公开(公告)号：US07538338B2

公开(公告)日：2009-05-26

申请号：US10934951

申请日：2004-09-03

申请人： Darrell Rinerson ,  Christophe Chevallier ,  Wayne Kinney ,  Edmond Ward

发明人： Darrell Rinerson ,  Christophe Chevallier ,  Wayne Kinney ,  Edmond Ward

IPC分类号： H01L45/00

CPC分类号： G11C13/0007 ,  G11C11/5685 ,  G11C13/02 ,  G11C2213/11 ,  G11C2213/31 ,  G11C2213/32 ,  G11C2213/53 ,  G11C2213/54 ,  G11C2213/71 ,  H01L27/115 ,  H01L27/2436 ,  H01L27/2481 ,  H01L29/8616 ,  H01L45/08 ,  H01L45/1233 ,  H01L45/146 ,  H01L45/147

摘要： A memory using a tunnel barrier is disclosed. A memory element includes a tunneling barrier and two conductive materials. The conductive material typically has mobile ions that either move towards or away from the tunneling barrier in response to a voltage across the memory element. A low conductivity region is irreversibly formed for one time programmable memory. The tunneling barrier can be formed by mobile ions combining with complementary ions. The low conductivity region increases the effective width of the tunnel barrier, making electrons tunnel a greater distance, which reduces the memory element's conductivity. By varying conductivity, multiple states can be created in the memory cell.

摘要翻译： 公开了使用隧道屏障的存储器。 存储元件包括隧道势垒和两种导电材料。 导电材料通常具有响应于存储元件两端的电压而移动或者远离隧道势垒的移动离子。 低电导率区域不可逆地形成一次可编程存储器。 隧道势垒可以通过与互补离子组合的移动离子形成。 低导电率区域增加了隧道势垒的有效宽度，使得电子隧道更大的距离，这降低了存储元件的导电性。 通过改变电导率，可以在存储器单元中产生多个状态。

公开(公告)号：US20060023495A1

公开(公告)日：2006-02-02

申请号：US11179790

申请日：2005-07-11

申请人： Darrell Rinerson ,  Wayne Kinney ,  Steven Longcor ,  Edmond Ward

发明人： Darrell Rinerson ,  Wayne Kinney ,  Steven Longcor ,  Edmond Ward

IPC分类号： G11C11/14

CPC分类号： G11C13/0007 ,  G11C11/5685 ,  G11C13/0069 ,  G11C2013/0073 ,  G11C2213/31 ,  G11C2213/71 ,  G11C2213/77

摘要： A cross point array and peripheral circuitry that accesses the cross point array. The peripheral circuitry receives a supply voltage of approximately 1.8 volts or less, generates voltages of a magnitude not more than approximately 3 volts, and senses current that is indicative of a nonvolatile memory state.

摘要翻译： 交叉点阵列和访问交叉点阵列的外围电路。 外围电路接收大约1.8伏或更小的电源电压，产生不大于约3伏的电压，并且感测指示非易失性存储器状态的电流。

公开(公告)号：US20060028864A1

公开(公告)日：2006-02-09

申请号：US11021600

申请日：2004-12-23

申请人： Darrell Rinerson ,  Christophe Chavellier ,  Steven Longcor ,  Edmond Ward ,  Robert Norman

发明人： Darrell Rinerson ,  Christophe Chavellier ,  Steven Longcor ,  Edmond Ward ,  Robert Norman

IPC分类号： G11C11/00

CPC分类号： G11C11/16

摘要： A memory array with enhanced functionality is presented. Each cell in the array includes a pair of memory element electrodes. A read current across the pair of memory element electrodes is indicative of stored information and different write voltage levels across the pair of memory element electrodes are employed to store nonvolatile information. The array has at least one enhanced functionality portion that performs operations selected from the group consisting of reference, error correction, device specific storage, defect mapping tables, and redundancy.

摘要翻译： 介绍了增强功能的内存阵列。 阵列中的每个单元包括一对存储元件电极。 一对存储元件电极上的读取电流表示存储的信息，并且跨该对存储元件电极的不同写入电压电平被用于存储非易失性信息。 该阵列具有至少一个增强功能部分，其执行从由参考，纠错，设备特定存储，缺陷映射表和冗余组成的组中选择的操作。

公开(公告)号：US07330370B2

公开(公告)日：2008-02-12

申请号：US11021600

申请日：2004-12-23

申请人： Darrell Rinerson ,  Christophe Chevallier ,  Steven W. Longcor ,  Edmond Ward ,  Robert Norman

发明人： Darrell Rinerson ,  Christophe Chevallier ,  Steven W. Longcor ,  Edmond Ward ,  Robert Norman

IPC分类号： G11C11/00

CPC分类号： G11C11/16

摘要： A memory array with enhanced functionality is presented. Each cell in the array includes a pair of memory element electrodes. A read current across the pair of memory element electrodes is indicative of stored information and different write voltage levels across the pair of memory element electrodes are employed to store nonvolatile information. The array has at least one enhanced functionality portion that performs operations selected from the group consisting of reference, error correction, device specific storage, defect mapping tables, and redundancy.

