公开(公告)号：US07199639B2

公开(公告)日：2007-04-03

申请号：US11410956

申请日：2006-04-26

申请人： Yusuke Kanno ,  Hiroyuki Mizuno ,  Takeshi Sakata ,  Takao Watanabe

发明人： Yusuke Kanno ,  Hiroyuki Mizuno ,  Takeshi Sakata ,  Takao Watanabe

IPC分类号： H03L5/00

CPC分类号： H03K19/0016 ,  H03K19/018521

摘要： A semiconductor device including a level converter (LSC) is disclosed. The level converter comprises a voltage-up circuit (LSC1) that operates on low voltage of power supply (VDD) and steps up voltage enough to drive the level converter and a level converter circuit (LSC2) that operates on high voltage of power supply (VDDQ). The voltage-up circuit is capable of constantly generating 2×VDD so that the level converter can convert a low voltage of power supply (VDD) below 1 V to VDDQ. This voltage-up circuit can be configured only with MOSFET transistors produced by thin oxide film deposition, thus enabling high-speed operation. To facilitate designing a circuit for preventing a leakage current from occurring in the level converter during sleep mode of a low-voltage-driven circuit (CB1), the level converter circuit (LSC2) includes a leak protection circuit (LPC) that exerts autonomous control for leak prevention, dispensing with external control signals.

摘要翻译： 公开了一种包括电平转换器（LSC）的半导体器件。 电平转换器包括在低电压（VDD）下工作并升压足以驱动电平转换器的升压电路（LSC 1）和在高电压功率下工作的电平转换器电路（LSC 2） 电源（VDDQ）。 升压电路能够持续产生2xVDD，因此电平转换器可将低于1 V的低电压电压（VDD）转换为VDDQ。 该升压电路只能由通过薄氧化膜沉积制造的MOSFET晶体管配置，从而实现高速操作。 为了便于设计用于防止低电压驱动电路（CB 1）的睡眠模式期间在电平转换器中发生漏电流的电路，电平转换器电路（LSC 2）包括泄漏保护电路（LPC） 自动控制防泄漏，外接控制信号。

公开(公告)号：US06990002B2

公开(公告)日：2006-01-24

申请号：US10751402

申请日：2004-01-06

申请人： Hiroyuki Mizuno ,  Takeshi Sakata ,  Nobuhiro Oodaira ,  Takao Watanabe ,  Yusuke Kanno

发明人： Hiroyuki Mizuno ,  Takeshi Sakata ,  Nobuhiro Oodaira ,  Takao Watanabe ,  Yusuke Kanno

IPC分类号： G11C5/06

CPC分类号： G11C11/4076 ,  G11C7/04 ,  G11C7/065 ,  G11C7/08 ,  G11C7/12 ,  G11C7/18 ,  G11C11/4091 ,  G11C11/4094 ,  G11C11/4097 ,  G11C2207/002 ,  G11C2207/005

摘要： The present invention provides a sense circuit for DRAM memory cell to cover the events that a sense time becomes remarkably longer when a power source voltage is lowered, a sense time under the low voltage condition becomes shorter when temperature rises and a sense time changes to a large extent for fluctuation of processes. The present invention provides the following typical effects. A switch means is provided between the bit line BL and local bit line LBL connected to the memory cells for isolation and coupling of these bit lines. The bit line BL is precharged to the voltage of VDL/2, while the local bit line LBL is precharged to the voltage of VDL. The VDL is the maximum amplitude voltage of the bit line BL. A sense amplifier SA comprises a first circuit including a differential MOS pair having the gate connected to the bit line BL and a second circuit connected to the local bit line LBL for full amplitude amplification and for holding the data. When the bit line BL and local bit line LBL are capacitance-coupled via a capacitor, it is recommended to use a latch type sense amplifier SA connected to the local bit line LBL.

摘要翻译： 本发明提供了一种用于DRAM存储单元的感测电路，以覆盖当电源电压降低时感测时间变得显着更长的事件，当温度升高时，低电压条件下的感测时间变短，感测时间变为 过程波动很大程度。 本发明提供以下典型的效果。 在位线BL和连接到存储器单元的局部位线LBL之间提供开关装置，用于这些位线的隔离和耦合。 位线BL被预充电到VDL / 2的电压，而局部位线LBL被预充电到VDL的电压。 VDL是位线BL的最大幅度电压。 读出放大器SA包括第一电路，其包括具有连接到位线BL的栅极的差分MOS对，以及连接到用于全幅放大的局部位线LBL并用于保持该数据的第二电路。 当位线BL和本地位线LBL通过电容器电容耦合时，建议使用连接到局部位线LBL的锁存型读出放大器SA。

