is operating.