摘要翻译： 介绍了增强功能的内存阵列。 阵列中的每个单元包括一对存储元件电极。 一对存储元件电极上的读取电流表示存储的信息，并且跨该对存储元件电极的不同写入电压电平被用于存储非易失性信息。 该阵列具有至少一个增强功能部分，其执行从由参考，纠错，设备特定存储，缺陷映射表和冗余组成的组中选择的操作。

公开(公告)号：US07884349B2

公开(公告)日：2011-02-08

申请号：US12283339

申请日：2008-09-11

申请人： Darrell Rinerson ,  Steve Kuo-Ren Hsia ,  Steven W. Longcor ,  Wayne Kinney ,  Edmond Ward ,  Christophe J. Chevallier

发明人： Darrell Rinerson ,  Steve Kuo-Ren Hsia ,  Steven W. Longcor ,  Wayne Kinney ,  Edmond Ward ,  Christophe J. Chevallier

IPC分类号： H01L29/06

CPC分类号： H01L27/101 ,  G11C11/00 ,  G11C11/56 ,  G11C11/5685 ,  G11C13/0007 ,  G11C13/003 ,  G11C2213/31 ,  G11C2213/72 ,  G11C2213/74 ,  G11C2213/77 ,  G11C2213/79 ,  H01L27/11502 ,  H01L27/11507 ,  H01L27/24 ,  H01L27/2409 ,  H01L27/2436 ,  H01L27/2481 ,  H01L45/00 ,  H01L45/10 ,  H01L45/1233 ,  H01L45/147

摘要： A memory cell including a memory element and a non-ohmic device (NOD) that are electrically in series with each other is disclosed. The NOD comprises a semiconductor based selection device operative to electrically isolate the memory element from a range of voltages applied across the memory cell that are not read voltages operative read stored data from the memory element or write voltages operative to write data to the memory element. The selection device may comprise a pair of diodes that are electrically in series with each other and disposed in a back-to-back configuration. The memory cell may be fabricated over a substrate (e.g., a silicon wafer) that includes active circuitry. The selection device and the semiconductor materials (e.g., poly-silicon) that form the selection device are fabricated above the substrate and are integrated with other thin film layers of material that form the memory cell.

摘要翻译： 公开了一种包括彼此电串联的存储元件和非欧姆器件（NOD）的存储单元。 NOD包括基于半导体的选择装置，其操作以将存储器元件与施加在存储器单元上的电压范围电隔离，所述电压范围不是读取电压，从存储元件读取存储的数据，或者写入电压可操作以将数据写入存储器元件。 选择装置可以包括彼此电连接并以背对背配置设置的一对二极管。 可以在包括有源电路的衬底（例如，硅晶片）上制造存储器单元。 形成选择装置的选择装置和半导体材料（例如，多晶硅）制造在衬底之上，并与形成存储单元的材料的其它薄膜层集成。

公开(公告)号：US07633790B2

公开(公告)日：2009-12-15

申请号：US12286723

申请日：2008-10-01

申请人： Darrel Rinerson ,  Wayne Kinney ,  Edmond Ward ,  Steve Kuo-Ren Hsia ,  Steven W. Longcor ,  Christophe J. Chevallier ,  John E. Sanchez, Jr. ,  Philip Swab

发明人： Darrel Rinerson ,  Wayne Kinney ,  Edmond Ward ,  Steve Kuo-Ren Hsia ,  Steven W. Longcor ,  Christophe J. Chevallier ,  John E. Sanchez, Jr. ,  Philip Swab

IPC分类号： G11C11/00

CPC分类号： H01L27/2463 ,  G11C11/16 ,  G11C11/5685 ,  G11C13/0002 ,  G11C13/0007 ,  G11C13/004 ,  G11C13/0069 ,  G11C13/0097 ,  G11C2013/009 ,  G11C2213/15 ,  G11C2213/31 ,  G11C2213/32 ,  G11C2213/71 ,  G11C2213/77 ,  G11C2213/79 ,  H01L27/24 ,  H01L27/2481 ,  H01L45/04 ,  H01L45/06 ,  H01L45/1233 ,  H01L45/1253 ,  H01L45/146 ,  H01L45/147 ,  H01L45/1633 ,  H01L45/1658

摘要： A memory cell including conductive oxide electrodes is disclosed. The memory cell includes a memory element operative to store data as a plurality of resistive states. The memory element includes a layer of a conductive metal oxide (CMO) (e.g., a perovskite) in contact with an electrode that may comprise one or more layers of material. At least one of those layers of material can be a conductive oxide (e.g., a perovskite such as LaSrCoO3—LSCoO or LaNiO3—LNO) that is in contact with the CMO. The conductive oxide layer can be selected as a seed layer operative to provide a good lattice match with and/or a lower crystallization temperature for the CMO. The conductive oxide layer may also be in contact with a metal layer (e.g., Pt). The memory cell additionally exhibits non-linear IV characteristics, which can be favorable in certain arrays, such as non-volatile two-terminal cross-point memory arrays.

摘要翻译： 公开了一种包括导电氧化物电极的存储单元。 存储单元包括用于将数据存储为多个电阻状态的存储元件。 存储元件包括与可包括一层或多层材料的电极接触的导电金属氧化物（CMO）（例如，钙钛矿）层。 这些材料层中的至少一层可以是与CMO接触的导电氧化物（例如，诸如LaSrCoO3-LSCoO或LaNiO3-LNO的钙钛矿）。 可以选择导电氧化物层作为晶种层，以为CMO提供良好的晶格匹配和/或较低的结晶温度。 导电氧化物层也可以与金属层（例如Pt）接触。 存储单元还具有非线性IV特性，这在某些阵列中是有利的，例如非易失性两端交叉点存储阵列。