公开(公告)号：US08199549B2

公开(公告)日：2012-06-12

申请号：US12859445

申请日：2010-08-19

申请人： Hiroyuki Mizuno ,  Takeshi Sakata ,  Nobuhiro Oodaira ,  Takao Watanabe ,  Yusuke Kanno

发明人： Hiroyuki Mizuno ,  Takeshi Sakata ,  Nobuhiro Oodaira ,  Takao Watanabe ,  Yusuke Kanno

IPC分类号： G11C5/06

CPC分类号： G11C11/4076 ,  G11C7/04 ,  G11C7/065 ,  G11C7/08 ,  G11C7/12 ,  G11C7/18 ,  G11C11/4091 ,  G11C11/4094 ,  G11C11/4097 ,  G11C2207/002 ,  G11C2207/005

摘要： The present invention provides a sense circuit for DRAM memory cell to cover the events that a sense time becomes remarkably longer when a power source voltage is lowered, a sense time under the low voltage condition becomes shorter when temperature rises and a sense time changes to a large extent for fluctuation of processes. The present invention provides the following typical effects. A switch means is provided between the bit line BL and local bit line LBL connected to the memory cells for isolation and coupling of these bit lines. The bit line BL is precharged to the voltage of VDL/2, while the local bit line LBL is precharged to the voltage of VDL. The VDL is the maximum amplitude voltage of the bit line BL. A sense amplifier SA comprises a first circuit including a differential MOS pair having the gate connected to the bit line BL and a second circuit connected to the local bit line LBL for full amplitude amplification and for holding the data. When the bit line BL and local bit line LBL are capacitance-coupled via a capacitor, it is recommended to use a latch type sense amplifier SA connected to the local bit line LBL.

摘要翻译： 本发明提供了一种用于DRAM存储单元的感测电路，以覆盖当电源电压降低时感测时间变得显着更长的事件，当温度升高时，低电压条件下的感测时间变短，感测时间变为 过程波动很大程度。 本发明提供以下典型的效果。 在位线BL和连接到存储器单元的局部位线LBL之间提供开关装置，用于这些位线的隔离和耦合。 位线BL被预充电到VDL / 2的电压，而局部位线LBL被预充电到VDL的电压。 VDL是位线BL的最大幅度电压。 读出放大器SA包括第一电路，其包括具有连接到位线BL的栅极的差分MOS对，以及连接到用于全幅放大的局部位线LBL并用于保持该数据的第二电路。 当位线BL和本地位线LBL通过电容器电容耦合时，建议使用连接到局部位线LBL的锁存型读出放大器SA。

公开(公告)号：US07636808B2

公开(公告)日：2009-12-22

申请号：US10790880

申请日：2004-03-03

申请人： Satoru Akiyama ,  Takeshi Sakata ,  Takao Watanabe

发明人： Satoru Akiyama ,  Takeshi Sakata ,  Takao Watanabe

IPC分类号： G06F12/08 ,  G11C8/00

CPC分类号： G06F12/0804 ,  G06F12/0864 ,  G06F12/0893 ,  G06F2212/2024

摘要： A semiconductor device employs a SESO memory or a phase change memory which has a smaller memory cell area than SRAM. The semiconductor device has a plurality of memory banks each composed of the SESO or phase change memories, and a cache memory which has a number of ways equal to the ratio of a write speed (m) to a read speed (n). The semiconductor device controls the cache memory such that a write back operation is not repeated on the same memory bank.

摘要翻译： 半导体器件采用具有比SRAM更小的存储单元面积的SESO存储器或相变存储器。 半导体器件具有各自由SESO或相变存储器构成的多个存储体，以及高速缓冲存储器，其具有等于写入速度（m）与读取速度（n）的比例的多个方式。 半导体器件控制高速缓冲存储器，使得在相同的存储体上不重复写回操作。

公开(公告)号：US20050190588A1

公开(公告)日：2005-09-01

申请号：US11118338

申请日：2005-05-02

申请人： Hiroyuki Mizuno ,  Takeshi Sakata ,  Nobuhiro Oodaira ,  Takao Watanabe ,  Yusuke Kanno

发明人： Hiroyuki Mizuno ,  Takeshi Sakata ,  Nobuhiro Oodaira ,  Takao Watanabe ,  Yusuke Kanno

IPC分类号： G11C7/06 ,  G11C7/12 ,  G11C7/18 ,  G11C11/4091 ,  G11C11/4094 ,  G11C11/4097 ,  G11C11/22

CPC分类号： G11C11/4076 ,  G11C7/04 ,  G11C7/065 ,  G11C7/08 ,  G11C7/12 ,  G11C7/18 ,  G11C11/4091 ,  G11C11/4094 ,  G11C11/4097 ,  G11C2207/002 ,  G11C2207/005

摘要： The present invention provides a sense circuit for DRAM memory cell to cover the events that a sense time becomes remarkably longer when a power source voltage is lowered, a sense time under the low voltage condition becomes shorter when temperature rises and a sense time changes to a large extent for fluctuation of processes. The present invention provides the following typical effects. A switch means is provided between the bit line BL and local bit line LBL connected to the memory cells for isolation and coupling of these bit lines. The bit line BL is precharged to the voltage of VDL/2, while the local bit line LBL is precharged to the voltage of VDL. The VDL is the maximum amplitude voltage of the bit line BL. A sense amplifier SA comprises a first circuit including a differential MOS pair having the gate connected to the bit line BL and a second circuit connected to the local bit line LBL for full amplitude amplification and for holding the data. When the bit line BL and local bit line LBL are capacitance-coupled via a capacitor, it is recommended to use a latch type sense amplifier SA connected to the local bit line LBL.

摘要翻译： 本发明提供了一种用于DRAM存储单元的感测电路，以覆盖当电源电压降低时感测时间变得显着更长的事件，当温度升高时，低电压条件下的感测时间变短，感测时间变为 过程波动很大程度。 本发明提供以下典型的效果。 在位线BL和连接到存储器单元的局部位线LBL之间提供开关装置，用于这些位线的隔离和耦合。 位线BL被预充电到VDL / 2的电压，而局部位线LBL被预充电到VDL的电压。 VDL是位线BL的最大幅度电压。 读出放大器SA包括第一电路，其包括具有连接到位线BL的栅极的差分MOS对，以及连接到用于全幅放大的局部位线LBL并用于保持该数据的第二电路。 当位线BL和本地位线LBL通过电容器电容耦合时，建议使用连接到局部位线LBL的锁存型读出放大器SA。

公开(公告)号：US08138442B2

公开(公告)日：2012-03-20

申请号：US12093836

申请日：2005-11-16

申请人： Tatsushi Sato ,  Yoshihito Imai ,  Teiji Takahashi ,  Takeshi Sakata ,  Tomoko Sendai ,  Yoichiro Nishimoto ,  Shigeru Matsuno ,  Takeyuki Maegawa ,  Takaaki Iwata

发明人： Tatsushi Sato ,  Yoshihito Imai ,  Teiji Takahashi ,  Takeshi Sakata ,  Tomoko Sendai ,  Yoichiro Nishimoto ,  Shigeru Matsuno ,  Takeyuki Maegawa ,  Takaaki Iwata

IPC分类号： B23H7/02 ,  H01L21/301 ,  H01L21/306 ,  B23H9/00

CPC分类号： B23H7/02 ,  B23H9/00

摘要： Provided are a wire electric discharge machining method for poorly conductive materials, such as solar cell silicon, and a semiconductor wafer manufacturing method and a solar battery cell manufacturing method based on the wire electric discharge machining method. Electrical discharge machining of a high volume resistivity, hard and brittle materials, having a volume resistivity that is equal to or higher than 0.5 Ω·cm and equal to or lower than 5 Ω·cm is performed by applying a pulse voltage having a pulse width that is equal to or higher than 1 μsec and equal to or lower than 4 μsec and having a peak current at the time of machining a wire electrode that is equal to or higher than 10A and equal to or lower than 50A to a wire electrode and generating a discharge pulse between the wire electrode and a subject to be machined.

摘要翻译： 本发明提供一种导电材料的导电放电加工方法，例如太阳能电池硅，半导体晶片的制造方法以及基于该放电加工方法的太阳能电池单元的制造方法。 具有体积电阻率等于或大于0.5且OHgr·cm且等于或小于5Ω的体积电阻率，硬脆材料的放电加工是通过施加具有 脉冲宽度等于或高于1微秒并且等于或低于4微秒，并且在将线电极加工时的峰值电流等于或高于10A并等于或低于50A的线 并且在线电极和待加工对象之间产生放电脉冲。

公开(公告)号：US07619911B2

公开(公告)日：2009-11-17

申请号：US10579911

申请日：2003-11-21

申请人： Satoru Hanzawa ,  Junji Shigeta ,  Shinichiro Kimura ,  Takeshi Sakata ,  Riichiro Takemura ,  Kazuhiko Kajigaya

发明人： Satoru Hanzawa ,  Junji Shigeta ,  Shinichiro Kimura ,  Takeshi Sakata ,  Riichiro Takemura ,  Kazuhiko Kajigaya

IPC分类号： G11C15/00

CPC分类号： G11C15/04 ,  G11C15/043

摘要： In a memory array structured of memory cells using a storage circuit STC and a comparator CP, either one electrode of a source electrode or a drain electrode of a transistor, whose gate electrode is connected to a search line, of a plurality of transistors structuring the comparator CP is connected to a match line HMLr precharged to a high voltage. Further, a match detector MDr is arranged on a match line LMLr precharged to a low voltage to discriminate a comparison signal voltage generated at the match line according to the comparison result of data. According to such memory array structure and operation, comparison operation can be performed at low power and at high speed while influence of search-line noise is avoided in a match line pair. Therefore, a low power content addressable memory which allows search operation at high speed can be realized.

摘要翻译： 在使用存储电路STC和比较器CP的存储器单元构成的存储器阵列中，将栅电极连接到搜索线的晶体管的源电极或漏电极的一个电极，构成 比较器CP连接到预充电到高电压的匹配线HMLr。 此外，匹配检测器MDr布置在预充电到低电压的匹配线LMLr上，以根据数据的比较结果来识别在匹配线处产生的比较信号电压。 根据这种存储器阵列结构和操作，可以在低功率和高速度下执行比较操作，同时在匹配线对中避免搜索线噪声的影响。 因此，可以实现允许高速搜索操作的低功率内容可寻址存储器。

公开(公告)号：US07505296B2

公开(公告)日：2009-03-17

申请号：US11877310

申请日：2007-10-23

申请人： Satoru Hanzawa ,  Takeshi Sakata ,  Kazuhiko Kajigaya

发明人： Satoru Hanzawa ,  Takeshi Sakata ,  Kazuhiko Kajigaya

IPC分类号： G11C15/00

CPC分类号： G11C15/04 ,  G11C15/043

摘要： The range-specified IP addresses are effectively stored to reduce the number of necessary entries thereby the memory capacity of TCAM is improved. The representative means of the present invention is that: the storage information (entry) and the input information (comparison information or search key) are the common block code such that any bit must be the logical value ‘1’; Match-lines are hierarchically structured and memory cells are arranged at the intersecting points of a plurality of sub-match lines and a plurality of search lines; Further the sub-match lines are connected to main-match lines through the sub-match detectors, respectively and main-match detectors are arranged on the main-match lines.

摘要翻译： 有效存储范围指定的IP地址，以减少必要条目的数量，从而提高TCAM的存储容量。 本发明的代表性手段是：存储信息（条目）和输入信息（比较信息或搜索关键字）是公共块码，使得任何位必须是逻辑值“1”; 匹配线是分层结构的，并且存储器单元被布置在多个子匹配线和多条搜索线的交叉点处; 此外，子匹配线分别通过子匹配检测器连接到主匹配线，并且主匹配检测器被布置在主匹配线上。

公开(公告)号：US07397878B2

公开(公告)日：2008-07-08

申请号：US10377720

申请日：2003-03-04

申请人： Yuichi Okuda ,  Takeshi Sakata ,  Takashi Sato

发明人： Yuichi Okuda ,  Takeshi Sakata ,  Takashi Sato

IPC分类号： H04L7/02

CPC分类号： H04L25/14 ,  H04L7/033 ,  H04L25/4908

摘要： The present invention provides a data communication method and a data communication device capable of performing high-speed data communication by using a parallel link and higher-speed data communication by reducing a timing skew. A data communication method includes: a step of encoding data of N bits (N being 2 or larger) to transmission data of M bits (M being 3 or larger) on a transmission side; a step of generating a transmission signal in which transition takes place in at least one level of any of the transmission data synchronously with a transmission clock and transmitting the transmission signal to a transmission line on the transmission side; a step of recognizing transition in the signal of M bits received via the transmission line and detecting the reception data of M bits synchronized with the transmission clock on a reception side; and a step of decoding the reception data of M bits to the data of N bits.

公开(公告)号：US20080089137A1

公开(公告)日：2008-04-17

申请号：US11873254

申请日：2007-10-16

申请人： Satoru HANZAWA ,  Takeshi Sakata

发明人： Satoru HANZAWA ,  Takeshi Sakata

IPC分类号： G11C7/10

CPC分类号： G11C29/787 ,  G11C7/14 ,  G11C11/1673 ,  G11C11/1693

摘要： A dummy cell includes a plurality of first memory cells MC for storing “1” or “0”, arranged at points of intersection between a plurality of word lines WR0 to WR7 and a plurality of first data lines D0 to D7, a plurality of first dummy cells MCH for storing “1” or “0”, arranged at points of intersection between the word lines WR0 to WR7 and a first dummy data line, and a plurality of second dummy cells MCL for storing “0”, arranged at points of intersection between the word lines WR0 to WR7 and a second dummy data line DD1.

摘要翻译： 虚拟单元包括：多个第一存储单元MC，用于存储多个字线WR0至WR7与多个第一数据线D 0至D 7之间的交点处的“1”或“0” 多个用于存储“1”或“0”的第一虚拟单元MCH，布置在字线WR0至WR7和第一虚拟数据线之间的交点处，以及多个第二虚拟单元MCL，用于存储“0” “，布置在字线WR0至WR7之间的交点处和第二伪数据线DD 1之间。